Kassab; Mark

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kassab; Mark.The latest application filed is for "multi-stage test response compactors".

Company Profile

5.47.40

Kassab; Mark - Wilsonville OR
Kassab; Mark - Willsonville OR
Kassab; Mark - Westmount CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Test scheduling and test access in test compression environment Grant 10,955,460 - Kassab , et al. March 23, 2	2021-03-23
Timing-aware test generation and fault simulation Grant 10,509,073 - Lin , et al. Dec	2019-12-17
Continuous application and decompression of test patterns and selective compaction of test responses Grant 10,234,506 - Rajski , et al.	2019-03-19
Multi-stage test response compactors Grant 10,120,024 - Rajski , et al. November 6, 2	2018-11-06
Multi-stage Test Response Compactors App 20180156867 - Rajski; Janusz ; et al.	2018-06-07
Timing-aware Test Generation And Fault Simulation App 20180045780 - Lin; Xijiang ; et al.	2018-02-15
Continuous Application And Decompression Of Test Patterns And Selective Compaction Of Test Responses App 20180017622 - Rajski; Janusz ; et al.	2018-01-18
Multi-stage test response compactors Grant 9,778,316 - Rajski , et al. October 3, 2	2017-10-03
Timing-aware test generation and fault simulation Grant 9,720,040 - Lin , et al. August 1, 2	2017-08-01
Continuous application and decompression of test patterns and selective compaction of test responses Grant 9,664,739 - Rasjki , et al. May 30, 2	2017-05-30
Multi-stage Test Response Compactors App 20160320450 - Rajski; Janusz ; et al.	2016-11-03
Continuous Application And Decompression Of Test Patterns And Selective Compaction Of Test Responses App 20160003907 - Rasjki; Janusz ; et al.	2016-01-07
Timing-aware Test Generation And Fault Simulation App 20150323600 - Lin; Xijiang ; et al.	2015-11-12
Continuous application and decompression of test patterns and selective compaction of test responses Grant 9,134,370 - Rajski , et al. September 15, 2	2015-09-15
Timing-aware test generation and fault simulation Grant 9,086,454 - Lin , et al. July 21, 2	2015-07-21
Timing-aware Test Generation And Fault Simulation App 20140047404 - Lin; Xijiang ; et al.	2014-02-13
Continuous Application And Decompression Of Test Patterns And Selective Compaction Of Test Responses App 20140006888 - Rajski; Janusz ; et al.	2014-01-02
Timing-aware test generation and fault simulation Grant 8,560,906 - Lin , et al. October 15, 2	2013-10-15
Continuous application and decompression of test patterns and selective compaction of test responses Grant 8,533,547 - Rajski , et al. September 10, 2	2013-09-10
Low power scan testing techniques and apparatus Grant 8,290,738 - Lin , et al. October 16, 2	2012-10-16
Timing-aware Test Generation And Fault Simulation App 20120174049 - Lin; Xijiang ; et al.	2012-07-05
Method and apparatus for selectively compacting test responses Grant 8,108,743 - Rajski , et al. January 31, 2	2012-01-31
Timing-aware test generation and fault simulation Grant 8,051,352 - Lin , et al. November 1, 2	2011-11-01
Method for synthesizing linear finite state machines Grant 8,024,387 - Rajski , et al. September 20, 2	2011-09-20
Continuous Application And Decompression Of Test Patterns And Selective Compaction Of Test Responses App 20110214026 - Rajski; Janusz ; et al.	2011-09-01
Generating responses to patterns stimulating an electronic circuit with timing exception paths Grant 7,984,354 - Goswami , et al. July 19, 2	2011-07-19
Low Power Scan Testing Techniques And Apparatus App 20110166818 - Lin; Xijiang ; et al.	2011-07-07
Decompressor/prpg For Applying Pseudo-random And Deterministic Test Patterns App 20110167309 - Rajski; Janusz ; et al.	2011-07-07
Method And Apparatus For Selectively Compacting Test Responses App 20110138242 - Rajski; Janusz ; et al.	2011-06-09
Low power scan testing techniques and apparatus Grant 7,925,465 - Lin , et al. April 12, 2	2011-04-12
Test pattern compression for an integrated circuit test environment Grant 7,900,104 - Rajski , et al. March 1, 2	2011-03-01
Continuous application and decompression of test patterns to a circuit-under-test Grant 7,877,656 - Rajski , et al. January 25, 2	2011-01-25
Decompressor/PRPG for applying pseudo-random and deterministic test patterns Grant 7,865,794 - Rajski , et al. January 4, 2	2011-01-04
Multi-stage test response compactors Grant 7,818,644 - Rajski , et al. October 19, 2	2010-10-19
Method and apparatus for selectively compacting test responses Grant 7,805,649 - Rajski , et al. September 28, 2	2010-09-28
Methods for distribution of test generation programs Grant 7,765,450 - Udell , et al. July 27, 2	2010-07-27
Methods for distributing programs for generating test data Grant 7,669,101 - Udell , et al. February 23, 2	2010-02-23
Generating Responses To Patterns Stimulating An Electronic Circuit With Timing Exception Paths App 20090327986 - Goswami; Dhiraj ; et al.	2009-12-31
Test Pattern Compression For An Integrated Circuit Test Environment App 20090259900 - Rajski; Janusz ; et al.	2009-10-15
Method And Apparatus For Selectively Compacting Test Responses App 20090228749 - Rajski; Janusz ; et al.	2009-09-10
