loadpatents
name:-0.039641141891479
name:-0.028158903121948
name:-0.00054597854614258
Kasapi; Steven Patent Filings

Kasapi; Steven

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kasapi; Steven.The latest application filed is for "system and method for modulation mapping".

Company Profile
0.22.22
  • Kasapi; Steven - San Francisco CA
  • Kasapi; Steven - San Fracisco CA
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
System and method for modulation mapping
Grant 9,915,700 - Kasapi March 13, 2
2018-03-13
System And Method For Modulation Mapping
App 20160131703 - Kasapi; Steven
2016-05-12
System and method for modulation mapping
Grant 9,239,357 - Kasapi January 19, 2
2016-01-19
System and method for modulation mapping
Grant 8,686,748 - Kasapi April 1, 2
2014-04-01
System And Method For Modulation Mapping
App 20130113510 - Kasapi; Steven
2013-05-09
System And Method For Modulation Mapping
App 20110199110 - KASAPI; Steven
2011-08-18
System and method for modulation mapping
Grant 7,990,167 - Kasapi August 2, 2
2011-08-02
System and method for modulation mapping
Grant 7,733,100 - Kasapi June 8, 2
2010-06-08
System and method for voltage noise and jitter measurement using time-resolved emission
Grant 7,679,358 - Kasapi , et al. March 16, 2
2010-03-16
System And Method For Modulation Mapping
App 20100039131 - Kasapi; Steven
2010-02-18
Apparatus and method for probing integrated circuits using laser illumination
Grant 7,616,312 - Kasapi , et al. November 10, 2
2009-11-10
Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits
Grant 7,478,345 - Kasapi January 13, 2
2009-01-13
Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system
Grant 7,450,245 - Woods , et al. November 11, 2
2008-11-11
Apparatus and method for detecting photon emissions from transistors
Grant 7,439,730 - Desplats , et al. October 21, 2
2008-10-21
Apparatus and method for detecting photon emissions from transistors
Grant 7,323,862 - Desplats , et al. January 29, 2
2008-01-29
System And Method For Voltage Noise And Jitter Measurement Using Time-resolved Emission
App 20070236206 - Kasapi; Steven ;   et al.
2007-10-11
Knife edge tracking system and method
Grant 7,227,580 - Kasapi , et al. June 5, 2
2007-06-05
System and method for modulation mapping
App 20070046301 - Kasapi; Steven
2007-03-01
Laser probing system for integrated circuits
App 20070002329 - Kasapi; Steven ;   et al.
2007-01-04
Method and apparatus for measuring high-bandwidth electrical signals using modulation in an optical probing system
App 20070002328 - Woods; Gary ;   et al.
2007-01-04
Apparatus And Method For Detecting Photon Emissions From Transistors
App 20060181268 - Desplats; Romain ;   et al.
2006-08-17
Apparatus and method for detecting photon emissions from transistors
App 20060108997 - Desplats; Romain ;   et al.
2006-05-25
Apparatus and method for dynamic diagnostic testing of integrated circuits
App 20060103378 - Pakdaman; Nader ;   et al.
2006-05-18
Optical coupling for testing integrated circuits
Grant 7,042,563 - Wilsher , et al. May 9, 2
2006-05-09
Apparatus and method for detecting photon emissions from transistors
Grant 7,038,442 - Desplats , et al. May 2, 2
2006-05-02
Apparatus and method for determining voltage using optical observation
Grant 7,012,537 - Woods , et al. March 14, 2
2006-03-14
Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits
App 20060031036 - Kasapi; Steven
2006-02-09
Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits
Grant 6,976,234 - Kasapi December 13, 2
2005-12-13
Universal diagnostic platform for specimen analysis
Grant 6,961,672 - Kasapi November 1, 2
2005-11-01
System and method for calibration of testing equipment using device photoemission
Grant 6,956,365 - Niv , et al. October 18, 2
2005-10-18
Apparatus and method for determining voltage using optical observation
App 20050174248 - Woods, Gary Leonard ;   et al.
2005-08-11
Apparatus and method for detecting photon emissions from transistors
App 20050146321 - Desplats, Romain ;   et al.
2005-07-07
Knife edge tracking system and method
App 20050110893 - Kasapi, Steven ;   et al.
2005-05-26
Apparatus and method for detecting photon emissions from transistors
Grant 6,891,363 - Desplats , et al. May 10, 2
2005-05-10
Apparatus and method for dynamic diagnostic testing of integrated circuits
Grant 6,859,031 - Pakdaman , et al. February 22, 2
2005-02-22
Time resolved emission spectral analysis system
App 20050002028 - Kasapi, Steven ;   et al.
2005-01-06
Spray cooling and transparent cooling plate thermal management system
Grant 6,836,131 - Cader , et al. December 28, 2
2004-12-28
System and method for calibration of testing equipment using device photoemission
App 20040201375 - Niv, Israel ;   et al.
2004-10-14
Apparatus and method for measuring characteristics of dynamic electrical signals in integrated circuits
App 20040139406 - Kasapi, Steven
2004-07-15
Apparatus and method for detecting photon emissions from transistors
App 20040041575 - Desplats, Romain ;   et al.
2004-03-04
Spray cooling and transparent cooling plate thermal management system
App 20040032275 - Cader, Tahir ;   et al.
2004-02-19
Universal diagnostic platform for specimen analysis
App 20030220760 - Kasapi, Steven
2003-11-27
Apparatus and method for dynamic diagnostic testing of integrated circuits
App 20030146761 - Pakdaman, Nader ;   et al.
2003-08-07

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