| Patent | Date |
|---|
Minimization of over-masking in an on product multiple input signature register (OPMISR)
Grant 10,379,159 - Douskey , et al. A | 2019-08-13 |
Removal of over-masking in an on product multiple input signature register (OPMISR) test
Grant 10,371,749 - Douskey , et al. | 2019-08-06 |
Implementing enhanced diagnostics with intelligent pattern combination in automatic test pattern generation (ATPG)
Grant 10,372,853 - Douskey , et al. | 2019-08-06 |
Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through scan skewing
Grant 10,359,471 - Douskey , et al. | 2019-07-23 |
Implementing over-masking removal in an on product multiple input signature register (OPMISR) test due to common channel mask scan registers (CMSR) loading
Grant 10,345,380 - Douskey , et al. July 9, 2 | 2019-07-09 |
Implementing register array (RA) repair using LBIST
Grant 10,234,507 - Douskey , et al. | 2019-03-19 |
Implementing Enhanced Diagnostics With Intelligent Pattern Combination In Automatic Test Pattern Generation (atpg)
App 20180267102 - Douskey; Steven M. ; et al. | 2018-09-20 |
Implementing Integrated Circuit Yield Enhancement Through Array Fault Detection And Correction Using Combined Abist, Lbist, And Repair Techniques
App 20180259576 - Douskey; Steven M. ; et al. | 2018-09-13 |
Implementing prioritized compressed failure defects for efficient scan diagnostics
Grant 10,060,978 - Douskey , et al. August 28, 2 | 2018-08-28 |
Diagnosing failure locations of an integrated circuit with logic built-in self-test
Grant 10,024,914 - Douskey , et al. July 17, 2 | 2018-07-17 |
Implementing decreased scan data interdependence for compressed patterns in on product multiple input signature register (OPMISR) through spreading in stumpmux daisy-chain structure
Grant 10,024,917 - Douskey , et al. July 17, 2 | 2018-07-17 |
Implementing decreased scan data interdependence in on product multiple input signature register (OPMISR) through PRPG control rotation
Grant 9,964,591 - Douskey , et al. May 8, 2 | 2018-05-08 |
Implementing Register Array (ra) Repair Using Lbist
App 20180024189 - Douskey; Steven M. ; et al. | 2018-01-25 |
Diagnosing Failure Locations Of An Integrated Circuit With Logic Built-in Self-test
App 20180003768 - DOUSKEY; STEVEN M. ; et al. | 2018-01-04 |
Implementing Prioritized Compressed Failure Defects For Efficient Scan Diagnostics
App 20170363685 - Douskey; Steven M. ; et al. | 2017-12-21 |
Implementing Decreased Scan Data Interdependence For Compressed Patterns In On Product Multiple Input Signature Register (opmisr) Through Scan Skewing
App 20170356959 - Douskey; Steven M. ; et al. | 2017-12-14 |
Implementing Decreased Scan Data Interdependence In On Product Multiple Input Signature Register (opmisr) Through Prpg Control Rotation
App 20170299654 - Douskey; Steven M. ; et al. | 2017-10-19 |
Managing redundancy repair using boundary scans
Grant 9,568,549 - Douskey , et al. February 14, 2 | 2017-02-14 |
Partitioned scan chain diagnostics using multiple bypass structures and injection points
Grant 9,557,383 - Douskey , et al. January 31, 2 | 2017-01-31 |
Inserting bypass structures at tap points to reduce latch dependency during scan testing
Grant 9,551,747 - Douskey , et al. January 24, 2 | 2017-01-24 |
Inserting bypass structures at tap points to reduce latch dependency during scan testing
Grant 9,547,039 - Douskey , et al. January 17, 2 | 2017-01-17 |
Partitioned scan chain diagnostics using multiple bypass structures and injection points
Grant 9,529,046 - Douskey , et al. December 27, 2 | 2016-12-27 |
Implementing enhanced scan chain diagnostics via bypass multiplexing structure
Grant 9,429,622 - Douskey , et al. August 30, 2 | 2016-08-30 |
Implementing enhanced scan chain diagnostics via bypass multiplexing structure
Grant 9,429,621 - Douskey , et al. August 30, 2 | 2016-08-30 |
