Kawamata; Yosuke

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kawamata; Yosuke.The latest application filed is for "prober and semiconductor wafer testing method using the same".

Company Profile

0.3.8

Kawamata; Yosuke - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor device employing fuse circuit and method for selecting fuse circuit system Grant 7,656,220 - Kawamata , et al. February 2, 2	2010-02-02
Prober And Semiconductor Wafer Testing Method Using The Same App 20100013509 - SETOGUCHI; Shota ; et al.	2010-01-21
Push switch App 20090166163 - Moro; Hideo ; et al.	2009-07-02
Semiconductor memory device including fuse detection circuit to determine successful fuse-cutting rate for optical fuse-cutting conditions Grant 7,436,718 - Tanaka , et al. October 14, 2	2008-10-14
Probe card and measuring method for semiconductor wafers App 20070241765 - Kawamata; Yosuke	2007-10-18
Probe Card, Method Of Designing The Probe Card, And Method Of Testing Semiconductor Chips Using The Probe Card App 20070216429 - Fukushima; Yoshinori ; et al.	2007-09-20
Fuse detection method and semiconductor memory device including fuse detection circuit App 20060239101 - Tanaka; Hajime ; et al.	2006-10-26
Semiconductor device employing fuse circuit and method for selecting fuse circuit system App 20060125549 - Kawamata; Yosuke ; et al.	2006-06-15
Semiconductor device employing fuse circuit and method for selecting fuse circuit system App 20060125548 - Kitayama; Makoto ; et al.	2006-06-15
Memory testing apparatus and method Grant 6,684,355 - Kawamata January 27, 2	2004-01-27
Memory testing apparatus and method App 20010042231 - Kawamata, Yosuke	2001-11-15

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