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Kawamoto; Masatsugu Patent Filings

Kawamoto; Masatsugu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kawamoto; Masatsugu.The latest application filed is for "charged particle beam system and method of measuring sample using scanning eletron microscope".

Company Profile
1.3.5
  • Kawamoto; Masatsugu - Tokyo JP
  • Kawamoto; Masatsugu - Fukuoka JP
  • Kawamoto; Masatsugu - Yokohama JP
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Charged particle beam system and method of measuring sample using scanning electron microscope
Grant 11,217,422 - Nemoto , et al. January 4, 2
2022-01-04
Charged Particle Beam System And Method Of Measuring Sample Using Scanning Eletron Microscope
App 20200251302 - Kind Code
2020-08-06
Power supply controller, relay node device, wired ad-hoc network system, and power supply control method
Grant 9,544,155 - Shimokawa , et al. January 10, 2
2017-01-10
Routing method and node equipment
Grant 9,210,096 - Shimokawa , et al. December 8, 2
2015-12-08
Power Supply Controller, Relay Node Device, Wired Ad-hoc Network System, And Power Supply Control Method
App 20140369180 - Shimokawa; Yoshinobu ;   et al.
2014-12-18
Routing Method And Node Equipment
App 20130170504 - SHIMOKAWA; Yoshinobu ;   et al.
2013-07-04
Multiprocessor system
App 20060212754 - Yamaguchi; Kunio ;   et al.
2006-09-21
Data signal transmission control apparatus
App 20050147092 - Kawamoto, Masatsugu ;   et al.
2005-07-07

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