| Patent | Date |
|---|
Charged-particle beam device and cross-sectional shape estimation program
Grant 11,443,914 - Yokosuka , et al. September 13, 2 | 2022-09-13 |
Charged Particle Beam Device
App 20220270847 - Ikeda; Kazuki ; et al. | 2022-08-25 |
Charged Particle Beam Device
App 20220216032 - SHOUJI; Minami ; et al. | 2022-07-07 |
Charged Particle Beam Device And Operation Method Therefor
App 20220189729 - NAGASHIMA; Tomoharu ; et al. | 2022-06-16 |
Charged Particle Beam Device
App 20220122804 - YOKOSUKA; Toshiyuki ; et al. | 2022-04-21 |
Charged Particle Beam Device
App 20220102105 - Li; Wen ; et al. | 2022-03-31 |
Thermoelectric Field Emission Electron Source And Electron Beam Application Device
App 20220037107 - Matsunaga; Soichiro ; et al. | 2022-02-03 |
Charged particle beam device
Grant 11,239,052 - Yokosuka , et al. February 1, 2 | 2022-02-01 |
Electron gun and electron beam application device
Grant 11,227,740 - Matsunaga , et al. January 18, 2 | 2022-01-18 |
Charged-Particle Beam Device and Cross-Sectional Shape Estimation Program
App 20210366685 - YOKOSUKA; Toshiyuki ; et al. | 2021-11-25 |
Charged particle ray device and cross-sectional shape estimation program
Grant 11,133,147 - Yokosuka , et al. September 28, 2 | 2021-09-28 |
Charged particle ray device and cross-sectional shape estimation program
Grant 11,101,100 - Yokosuka , et al. August 24, 2 | 2021-08-24 |
Charged particle detector including a light-emitting section having lamination structure, charged particle beam device, and mass spectrometer
Grant 11,062,892 - Imamura , et al. July 13, 2 | 2021-07-13 |
Charged particle beam device having inspection scan direction based on scan with smaller dose
Grant 10,984,981 - Itai , et al. April 20, 2 | 2021-04-20 |
Charged particle detector and charged particle beam apparatus
Grant 10,984,979 - Imamura , et al. April 20, 2 | 2021-04-20 |
Charged particle beam device
Grant 10,903,037 - Kasuya , et al. January 26, 2 | 2021-01-26 |
Charged particle beam device
Grant 10,818,470 - Ikeda , et al. October 27, 2 | 2020-10-27 |
Charged particle beam device and charged particle beam device noise source determination method
Grant 10,796,880 - Nishimoto , et al. October 6, 2 | 2020-10-06 |
Charged Particle Beam Device
App 20200312615 - YOKOSUKA; Toshiyuki ; et al. | 2020-10-01 |
Charged Particle Ray Device And Cross-sectional Shape Estimation Program
App 20200294756 - YOKOSUKA; Toshiyuki ; et al. | 2020-09-17 |
Electron Gun And Electron Beam Application Device
App 20200266020 - MATSUNAGA; Soichiro ; et al. | 2020-08-20 |
Charged particle beam device
Grant 10,720,306 - Yokosuka , et al. | 2020-07-21 |
Measuring device and measuring method
Grant 10,707,047 - Takahashi , et al. | 2020-07-07 |
Light Guide, Detector Having Light Guide, and Charged Particle Beam Device
App 20200203120 - SEKIGUCHI; Yoshifumi ; et al. | 2020-06-25 |
Measurement and inspection device
Grant 10,692,687 - Li , et al. | 2020-06-23 |
Light guide, detector having light guide, and charged particle beam device
Grant 10,679,821 - Sekiguchi , et al. | 2020-06-09 |
Charged Particle Beam Device
App 20200090897 - KASUYA; Keigo ; et al. | 2020-03-19 |
Light guide, detector having light guide, and charged particle beam device
Grant 10,593,512 - Sekiguchi , et al. | 2020-03-17 |
Charged particle beam device with transient signal correction during beam blanking
Grant 10,559,447 - Kadoi , et al. Feb | 2020-02-11 |
