Kassab; Maroun
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kassab; Maroun.The latest application filed is for "identifying defects".
- Kassab; Maroun - St. Eustache CA
- Kassab; Maroun - Quebec N/A CA
- Kassab; Maroun - Essex Junction VT
| Patent | Date |
|---|---|
| Data mining shape based data Grant 9,244,946 - Kassab , et al. January 26, 2 | 2016-01-26 |
| Data mining shape based data Grant 9,235,601 - Kassab , et al. January 12, 2 | 2016-01-12 |
| Identifying defects Grant 8,571,299 - Fayaz , et al. October 29, 2 | 2013-10-29 |
| Insertion of faults in logic model used in simulation Grant 8,566,059 - Desineni , et al. October 22, 2 | 2013-10-22 |
| Method for testing integrated circuits Grant 8,136,082 - Desineni , et al. March 13, 2 | 2012-03-13 |
| Identifying Defects App 20120050728 - Fayaz; Mohammed F. ; et al. | 2012-03-01 |
| Method For Testing Integrated Circuits App 20110214102 - Desineni; Rao H. ; et al. | 2011-09-01 |
| Method for testing integrated circuits Grant 7,971,176 - Desineni , et al. June 28, 2 | 2011-06-28 |
| Insertion Of Faults In Logic Model Used In Simulation App 20110137602 - Desineni; Rao H. ; et al. | 2011-06-09 |
| Method for determining features associated with fails of integrated circuits Grant 7,870,519 - Desineni , et al. January 11, 2 | 2011-01-11 |
| System and method for signature-based systematic condition detection and analysis Grant 7,853,848 - Desineni , et al. December 14, 2 | 2010-12-14 |
| Methods and apparatus for testing a scan chain to isolate defects Grant 7,752,514 - Huisman , et al. July 6, 2 | 2010-07-06 |
| Iterative process for identifying systematics in data Grant 7,596,736 - Kassab , et al. September 29, 2 | 2009-09-29 |
| Method For Testing Integrated Circuits App 20090240458 - Desineni; Rao H. ; et al. | 2009-09-24 |
| Learning based logic diagnosis Grant 7,558,999 - Adkisson , et al. July 7, 2 | 2009-07-07 |
| Method For Testing An Integrated Circuit And Analyzing Test Data App 20090132976 - Desineni; Rao H. ; et al. | 2009-05-21 |
| System And Method For Signature-based Systematic Condition Detection And Analysis App 20090106614 - Desineni; Rao H. ; et al. | 2009-04-23 |
| Methods And Apparatus For Testing A Scan Chain To Isolate Defects App 20080059857 - HUISMAN; LEENDERT M. ; et al. | 2008-03-06 |
| Methods and apparatus for testing a scan chain to isolate defects Grant 7,313,744 - Huisman , et al. December 25, 2 | 2007-12-25 |
| Iterative Process For Identifying Systematics In Data App 20070226566 - Kassab; Maroun ; et al. | 2007-09-27 |
| Learning Based Logic Diagnosis App 20050273656 - Adkisson, James W. ; et al. | 2005-12-08 |
| Methods And Apparatus For Defect Isolation App 20050193297 - Huisman, Leendert M. ; et al. | 2005-09-01 |
| Method to detect systematic defects in VLSI manufacturing Grant 6,880,136 - Huisman , et al. April 12, 2 | 2005-04-12 |
| Method to detect systematic defects in VLSI manufacturing App 20040009616 - Huisman, Leendert M. ; et al. | 2004-01-15 |
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