Kasukabe; Susumu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kasukabe; Susumu.The latest application filed is for "inspection contact element and inspecting jig".

Company Profile

0.26.21

Kasukabe; Susumu - Kyoto JP
Kasukabe; Susumu - Yokohama JP
KASUKABE; Susumu - Yokohama -shi JP
Kasukabe; Susumu - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Inspection contact element and inspecting jig Grant 8,816,710 - Ohta , et al. August 26, 2	2014-08-26
Inspection Contact Element And Inspecting Jig App 20130033278 - Ohta; Norihiro ; et al.	2013-02-07
Probe card, semiconductor inspecting apparatus, and manufacturing method of semiconductor device Grant 8,314,624 - Kasukabe , et al. November 20, 2	2012-11-20
Probe Card, Semiconductor Inspecting Apparatus, And Manufacturing Method Of Semiconductor Device App 20110169518 - KASUKABE; Susumu ; et al.	2011-07-14
Probe card, semiconductor inspecting apparatus, and manufacturing method of semiconductor device Grant 7,956,627 - Kasukabe , et al. June 7, 2	2011-06-07
Thin Film Probe Sheet And Semiconductor Chip Inspection System App 20110014727 - YABUSHITA; Akira ; et al.	2011-01-20
Probe card, manufacturing method of probe card, semiconductor inspection apparatus and manufacturing method of semiconductor device Grant 7,724,006 - Kasukabe , et al. May 25, 2	2010-05-25
Probe cassette, semiconductor inspection apparatus and manufacturing method of semiconductor device Grant 7,656,174 - Kasukabe , et al. February 2, 2	2010-02-02
Probe Card, Manufacturing Method Of Probe Card, Semiconductor Inspection Apparatus And Manufacturing Method Of Semiconductor Device App 20090212798 - KASUKABE; Susumu ; et al.	2009-08-27
Connection Device And Test System App 20090209053 - KASUKABE; Susumu ; et al.	2009-08-20
Connection device and test system Grant 7,541,202 - Kasukabe , et al. June 2, 2	2009-06-02
Manufacturing method of semiconductor integrated circuit device Grant 7,534,629 - Shoji , et al. May 19, 2	2009-05-19
Probe Card, Semiconductor Inspecting Apparatus, And Manufacturing Method Of Semiconductor Device App 20090042323 - KASUKABE; Susumu ; et al.	2009-02-12
Probe sheet adhesion holder, probe card, semiconductor test device, and manufacturing method of semiconductor device Grant 7,423,439 - Kasukabe , et al. September 9, 2	2008-09-09
Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method Grant 7,420,380 - Kasukabe , et al. September 2, 2	2008-09-02
Method for producing a semiconductor device with pyramidal bump electrodes bonded onto pad electrodes arranged on a semiconductor chip Grant 7,390,732 - Watanabe , et al. June 24, 2	2008-06-24
Fabrication method of semiconductor integrated circuit device Grant 7,351,597 - Wada , et al. April 1, 2	2008-04-01
Transmission Circuit, Connecting Sheet, Probe Sheet, Probe Card, Semiconductor Inspection System and Method of Manufacturing Semiconductor Device App 20080029763 - Kasukabe; Susumu ; et al.	2008-02-07
Connection Device And Test System App 20080009082 - Kasukabe; Susumu ; et al.	2008-01-10
Probe Cassette, Semiconductor Inspection Apparatus And Manufacturing Method Of Semiconductor Device App 20070279074 - Kasukabe; Susumu ; et al.	2007-12-06
Connection device and test system Grant 7,285,430 - Kasukabe , et al. October 23, 2	2007-10-23
Fabrication Method Of Semiconductor Integrated Circuit Device App 20070218572 - Wada; Yuji ; et al.	2007-09-20
Semiconductor inspection apparatus and manufacturing method of semiconductor device Grant 7,227,370 - Kasukabe June 5, 2	2007-06-05
Fabrication method of semiconductor integrated circuit device Grant 7,219,422 - Wada , et al. May 22, 2	2007-05-22
Probe sheet adhesion holder, probe card, semiconductor test device, and manufacturing method of semiconductor device App 20070103178 - Kasukabe; Susumu ; et al.	2007-05-10
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step Grant 7,198,962 - Kohno , et al. April 3, 2	2007-04-03
Probe card and semiconductor testing device using probe sheet or probe card semiconductor device producing method App 20060192575 - Kasukabe; Susumu ; et al.	2006-08-31
Semiconductor inspection apparatus and manufacturing method of semiconductor device App 20060139042 - Kasukabe; Susumu	2006-06-29
Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method Grant 7,049,837 - Kasukabe , et al. May 23, 2	2006-05-23
Thin film probe sheet and semiconductor chip inspection system App 20060094162 - Yabushita; Akira ; et al.	2006-05-04
Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof Grant 6,900,646 - Kasukabe , et al. May 31, 2	2005-05-31
Connection device and test system App 20040235207 - Kasukabe, Susumu ; et al.	2004-11-25
Fabrication method of semiconductor integrated circuit device App 20040183556 - Wada, Yuji ; et al.	2004-09-23
Connection device and test system Grant 6,759,258 - Kasukabe , et al. July 6, 2	2004-07-06
Probe sheet, probe card, semiconductor test equipment and semiconductor device fabrication method App 20040070413 - Kasukabe, Susumu ; et al.	2004-04-15
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step App 20030203521 - Kohno, Ryuji ; et al.	2003-10-30
Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof Grant 6,617,863 - Kasukabe , et al. September 9, 2	2003-09-09
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step App 20020182796 - Kohno, Ryuji ; et al.	2002-12-05
Probing device and manufacturing method thereof, as well as testing apparatus and manufacturing method of semiconductor with use thereof App 20020135387 - Kasukabe, Susumu ; et al.	2002-09-26
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step Grant 6,455,335 - Kohno , et al. September 24, 2	2002-09-24
Connector and probing system Grant 6,305,230 - Kasukabe , et al. October 23, 2	2001-10-23
Semiconductor device and manufacturing method thereof including a probe test step and a burn-in test step Grant 6,197,603 - Kohno , et al. March 6, 2	2001-03-06
Manufacturing method of a probe head for semiconductor LSI inspection apparatus Grant 5,191,708 - Kasukabe , et al. March 9, 1	1993-03-09
Method of manufacturing probing head for testing equipment of semi-conductor large scale integrated circuits Grant 4,952,272 - Okino , et al. August 28, 1	1990-08-28
Apparatus for testing semiconductor device Grant 4,931,726 - Kasukabe , et al. June 5, 1	1990-06-05

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