Implementing Enhanced Scan Chain Diagnostics Via Bypass Multiplexing Structure
App 20160216324 - Douskey; Steven M. ; et al. | 2016-07-28 |
Implementing Enhanced Scan Chain Diagnostics Via Bypass Multiplexing Structure
App 20160216323 - Douskey; Steven M. ; et al. | 2016-07-28 |
Inserting Bypass Structures At Tap Points To Reduce Latch Dependency During Scan Testing
App 20160169967 - Douskey; Steven M. ; et al. | 2016-06-16 |
Partitioned Scan Chain Diagnostics Using Multiple Bypass Structures And Injection Points
App 20160169969 - Douskey; Steven M. ; et al. | 2016-06-16 |
Partitioned Scan Chain Diagnostics Using Multiple Bypass Structures And Injection Points
App 20160169968 - Douskey; Steven M. ; et al. | 2016-06-16 |
Inserting Bypass Structures At Tap Points To Reduce Latch Dependency During Scan Testing
App 20160169972 - Douskey; Steven M. ; et al. | 2016-06-16 |
Test coverage of integrated circuits with masking pattern selection
Grant 9,366,723 - Douskey , et al. June 14, 2 | 2016-06-14 |
Managing Redundancy Repair Using Boundary Scans
App 20150346279 - Douskey; Steven M. ; et al. | 2015-12-03 |
Managing redundancy repair using boundary scans
Grant 9,201,117 - Douskey , et al. December 1, 2 | 2015-12-01 |
Self evaluation of system on a chip with multiple cores
Grant 9,188,636 - Douskey , et al. November 17, 2 | 2015-11-17 |
Test coverage of integrated circuits with test vector input spreading
Grant 9,116,205 - Douskey , et al. August 25, 2 | 2015-08-25 |
Self evaluation of system on a chip with multiple cores
Grant 9,069,041 - Douskey , et al. June 30, 2 | 2015-06-30 |
Dynamic built-in self-test system
Grant 9,003,244 - Douskey , et al. April 7, 2 | 2015-04-07 |
Dynamic Built-in Self-test System
App 20150039957 - Douskey; Steven M. ; et al. | 2015-02-05 |
Dynamic built-in self-test system
Grant 8,898,530 - Douskey , et al. November 25, 2 | 2014-11-25 |
Managing Redundancy Repair Using Boundary Scans
App 20140331097 - Douskey; Steven M. ; et al. | 2014-11-06 |
Test Coverage Of Integrated Circuits With Masking Pattern Selection
App 20140325298 - Douskey; Steven M. ; et al. | 2014-10-30 |
Test coverage of integrated circuits with masking pattern selection
Grant 8,856,720 - Douskey , et al. October 7, 2 | 2014-10-07 |
Test Coverage Of Integrated Circuits With Masking Pattern Selection
App 20140189612 - Douskey; Steven M. ; et al. | 2014-07-03 |
Implementing enhanced pseudo random pattern generators with hierarchical linear feedback shift registers (LFSRs)
Grant 8,762,803 - Douskey , et al. June 24, 2 | 2014-06-24 |
Self Evaluation Of System On A Chip With Multiple Cores
App 20140157073 - Douskey; Steven M. ; et al. | 2014-06-05 |
Self Evaluation Of System On A Chip With Multiple Cores
App 20140157072 - Douskey; Steven M. ; et al. | 2014-06-05 |
Test Coverage Of Integrated Circuits With Test Vector Input Spreading
App 20140089750 - Douskey; Steven M. ; et al. | 2014-03-27 |
Test Coverage Of Integrated Circuits With Test Vector Input Spreading
App 20140089751 - Douskey; Steven M. ; et al. | 2014-03-27 |
Test coverage of integrated circuits with masking pattern selection
Grant 8,667,431 - Douskey , et al. March 4, 2 | 2014-03-04 |
Iimplementing enhanced aperture function calibration for logic built in self test (LBIST)
Grant 8,627,162 - Douskey , et al. January 7, 2 | 2014-01-07 |
Dynamic scan
Grant 8,516,318 - Douskey , et al. August 20, 2 | 2013-08-20 |
IMPLEMENTING ENHANCED PSEUDO RANDOM PATTERN GENERATORS WITH HIERARCHICAL LINEAR FEEDBACK SHIFT REGISTERS (LFSRs)
App 20130191695 - Douskey; Steven M. ; et al. | 2013-07-25 |
Iimplementing Enhanced Aperture Function Calibration For Logic Built In Self Test (lbist)
App 20130151918 - Douskey; Steven M. ; et al. | 2013-06-13 |
Dynamic Scan
App 20120159273 - Douskey; Steven M. ; et al. | 2012-06-21 |
| 