Patent | Date |
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System and method for modulation mapping Grant 9,915,700 - Kasapi March 13, 2 | 2018-03-13 |
System And Method For Modulation Mapping App 20160131703 - Kasapi; Steven | 2016-05-12 |
System and method for modulation mapping Grant 9,239,357 - Kasapi January 19, 2 | 2016-01-19 |
System and method for modulation mapping Grant 8,686,748 - Kasapi April 1, 2 | 2014-04-01 |
System And Method For Modulation Mapping App 20130113510 - Kasapi; Steven | 2013-05-09 |
System And Method For Modulation Mapping App 20110199110 - KASAPI; Steven | 2011-08-18 |
System and method for modulation mapping Grant 7,990,167 - Kasapi August 2, 2 | 2011-08-02 |
System and method for modulation mapping Grant 7,733,100 - Kasapi June 8, 2 | 2010-06-08 |
System and method for voltage noise and jitter measurement using time-resolved emission Grant 7,679,358 - Kasapi , et al. March 16, 2 | 2010-03-16 |
System And Method For Modulation Mapping App 20100039131 - Kasapi; Steven | 2010-02-18 |
Apparatus and method for probing integrated circuits using laser illumination Grant 7,616,312 - Kasapi , et al. November 10, 2 | 2009-11-10 |
Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits Grant 7,478,345 - Kasapi January 13, 2 | 2009-01-13 |
Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system Grant 7,450,245 - Woods , et al. November 11, 2 | 2008-11-11 |
Apparatus and method for detecting photon emissions from transistors Grant 7,439,730 - Desplats , et al. October 21, 2 | 2008-10-21 |
Apparatus and method for detecting photon emissions from transistors Grant 7,323,862 - Desplats , et al. January 29, 2 | 2008-01-29 |
System And Method For Voltage Noise And Jitter Measurement Using Time-resolved Emission App 20070236206 - Kasapi; Steven ;   et al. | 2007-10-11 |
Knife edge tracking system and method Grant 7,227,580 - Kasapi , et al. June 5, 2 | 2007-06-05 |
System and method for modulation mapping App 20070046301 - Kasapi; Steven | 2007-03-01 |
Laser probing system for integrated circuits App 20070002329 - Kasapi; Steven ;   et al. | 2007-01-04 |
Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system App 20070002328 - Woods; Gary ;   et al. | 2007-01-04 |
Apparatus And Method For Detecting Photon Emissions From Transistors App 20060181268 - Desplats; Romain ;   et al. | 2006-08-17 |
Apparatus and method for detecting photon emissions from transistors App 20060108997 - Desplats; Romain ;   et al. | 2006-05-25 |
Apparatus and method for dynamic diagnostic testing of integrated circuits App 20060103378 - Pakdaman; Nader ;   et al. | 2006-05-18 |
Optical coupling for testing integrated circuits Grant 7,042,563 - Wilsher , et al. May 9, 2 | 2006-05-09 |
Apparatus and method for detecting photon emissions from transistors Grant 7,038,442 - Desplats , et al. May 2, 2 | 2006-05-02 |
Apparatus and method for determining voltage using optical observation Grant 7,012,537 - Woods , et al. March 14, 2 | 2006-03-14 |
Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits App 20060031036 - Kasapi; Steven | 2006-02-09 |
Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits Grant 6,976,234 - Kasapi December 13, 2 | 2005-12-13 |
Universal diagnostic platform for specimen analysis Grant 6,961,672 - Kasapi November 1, 2 | 2005-11-01 |
System and method for calibration of testing equipment using device photoemission Grant 6,956,365 - Niv , et al. October 18, 2 | 2005-10-18 |
Apparatus and method for determining voltage using optical observation App 20050174248 - Woods, Gary Leonard ;   et al. | 2005-08-11 |
Apparatus and method for detecting photon emissions from transistors App 20050146321 - Desplats, Romain ;   et al. | 2005-07-07 |
Knife edge tracking system and method App 20050110893 - Kasapi, Steven ;   et al. | 2005-05-26 |
Apparatus and method for detecting photon emissions from transistors Grant 6,891,363 - Desplats , et al. May 10, 2 | 2005-05-10 |
Apparatus and method for dynamic diagnostic testing of integrated circuits Grant 6,859,031 - Pakdaman , et al. February 22, 2 | 2005-02-22 |
Time resolved emission spectral analysis system App 20050002028 - Kasapi, Steven ;   et al. | 2005-01-06 |
Spray cooling and transparent cooling plate thermal management system Grant 6,836,131 - Cader , et al. December 28, 2 | 2004-12-28 |
System and method for calibration of testing equipment using device photoemission App 20040201375 - Niv, Israel ;   et al. | 2004-10-14 |
Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits App 20040139406 - Kasapi, Steven | 2004-07-15 |
Apparatus and method for detecting photon emissions from transistors App 20040041575 - Desplats, Romain ;   et al. | 2004-03-04 |
Spray cooling and transparent cooling plate thermal management system App 20040032275 - Cader, Tahir ;   et al. | 2004-02-19 |
Universal diagnostic platform for specimen analysis App 20030220760 - Kasapi, Steven | 2003-11-27 |
Apparatus and method for dynamic diagnostic testing of integrated circuits App 20030146761 - Pakdaman, Nader ;   et al. | 2003-08-07 |