Kato; Seima

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kato; Seima.The latest application filed is for "refractive index measuring method, refractive index measuring apparatus, and optical element manufacturing method".

Company Profile

0.20.18

Kato; Seima - Utsunomiya JP
Kato; Seima - Utsunomiya-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Wavefront aberration measuring method, wavefront aberration measuring apparatus and optical element manufacturing method Grant 9,557,241 - Kato January 31, 2	2017-01-31
Refractive Index Measuring Method, Refractive Index Measuring Apparatus, And Optical Element Manufacturing Method App 20160299066 - Kato; Seima	2016-10-13
Refractive-index Distribution Measuring Method, Refractive-index Distribution Measuring Apparatus, Method Of Manufacturing Optical Element, And Non-transitory Computer-readable Storage Medium App 20150260605 - Kato; Seima	2015-09-17
Wavefront Aberration Measuring Method, Wavefront Aberration Measuring Apparatus And Optical Element Manufacturing Method App 20140293275 - Kato; Seima	2014-10-02
Transmitted wavefront measuring method, refractive-index distribution measuring method, and transmitted wavefront measuring apparatus that calculate a frequency distribution and obtain a transmitted wavefront of the object based on a primary frequency spectrum in the frequency distribution Grant 8,786,863 - Kato July 22, 2	2014-07-22
Refractive index distribution measuring method and refractive index distribution measuring apparatus Grant 8,525,982 - Kato September 3, 2	2013-09-03
Talbot interferometer, its adjustment method, and measurement method Grant 8,520,217 - Naoi , et al. August 27, 2	2013-08-27
Refractive index distribution measuring method and apparatus using position measurement and a reference object Grant 8,508,725 - Kato August 13, 2	2013-08-13
Refractive index distribution measuring method and apparatus, and method of producing optical element thereof, that use multiple transmission wavefronts of a test object immersed in at least one medium having a different refractive index from that of the test object and multiple reference transmissi Grant 8,477,297 - Kato July 2, 2	2013-07-02
Refractive index distribution measurement method and apparatus that measure transmission wavefronts of a test object immersed in different media having refractive index lower than that of the test object Grant 8,472,013 - Kato June 25, 2	2013-06-25
Refractive Index Distribution Measuring Method, Refractive Index Distribution Measuring Apparatus And Method Of Producing Optical Element App 20120139136 - Kato; Seima	2012-06-07
Wavefront aberration measuring method, mask, wavefront aberration measuring device, exposure apparatus, and device manufacturing method Grant 8,077,391 - Ouchi , et al. December 13, 2	2011-12-13
Refractive Index Distribution Measuring Method And Refractive Index Distribution Measuring Apparatus App 20110292379 - Kato; Seima	2011-12-01
Measuring apparatus, exposure apparatus and method, and device manufacturing method Grant 8,004,691 - Ouchi , et al. August 23, 2	2011-08-23
Refractive Index Distribution Measuring Method And Refractive Index Distribution Measuring Apparatus App 20110134438 - Kato; Seima	2011-06-09
Measurement apparatus, exposure apparatus having the same, and device manufacturing method Grant 7,952,726 - Kato , et al. May 31, 2	2011-05-31
Talbot Interferometer, Its Adjustment Method, And Measurement Method App 20100271636 - Naoi; Toshiyuki ; et al.	2010-10-28
Transmitted Wavefront Measuring Method, Refractive-index Distribution Measuring Method, Method Of Manufacturing Optical Element, And Transmitted Wavefront Measuring Apparatus App 20100245842 - Kato; Seima	2010-09-30
Measurement Apparatus, Exposure Apparatus Having The Same, And Device Manufacturing Method App 20100190115 - Kato; Seima ; et al.	2010-07-29
Refractive Index Distribution Measurement Method And Refractive Index Distribution Measurement Apparatus App 20100165355 - Kato; Seima	2010-07-01
Measurement apparatus, exposure apparatus, and device fabrication method Grant 7,692,799 - Kato April 6, 2	2010-04-06
Measuring Apparatus, Exposure Apparatus And Method, And Device Manufacturing Method App 20090290136 - Ouchi; Chidane ; et al.	2009-11-26
Exposure Apparatus And Device Manufacturing Method App 20090268188 - Kato; Seima ; et al.	2009-10-29
Wavefront Aberration Measuring Method, Mask, Wavefront Aberration Measuring Device, Exposure Apparatus, And Device Manufacturing Method App 20090213389 - Ouchi; Chidane ; et al.	2009-08-27
Method and apparatus for analyzing interference fringe Grant 7,474,413 - Kato January 6, 2	2009-01-06
Apparatus for measuring optical properties of tested optical system using interference Grant 7,443,515 - Kato October 28, 2	2008-10-28
Measurement Apparatus, Exposure Apparatus, And Device Fabrication Method App 20080186509 - Kato; Seima	2008-08-07
Measuring method and apparatus using interference, exposure method and apparatus using the same, and device fabrication method Grant 7,283,252 - Kato October 16, 2	2007-10-16
Method and apparatus for analyzing interference fringe App 20060203253 - Kato; Seima	2006-09-14
Exposure apparatus App 20060072091 - Kato; Seima	2006-04-06
Apparatus for measuring optical properties of tested optical system using interference App 20060044569 - Kato; Seima	2006-03-02
Measuring method and apparatus using interference, exposure method and apparatus using the same, and device fabrication method App 20050117171 - Kato, Seima	2005-06-02

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