Charged Particle Beam Device
App 20200043695 - IKEDA; Kazuki ; et al. | 2020-02-06 |
Charged particle beam device
Grant 10,546,715 - Hoque , et al. Ja | 2020-01-28 |
High voltage power supply device and charged particle beam device
Grant 10,546,718 - Nishimoto , et al. Ja | 2020-01-28 |
Charged Particle Detector And Charged Particle Beam Apparatus
App 20190355549 - IMAMURA; Shin ; et al. | 2019-11-21 |
Charged Particle Beam Device And Charged Particle Beam Device Noise Source Determination Method
App 20190341225 - NISHIMOTO; Takuma ; et al. | 2019-11-07 |
Measurement And Inspection Device
App 20190318906 - LI; Wen ; et al. | 2019-10-17 |
Charged particle beam device
Grant 10,446,359 - Yokosuka , et al. Oc | 2019-10-15 |
Charged particle beam device
Grant 10,424,459 - Li , et al. Sept | 2019-09-24 |
Charged particle beam device and image forming method using same
Grant 10,373,797 - Li , et al. | 2019-08-06 |
Measuring Device And Measuring Method
App 20190206654 - TAKAHASHI; Noritsugu ; et al. | 2019-07-04 |
Electron Source And Electron Beam Irradiation Device
App 20190198284 - MATSUNAGA; Soichiro ; et al. | 2019-06-27 |
Charged Particle Beam Device
App 20190180979 - YOKOSUKA; Toshiyuki ; et al. | 2019-06-13 |
Scanning electron microscope with charge density control
Grant 10,297,419 - Hoque , et al. | 2019-05-21 |
Light Guide, Detector Having Light Guide, and Charged Particle Beam Device
App 20190115186 - SEKIGUCHI; Yoshifumi ; et al. | 2019-04-18 |
Charged Particle Beam Device
App 20190103250 - YOKOSUKA; Toshiyuki ; et al. | 2019-04-04 |
Charged particle beam device
Grant 10,249,474 - Yokosuka , et al. | 2019-04-02 |
Charged particle beam apparatus
Grant 10,217,604 - Sakakibara , et al. Feb | 2019-02-26 |
Charged Particle Detector, Charged Particle Beam Device, And Mass Spectrometer
App 20190027351 - IMAMURA; Shin ; et al. | 2019-01-24 |
Charged Particle Beam Device Having Inspection Scan Direction Based on Scan with Smaller Dose
App 20180374674 - ITAI; Hideki ; et al. | 2018-12-27 |
High Voltage Power Supply Device And Charged Particle Beam Device
App 20180366296 - NISHIMOTO; Takuma ; et al. | 2018-12-20 |
Machining apparatus, component producing method, and spark plug producing method
Grant 10,148,070 - Sato , et al. De | 2018-12-04 |
Scanning electron microscope
Grant 10,134,558 - Sohda , et al. November 20, 2 | 2018-11-20 |
Charged particle beam device and charged particle beam measurement method
Grant 10,121,634 - Tsuno , et al. November 6, 2 | 2018-11-06 |
Inspection method and apparatus of spark plug insulator
Grant 10,116,123 - Kominami , et al. October 30, 2 | 2018-10-30 |
Charged Particle Beam Apparatus
App 20180286629 - SAKAKIBARA; Makoto ; et al. | 2018-10-04 |
Charged Particle Beam Device
App 20180269026 - HOQUE; Shahedul ; et al. | 2018-09-20 |
Machining Apparatus, Component Producing Method, And Spark Plug Producing Method
App 20180254614 - SATO; Kimiaki ; et al. | 2018-09-06 |
Charged Particle Beam Device And Image Forming Method Using Same
App 20180247790 - Li; Wen ; et al. | 2018-08-30 |
Charged particle beam device
Grant 10,020,160 - Kuroda , et al. July 10, 2 | 2018-07-10 |
Scanning electron microscope and method for controlling same
Grant 10,014,160 - Shirahata , et al. July 3, 2 | 2018-07-03 |
Scanning-electron-microscope image processing device and scanning method
Grant 9,978,558 - Shimizu , et al. May 22, 2 | 2018-05-22 |
