Kassab; Mark A.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kassab; Mark A..The latest application filed is for "layout-friendly test pattern decompressor".

Company Profile

7.20.14

Kassab; Mark A. - Wilsonville OR
Kassab; Mark A - Wilsonville OR
Kassab; Mark A. - US

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Programmable test compactor for improving defect determination Grant 11,320,487 - Cheng , et al. May 3, 2	2022-05-03
Layout-friendly test pattern decompressor Grant 11,232,246 - Huang , et al. January 25, 2	2022-01-25
Layout-Friendly Test Pattern Decompressor App 20210150112 - Huang; Yu ; et al.	2021-05-20
Prediction of test pattern counts for scan configuration determination Grant 11,010,523 - Huang , et al. May 18, 2	2021-05-18
Deterministic test pattern generation for designs with timing exceptions Grant 10,977,400 - Cheng , et al. April 13, 2	2021-04-13
Deterministic Test Pattern Generation For Designs With Timing Exceptions App 20200410065 - Cheng; Wu-Tung ; et al.	2020-12-31
Efficient and flexible network for streaming data in circuits Grant 10,788,530 - Cote , et al. September 29, 2	2020-09-29
Streaming networks efficiency using data throttling Grant 10,775,436 - Cote , et al. Sept	2020-09-15
Data generation for streaming networks in circuits Grant 10,476,740 - Cote , et al. Nov	2019-11-12
Data streaming for testing identical circuit blocks Grant 10,473,721 - Cote , et al. Nov	2019-11-12
Channel sharing for testing circuits having non-identical cores Grant 9,915,702 - Huang , et al. March 13, 2	2018-03-13
Isometric test compression with low toggling activity Grant 9,651,622 - Rajski , et al. May 16, 2	2017-05-16
Dynamic shift for test pattern compression Grant 9,335,374 - Lin , et al. May 10, 2	2016-05-10
Test Scheduling and Test Access in Test Compression Environment App 20150285854 - Kassab; Mark A. ; et al.	2015-10-08
Isometric Test Compression With Low Toggling Activity App 20150253385 - Rajski; Janusz ; et al.	2015-09-10
Test scheduling with pattern-independent test access mechanism Grant 9,088,522 - Rajski , et al. July 21, 2	2015-07-21
Dynamic Shift For Test Pattern Compression App 20150153410 - Lin; Xijiang ; et al.	2015-06-04
Channel Sharing For Testing Circuits Having Non-Identical Cores App 20150149847 - Huang; Yu ; et al.	2015-05-28
Test access mechanism for diagnosis based on partitioning scan chains Grant 9,026,874 - Cheng , et al. May 5, 2	2015-05-05
Scan test application through high-speed serial input/outputs Grant 8,726,112 - Rajski , et al. May 13, 2	2014-05-13
Test Access Mechanism For Diagnosis Based On Partitioning Scan Chains App 20140101506 - Cheng; Wu-Tung ; et al.	2014-04-10
Test access mechanism for diagnosis based on partitioining scan chains Grant 8,607,107 - Cheng , et al. December 10, 2	2013-12-10
Test Scheduling With Pattern-Independent Test Access Mechanism App 20130290795 - Rajski; Janusz ; et al.	2013-10-31
At-speed scan testing with controlled switching activity Grant 8,499,209 - Rajski , et al. July 30, 2	2013-07-30
Test Access Mechanism For Diagnosis Based On Partitioining Scan Chains App 20110258504 - Cheng; Wu-Tung ; et al.	2011-10-20
Scan Test Application Through High-Speed Serial Input/Outputs App 20100313089 - Rajski; Janusz ; et al.	2010-12-09
At-Speed Scan Testing With Controlled Switching Activity App 20100275077 - Rajski; Janusz ; et al.	2010-10-28
Cell-Aware Fault Model Creation And Pattern Generation App 20100229061 - HAPKE; Friedrich ; et al.	2010-09-09

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