Kawase; Kodo

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kawase; Kodo.The latest application filed is for "terahertz wave generation apparatus".

Company Profile

0.12.14

Kawase; Kodo - Aichi JP
KAWASE; Kodo - Nagoya JP
Kawase; Kodo - Saitama JP
Kawase; Kodo - Aichi-ken JP
Kawase; Kodo - Wako JP
Kawase; Kodo - Wako-shi JP
Kawase, Kodo - Sendai JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Terahertz wave generation apparatus Grant 9,897,893 - Kawase , et al. February 20, 2	2018-02-20
Terahertz Wave Generation Apparatus App 20170219911 - KAWASE; Kodo ; et al.	2017-08-03
Electromagnetic wave measuring apparatus, measuring method, program, and recording medium Grant 9,176,008 - Nishina , et al. November 3, 2	2015-11-03
Electromagnetic Wave Measuring Apparatus, Measuring Method, Program, And Recording Medium App 20130240736 - NISHINA; Shigeki ; et al.	2013-09-19
Electromagnetic wave measuring apparatus, measuring method, program, and recording medium Grant 8,493,057 - Nishina , et al. July 23, 2	2013-07-23
Collection-amount detection method for particulate matters and collection-amount detection apparatus therefor and exhaust-gas converting apparatus Grant 8,119,988 - Daido , et al. February 21, 2	2012-02-21
Terahertz beam scanning apparatus and method thereof Grant 8,121,157 - Maki , et al. February 21, 2	2012-02-21
Terahertz Beam Scanning Apparatus And Method Thereof App 20110037001 - Maki; Ken-ichiro ; et al.	2011-02-17
Holding Fixture, Placement Method Of Holding Fixture, And Measurement Method App 20100321682 - KATO; Eiji ; et al.	2010-12-23
Electromagnetic Wave Measuring Apparatus, Measuring Method, Program, And Recording Medium App 20100295534 - NISHINA; Shigeki ; et al.	2010-11-25
Collection-amount Detection Method For Particulate Matters And Collection-amount Detection Apparatus Therefor And Exhaust-gas Converting Apparatus App 20100187089 - Daido; Shigeki ; et al.	2010-07-29
Method and apparatus for inspecting target by tera-hertz wave spectrometry Grant 7,381,955 - Watanabe , et al. June 3, 2	2008-06-03
Method and apparatus for detecting materials Grant 7,352,449 - Kawase , et al. April 1, 2	2008-04-01
Apparatus and method for detecting scattered material by terahertz wave Grant 7,291,838 - Kawase , et al. November 6, 2	2007-11-06
Method and apparatus for diagnosing fault in semiconductor device Grant 7,173,447 - Yamashita , et al. February 6, 2	2007-02-06
Method and equipment for judging target by tera heltz wave spectrometry App 20060219922 - Watanabe; Yuki ; et al.	2006-10-05
Apparatus and method for detecting scattered material by Terahertz Wave App 20060043298 - Kawase; Kodo ; et al.	2006-03-02
Method and apparatus for diagnosing fault in semiconductor device App 20060006886 - Yamashita; Masatsugu ; et al.	2006-01-12
Method and apparatus for inspecting wire breaking of integrated circuit Grant 6,980,010 - Tonouchi , et al. December 27, 2	2005-12-27
Apparatus for generating tera-Hertz wave and tuning method Grant 6,903,341 - Imai , et al. June 7, 2	2005-06-07
Method and apparatus for detecting materials App 20050116170 - Kawase, Kodo ; et al.	2005-06-02
Method and apparatus for inspecting wire breaking of integrated circuit App 20040246011 - Tonouchi, Masayoshi ; et al.	2004-12-09
Method and apparatus for differential imaging using terahertz wave App 20040061055 - Kawase, Kodo ; et al.	2004-04-01
Apparatus for generating tera-herz wave and tuning method App 20030227668 - Imai, Kazuhiro ; et al.	2003-12-11
Method and apparatus for generating tera-herz wave App 20020024718 - Kawase, Kodo ; et al.	2002-02-28

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