Charged-particle-beam device
Grant 9,960,006 - Takahashi , et al. May 1, 2 | 2018-05-01 |
Charged Particle Beam Device
App 20180106610 - KADOI; Ryo ; et al. | 2018-04-19 |
Charged Particle Beam Device
App 20180012725 - YOKOSUKA; Toshiyuki ; et al. | 2018-01-11 |
Charged particle beam apparatus and image forming method of charged particle beam apparatus
Grant 9,859,094 - Li , et al. January 2, 2 | 2018-01-02 |
Charged Particle Beam Device
App 20170323763 - ITAI; Hideki ; et al. | 2017-11-09 |
Charged particle beam device and detection method using said device
Grant 9,799,483 - Shojo , et al. October 24, 2 | 2017-10-24 |
Charged Particle Beam Device
App 20170278671 - YOKOSUKA; Toshiyuki ; et al. | 2017-09-28 |
Charged Particle Beam Device
App 20170271121 - LI; Wen ; et al. | 2017-09-21 |
Apparatus and method for manufacturing spark plug
Grant 9,748,742 - Kawano , et al. August 29, 2 | 2017-08-29 |
Charged Particle Beam Device
App 20170221672 - KURODA; Koichi ; et al. | 2017-08-03 |
Charged Particle Beam Apparatus And Image Forming Method Of Charged Particle Beam Apparatus
App 20170207061 - LI; Wen ; et al. | 2017-07-20 |
Charged particle beam device
Grant 9,697,987 - Yokosuka , et al. July 4, 2 | 2017-07-04 |
Scanning Electron Microscope And Method For Controlling Same
App 20170186583 - SHIRAHATA; Kaori ; et al. | 2017-06-29 |
Apparatus And Method For Manufacturing Spark Plug
App 20170179689 - KAWANO; Hajime ; et al. | 2017-06-22 |
Inspection Method And Apparatus Of Spark Plug Insulator
App 20170170637 - KOMINAMI; Shinichiro ; et al. | 2017-06-15 |
Charged particle beam device
Grant 9,679,740 - Li , et al. June 13, 2 | 2017-06-13 |
Scanning electron beam device with focus adjustment based on acceleration voltage and dimension measurement method using same
Grant 9,644,955 - Yano , et al. May 9, 2 | 2017-05-09 |
Charged particle beam apparatus, image forming method using a charged particle beam apparatus, and image processing apparatus
Grant 9,633,818 - Ikeda , et al. April 25, 2 | 2017-04-25 |
Charged-particle-beam Device
App 20170092459 - TAKAHASHI; Noritsugu ; et al. | 2017-03-30 |
Charged Particle Beam Device And Detection Method Using Said Device
App 20170053777 - SHOJO; Tomoyasu ; et al. | 2017-02-23 |
Scanning Electron Microscope
App 20170018394 - SOHDA; Yasunari ; et al. | 2017-01-19 |
Electron beam equipment
Grant 9,543,053 - Sohda , et al. January 10, 2 | 2017-01-10 |
Pattern critical dimension measurement equipment and method for measuring pattern critical dimension
Grant 9,520,266 - Shirahata , et al. December 13, 2 | 2016-12-13 |
Charged Particle Beam Device
App 20160329186 - LI; Wen ; et al. | 2016-11-10 |
Charged particle beam apparatus and image generation method
Grant 9,478,392 - Ikeda , et al. October 25, 2 | 2016-10-25 |
Charged Particle Beam Apparatus, Image Forming Method Using a Charged Particle Beam Apparatus, and Image Processing Apparatus
App 20160276128 - IKEDA; Kazuki ; et al. | 2016-09-22 |
Charged-particle beam device
Grant 9,443,695 - Ohashi , et al. September 13, 2 | 2016-09-13 |
Charged Particle Beam Device
App 20160240348 - YOKOSUKA; Toshiyuki ; et al. | 2016-08-18 |
Charged Particle Beam Device and Charged Particle Beam Measurement Method
App 20160225583 - TSUNO; Natsuki ; et al. | 2016-08-04 |
Method for removing foreign substances in charged particle beam device, and charged particle beam device
