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Patent applications and USPTO patent grants for Katayama; Toshiharu.The latest application filed is for "pressure control valve".
Patent | Date |
---|---|
Pressure Control Valve App 20080251742 - Ise; Sadatake ;   et al. | 2008-10-16 |
Device inspecting for defect on semiconductor wafer surface Grant 7,023,541 - Mizuo , et al. April 4, 2 | 2006-04-04 |
Device inspecting for defect on semiconductor wafer surface App 20040080742 - Mizuo, Mariko ;   et al. | 2004-04-29 |
Method of testing semiconductor device Grant 6,650,129 - Katayama November 18, 2 | 2003-11-18 |
Method Of Testing Semiconductor Device App 20030210062 - Katayama, Toshiharu | 2003-11-13 |
Method of and apparatus for inspecting semiconductor device Grant 6,636,824 - Sawai , et al. October 21, 2 | 2003-10-21 |
Semiconductor device comprising trench EEPROM Grant 5,786,612 - Otani , et al. July 28, 1 | 1998-07-28 |
Non-volatile semiconductor information storage device Grant 5,708,285 - Otani , et al. January 13, 1 | 1998-01-13 |
Reduced resistance contact region for semiconductor device Grant 5,047,831 - Katayama September 10, 1 | 1991-09-10 |
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