Continuous Application And Decompression Of Test Patterns To A Circuit-under-test App 20090183041 - Rajski; Janusz ; et al.	2009-07-16
Decompressor/prpg For Applying Pseudo-random And Deterministic Test Patterns App 20090177933 - Rajski; Janusz ; et al.	2009-07-09
Generating responses to patterns stimulating an electronic circuit with timing exception paths Grant 7,555,689 - Goswami , et al. June 30, 2	2009-06-30
Test pattern compression for an integrated circuit test environment Grant 7,509,546 - Rajski , et al. March 24, 2	2009-03-24
Decompressor/PRPG for applying pseudo-random and deterministic test patterns Grant 7,506,232 - Rajski , et al. March 17, 2	2009-03-17
Method and apparatus for selectively compacting test responses Grant 7,500,163 - Rajski , et al. March 3, 2	2009-03-03
Continuous application and decompression of test patterns to a circuit-under-test Grant 7,493,540 - Rajski , et al. February 17, 2	2009-02-17
Continuous application and decompression of test patterns to a circuit-under-test Grant 7,478,296 - Rajski , et al. January 13, 2	2009-01-13
Methods For Distribution Of Test Generation Programs App 20080320352 - Udell; Jon ; et al.	2008-12-25
Methods For Distributing Programs For Generating Test Data App 20080216076 - Udell; Jon ; et al.	2008-09-04
Low power scan testing techniques and apparatus App 20080195346 - Lin; Xijiang ; et al.	2008-08-14
Methods for distributing programs for generating test data Grant 7,386,778 - Udell , et al. June 10, 2	2008-06-10
Method for synthesizing linear finite state machines App 20070294327 - Rajski; Janusz ; et al.	2007-12-20
Timing-aware test generation and fault simulation App 20070288822 - Lin; Xijiang ; et al.	2007-12-13
Generating masking control circuits for test response compactors App 20070234169 - Rajski; Janusz ; et al.	2007-10-04
Multi-stage test response compactors App 20070234157 - Rajski; Janusz ; et al.	2007-10-04
Method for synthesizing linear finite state machines Grant 7,260,591 - Rajski , et al. August 21, 2	2007-08-21
Methods for distributing programs for generating test data App 20070094556 - Udell; Jon ; et al.	2007-04-26
Methods for distribution of test generation programs App 20070094561 - Udell; Jon ; et al.	2007-04-26
Test pattern compression for an integrated circuit test environment App 20070016836 - Rajski; Janusz ; et al.	2007-01-18
Generating responses to patterns stimulating an electronic circuit with timing exception paths App 20070011527 - Goswami; Dhiraj ; et al.	2007-01-11
Decompressor/PRPG for applying pseudo-random and deterministic test patterns App 20070011530 - Rajski; Janusz ; et al.	2007-01-11
Test pattern compression for an integrated circuit test environment Grant 7,111,209 - Rajski , et al. September 19, 2	2006-09-19
Decompressor/PRPG for applying pseudo-random and deterministic test patterns Grant 7,093,175 - Rajski , et al. August 15, 2	2006-08-15
Method and apparatus for selectively compacting test reponses App 20050097419 - Rajski, Janusz ; et al.	2005-05-05
Method and apparatus for selectively compacting test responses Grant 6,829,740 - Rajski , et al. December 7, 2	2004-12-07
Method for synthesizing linear finite state machines App 20040172431 - Rajski, Janusz ; et al.	2004-09-02
Decompressor/PRPG for applying pseudo-random and deterministic test patterns App 20040128599 - Rajski, Janusz ; et al.	2004-07-01
Method for synthesizing linear finite state machines Grant 6,708,192 - Rajski , et al. March 16, 2	2004-03-16
Decompressor/PRPG for applying pseudo-random and deterministic test patterns Grant 6,684,358 - Rajski , et al. January 27, 2	2004-01-27
Test pattern compression for an integrated circuit test environment App 20030131298 - Rajski, Janusz ; et al.	2003-07-10
Continuous application and decompression of test patterns to a circuit-under-test App 20030120988 - Rajski, Janusz ; et al.	2003-06-26
Method and apparatus for selectively compacting test responses App 20030115521 - Rajski, Janusz ; et al.	2003-06-19
Method for synthesizing linear finite state machines App 20030110193 - Rajski, Janusz ; et al.	2003-06-12
Method and apparatus for selectively compacting test responses Grant 6,557,129 - Rajski , et al. April 29, 2	2003-04-29
Test pattern compression for an integrated circuit test environment Grant 6,543,020 - Rajski , et al. April 1, 2	2003-04-01
Method for synthesizing linear finite state machines Grant 6,539,409 - Rajski , et al. March 25, 2	2003-03-25
Test pattern compression for an integrated circuit test environment App 20020053057 - Rajski, Janusz ; et al.	2002-05-02
Method for synthesizing linear finite state machines Grant 6,353,842 - Rajski , et al. March 5, 2	2002-03-05
Method for synthesizing linear finite state machines App 20020016806 - Rajski, Janusz ; et al.	2002-02-07
Test pattern compression for an integrated circuit test environment Grant 6,327,687 - Rajski , et al. December 4, 2	2001-12-04
Self-testable digital integrator Grant 5,313,469 - Adham , et al. May 17, 1	1994-05-17

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