Grant 9,368,319 - Tanii , et al. June 14, 2 | 2016-06-14 |
Measurement and inspection device
Grant 9,368,324 - Li , et al. June 14, 2 | 2016-06-14 |
Manufacturing method of main metal fitting for spark plug and manufacturing method of spark plug
Grant 9,343,878 - Kawano , et al. May 17, 2 | 2016-05-17 |
Charged particle beam device and measuring method using the same
Grant 9,336,984 - Bizen , et al. May 10, 2 | 2016-05-10 |
Charged particle beam apparatus
Grant 9,312,091 - Sohda , et al. April 12, 2 | 2016-04-12 |
Charged Particle Beam Apparatus And Image Generation Method
App 20160064182 - Ikeda; Kazuki ; et al. | 2016-03-03 |
Electronic microscope, setting method of observation condition of electronic microscope, and observation method using electronic microscope
Grant 9,236,220 - Tsuno , et al. January 12, 2 | 2016-01-12 |
Measurement And Inspection Device
App 20150371819 - LI; Wen ; et al. | 2015-12-24 |
Charged-particle Beam Device
App 20150348747 - OHASHI; Takeyoshi ; et al. | 2015-12-03 |
Processing apparatus and method using a scanning electron microscope
Grant 9,177,759 - Li , et al. November 3, 2 | 2015-11-03 |
Method for Removing Foreign Substances in Charged Particle Beam Device, and Charged Particle Beam Device
App 20150279609 - Tanii; Kazuma ; et al. | 2015-10-01 |
Electron beam irradiation apparatus
Grant 9,053,905 - Hoque , et al. June 9, 2 | 2015-06-09 |
Charged particle beam apparatus
Grant 9,006,654 - Matsunaga , et al. April 14, 2 | 2015-04-14 |
Charged Particle Beam Apparatus
App 20150076362 - Sohda; Yasunari ; et al. | 2015-03-19 |
Electronic Microscope, Setting Method Of Observation Condition Of Electronic Microscope, And Observation Method Using Electronic Microscope
App 20150041644 - Tsuno; Natsuki ; et al. | 2015-02-12 |
Pattern Critical Dimension Measurement Equipment And Method For Measuring Pattern Critical Dimension
App 20150041648 - Shirahata; Kaori ; et al. | 2015-02-12 |
Processing Apparatus And Method Using A Scanning Electron Microscope
App 20150041643 - Li; Wen ; et al. | 2015-02-12 |
Charged Particle Beam Apparatus
App 20150034835 - Matsunaga; Soichiro ; et al. | 2015-02-05 |
Electron Beam Equipment
App 20150034836 - Sohda; Yasunari ; et al. | 2015-02-05 |
Scanning-electron-microscope Image Processing Device And Scanning Method
App 20150002651 - Shimizu; Kumiko ; et al. | 2015-01-01 |
Scanning Electron Beam Device And Dimension Measurement Method Using Same
App 20140339425 - Yano; Tasuku ; et al. | 2014-11-20 |
Measuring/inspecting apparatus and measuring/inspecting method enabling blanking control of electron beam
Grant 8,890,096 - Li , et al. November 18, 2 | 2014-11-18 |
Charged Particle Beam Device And Measuring Method Using The Same
App 20140299767 - Bizen; Daisuke ; et al. | 2014-10-09 |
Manufacturing Method Of Main Metal Fitting For Spark Plug And Manufacturing Method Of Spark Plug
App 20140194026 - Kawano; Hajime ; et al. | 2014-07-10 |
Electron Beam Irradiation Apparatus
App 20140077079 - Hoque; Shahedul ; et al. | 2014-03-20 |
Electron Beam Irradiation Apparatus
App 20140021348 - Hoque; Shahedul ; et al. | 2014-01-23 |
Measuring/inspecting Apparatus And Measuring/inspecting Method
App 20140008534 - LI; Wen ; et al. | 2014-01-09 |
Electron beam irradiation apparatus
Grant 8,618,499 - Hoque , et al. December 31, 2 | 2013-12-31 |
Scanning Electron Microscope
App 20130306866 - Hoque; Shahedul ; et al. | 2013-11-21 |
