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name:-0.037423849105835
name:-0.011498928070068
name:-0.0096709728240967
KASTRUP; Bernardo Patent Filings

KASTRUP; Bernardo

Patent Applications and Registrations

Patent applications and USPTO patent grants for KASTRUP; Bernardo.The latest application filed is for "method and apparatus for inspection".

Company Profile
5.9.15
  • KASTRUP; Bernardo - Veldhoven NL
  • Kastrup; Bernardo - Eindhoven N/A NL
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Method And Apparatus For Inspection
App 20210375581 - KASTRUP; Bernardo ;   et al.
2021-12-02
Computational Wafer Inspection
App 20210357570 - FOUQUET; Christophe David ;   et al.
2021-11-18
Method and apparatus for inspection
Grant 11,094,502 - Kastrup , et al. August 17, 2
2021-08-17
Computational wafer inspection
Grant 11,080,459 - Fouquet , et al. August 3, 2
2021-08-03
Method And Apparatus For Forming A Patterned Layer Of Material
App 20210079519 - DE JAGER; Pieter Willem Herman ;   et al.
2021-03-18
Method and apparatus to correct for patterning process error
Grant 10,915,689 - Ten Berge , et al. February 9, 2
2021-02-09
Computational Wafer Inspection
App 20200218849 - Fouquet; Christophe David ;   et al.
2020-07-09
Computational wafer inspection
Grant 10,579,772 - Fouquet , et al.
2020-03-03
Method And Apparatus For Inspection
App 20190006147 - KASTRUP; Bernardo ;   et al.
2019-01-03
Computational Wafer Inspection
App 20180365369 - FOUQUET; Christophe David ;   et al.
2018-12-20
Method And Apparatus To Correct For Patterning Process Error
App 20180307135 - TEN BERGE; Peter ;   et al.
2018-10-25
Method And Apparatus To Correct For Patterning Process Error
App 20180299770 - TEN BERGE; Peter ;   et al.
2018-10-18
Computational wafer inspection
Grant 9,990,462 - Fouquet , et al. June 5, 2
2018-06-05
Computational Wafer Inspection
App 20170046473 - FOUQUET; Christophe David ;   et al.
2017-02-16
Computational wafer inspection
Grant 9,507,907 - Fouquet , et al. November 29, 2
2016-11-29
Lithographic apparatus and methods for determining an improved configuration of a lithographic apparatus
Grant 9,229,336 - Finders , et al. January 5, 2
2016-01-05
Computational Wafer Inspection
App 20150356233 - FOUQUET; Christophe David ;   et al.
2015-12-10
Lithographic system, device manufacturing method, setpoint data optimization method, and apparatus for producing optimized setpoint data
Grant 8,259,285 - Troost , et al. September 4, 2
2012-09-04
Lithographic Apparatus And Methods For Determining An Improved Configuration Of A Lithographic Apparatus
App 20120194797 - FINDERS; Jozef Maria ;   et al.
2012-08-02
System For Generating And Displaying Images
App 20100302129 - Kastrup; Bernardo
2010-12-02
Method And Apparatus For Generating Visual Patterns
App 20100097381 - KASTRUP; Bernardo
2010-04-22
Apparatus And Method For Generating And Displaying Visual Content
App 20100097294 - KASTRUP; Bernardo
2010-04-22
Lithographic system, device manufacturing method, setpoint data optimization method, and apparatus for producing optimized setpoint data
App 20080143982 - Troost; Kars Zeger ;   et al.
2008-06-19

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