Kawanishi; Shinsuke

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kawanishi; Shinsuke.The latest application filed is for "method for adjusting height of sample and observation system".

Company Profile

0.23.23

Kawanishi; Shinsuke - Tokyo JP
Kawanishi; Shinsuke - Minato-ku JP
Kawanishi; Shinsuke - Hitachinaka JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electron scanning microscope and image generation method Grant 10,157,724 - Kawanishi , et al. Dec	2018-12-18
Method for adjusting height of sample and observation system Grant 10,141,157 - Nakabayashi , et al. Nov	2018-11-27
Method for Adjusting Height of Sample and Observation System App 20180174796 - NAKABAYASHI; Makoto ; et al.	2018-06-21
Electron Scanning Microscope And Image Generation Method App 20180122617 - KAWANISHI; Shinsuke ; et al.	2018-05-03
Electron scanning microscope and image generation method Grant 9,875,877 - Kawanishi , et al. January 23, 2	2018-01-23
Charged particle beam device, image generation method, observation system Grant 9,824,854 - Ominami , et al. November 21, 2	2017-11-21
Charged particle beam apparatus and sample image acquiring method Grant 9,741,526 - Ominami , et al. August 22, 2	2017-08-22
Charged-particle-beam device, specimen-image acquisition method, and program recording medium Grant 9,741,530 - Ominami , et al. August 22, 2	2017-08-22
Diaphragm mounting member and charged particle beam device Grant 9,633,817 - Kawanishi , et al. April 25, 2	2017-04-25
Sample storage container, charged particle beam apparatus, and image acquiring method Grant 9,564,288 - Ominami , et al. February 7, 2	2017-02-07
Electron Scanning Microscope And Image Generation Method App 20160343538 - KAWANISHI; Shinsuke ; et al.	2016-11-24
Charged-Particle-Beam Device, Specimen-Image Acquisition Method, and Program Recording Medium App 20160336145 - OMINAMI; Yusuke ; et al.	2016-11-17
Charged Particle Beam Device, Image Generation Method, Observation System App 20160329188 - OMINAMI; Yusuke ; et al.	2016-11-10
Charged particle beam device, sample stage unit, and sample observation method Grant 9,472,375 - Ominami , et al. October 18, 2	2016-10-18
Observation apparatus and optical axis adjustment method Grant 9,466,457 - Ominami , et al. October 11, 2	2016-10-11
Charged Particle Beam Apparatus and Sample Image Acquiring Method App 20160203944 - OMINAMI; Yusuke ; et al.	2016-07-14
Diaphragm Mounting Member and Charged Particle Beam Device App 20160203941 - KAWANISHI; Shinsuke ; et al.	2016-07-14
Charged particle beam device and filter member Grant 9,373,480 - Kawanishi , et al. June 21, 2	2016-06-21
Charged particle beam apparatus and sample observation method Grant 9,362,083 - Ominami , et al. June 7, 2	2016-06-07
Charged Particle Beam Device and Filter Member App 20160071685 - KAWANISHI; Shinsuke ; et al.	2016-03-10
Charged particle beam device Grant 9,263,232 - Ominami , et al. February 16, 2	2016-02-16
Thin membrane holder for an electron microscope Grant D748,706 - Ominami , et al. February 2, 2	2016-02-02
Charged particle beam device, position adjusting method for diaphragm, and diaphragm position adjusting jig Grant 9,251,996 - Kawanishi , et al. February 2, 2	2016-02-02
Charged particle beam device and sample observation method Grant 9,240,305 - Ominami , et al. January 19, 2	2016-01-19
Inspection or observation apparatus and sample inspection or observation method Grant 9,236,217 - Ominami , et al. January 12, 2	2016-01-12
Charged Particle Beam Device, Sample Stage Unit, and Sample Observation Method App 20150311033 - OMINAMI; Yusuke ; et al.	2015-10-29
Sample Storage Container, Charged Particle Beam Apparatus, and Image Acquiring Method App 20150255244 - Ominami; Yusuke ; et al.	2015-09-10
Charged Particle Beam Device and Sample Observation Method App 20150235803 - Ominami; Yusuke ; et al.	2015-08-20
Charged Particle Beam Device, Position Adjusting Method for Diaphragm, and Diaphragm Position Adjusting Jig App 20150228449 - Kawanishi; Shinsuke ; et al.	2015-08-13
Observation Apparatus and Optical Axis Adjustment Method App 20150228448 - Ominami; Yusuke ; et al.	2015-08-13
Charged Particle Beam Apparatus and Sample Observation Method App 20150221470 - Ominami; Yusuke ; et al.	2015-08-06
Charged Particle Beam Apparatus App 20150213999 - Ominami; Yusuke ; et al.	2015-07-30
Thin membrane holder for an electron microscope Grant D731,570 - Ominami , et al. June 9, 2	2015-06-09
Base of a thin membrane holder for an electron microscope Grant D730,962 - Ominami , et al. June 2, 2	2015-06-02
Charged Particle Beam Device App 20150129763 - Ominami; Yusuke ; et al.	2015-05-14
Inspection Or Observation Apparatus And Sample Inspection Or Observation Method App 20150083908 - OMINAMI; Yusuke ; et al.	2015-03-26
Scanning electron microscope with a table being guided by rolling friction elements Grant 8,969,828 - Sakamoto , et al. March 3, 2	2015-03-03
Inspection or observation apparatus and sample inspection or observation method Grant 8,933,400 - Ominami , et al. January 13, 2	2015-01-13
Inspection Or Observation Apparatus And Sample Inspection Or Observation Method App 20140246583 - Ominami; Yusuke ; et al.	2014-09-04
Scanning Electron Microscope App 20130056636 - Haneda; Shigeru ; et al.	2013-03-07
Scanning Electron Microscope App 20130048854 - Sakamoto; Naoki ; et al.	2013-02-28

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