Automatic transfer method, transfer robot, and automatic transfer system
Grant 8,577,498 - Kawano , et al. November 5, 2 | 2013-11-05 |
Charged particle beam apparatus
Grant 8,334,520 - Otaka , et al. December 18, 2 | 2012-12-18 |
Autonomous mobile robot
Grant D663,333 - Kitano , et al. July 10, 2 | 2012-07-10 |
Autonomous mobile robot
Grant D663,334 - Kitano , et al. July 10, 2 | 2012-07-10 |
Charged Particle Beam Apparatus
App 20110260057 - Otaka; Tadashi ; et al. | 2011-10-27 |
Autonomous mobile robot
Grant D644,257 - Kitano , et al. August 30, 2 | 2011-08-30 |
Autonomous mobile robot
Grant D644,256 - Kitano , et al. August 30, 2 | 2011-08-30 |
Obstacle avoidance method and obstacle-avoidable mobile apparatus
Grant 7,778,776 - Goto , et al. August 17, 2 | 2010-08-17 |
Automatic Transfer Method, Transfer Robot, And Automatic Transfer System
App 20080294287 - KAWANO; Hajime ; et al. | 2008-11-27 |
Obstacle avoidance method and obstacle-avoidable mobile apparatus
App 20080040040 - Goto; Takanori ; et al. | 2008-02-14 |
Method of erasing repeated patterns and pattern defect inspection device
Grant 6,909,798 - Yukawa , et al. June 21, 2 | 2005-06-21 |
Magnet apparatus and mri apparatus
Grant 6,853,281 - Kakugawa , et al. February 8, 2 | 2005-02-08 |
Charged particle beam drawing apparatus and pattern forming method
Grant 6,831,283 - Yoda , et al. December 14, 2 | 2004-12-14 |
Electron beam lithography system
Grant 6,828,573 - Kawano , et al. December 7, 2 | 2004-12-07 |
Magnetic resonance imaging apparatus
Grant 6,816,047 - Takeshima , et al. November 9, 2 | 2004-11-09 |
Superconducting magnetic apparatus
Grant 6,781,492 - Takeshima , et al. August 24, 2 | 2004-08-24 |
Electron beam lithography system, electron beam lithography apparatus, and method of lithography
Grant 6,674,086 - Kamada , et al. January 6, 2 | 2004-01-06 |
Magnetic resonance imaging apparatus
App 20030155998 - Takeshima, Hirotaka ; et al. | 2003-08-21 |
Charged particle beam drawing apparatus and pattern forming method
App 20030146397 - Yoda, Haruo ; et al. | 2003-08-07 |
Open MRI system with a vertical static field and an imaging volume closer to the lower than to the upper magnet assembly
Grant 6,600,318 - Kakugawa , et al. July 29, 2 | 2003-07-29 |
Electron beam exposure system and exposing method using an electron beam
Grant 6,541,784 - Kawano , et al. April 1, 2 | 2003-04-01 |
Superconducting magnet apparatus
App 20020180571 - Takeshima, Hirotaka ; et al. | 2002-12-05 |
Electron Beam Lithography System, Electron Beam Lithography Apparatus, And Method Of Lithography
App 20020145119 - KAMADA, MASATO ; et al. | 2002-10-10 |
Superconducting magnetic device
Grant 6,437,672 - Takeshima , et al. August 20, 2 | 2002-08-20 |
Inspection method for master disk for magnetic recording media
App 20020081018 - Hamano, Seiji ; et al. | 2002-06-27 |
Superconducting magnet apparatus and method of regulating magnetization thereof
Grant 6,037,850 - Honmei , et al. March 14, 2 | 2000-03-14 |
Superconducting magnet apparatus and magnetic resonance imaging system using the same
Grant 5,936,498 - Takeshima , et al. August 10, 1 | 1999-08-10 |
Superconducting magnet apparatus using superconducting multilayer composite member, method of magnetizing the same and magnetic resonance imaging system employing the same
Grant 5,633,588 - Hommei , et al. May 27, 1 | 1997-05-27 |
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