Karpol; Avner

Patent Applications and Registrations

Patent applications and USPTO patent grants for Karpol; Avner.The latest application filed is for "method and apparatus for article inspection including speckle reduction".

Company Profile

0.12.7

Karpol; Avner - Ziona IL
Karpol; Avner - Nes Ziona IL
Karpol; Avner - Nos Ziona IL
Karpol; Avner - Tel-Aviv IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method and apparatus for article inspection including speckle reduction Grant 7,463,352 - Karpol , et al. December 9, 2	2008-12-09
Method and apparatus for reticle inspection using aerial imaging Grant 7,133,548 - Kenan , et al. November 7, 2	2006-11-07
Method and apparatus for article inspection including speckle reduction Grant 6,924,891 - Karpol , et al. August 2, 2	2005-08-02
Method and apparatus for article inspection including speckle reduction App 20050128473 - Karpol, Avner ; et al.	2005-06-16
Method and apparatus for article inspection including speckle reduction App 20040201842 - Karpol, Avner ; et al.	2004-10-14
Method and apparatus for article inspection including speckle reduction Grant 6,798,505 - Karpol , et al. September 28, 2	2004-09-28
Method and apparatus for early detection and classification of retinal pathologies Grant 6,735,331 - Binnun , et al. May 11, 2	2004-05-11
Method and apparatus for article inspection including speckle reduction App 20030197858 - Karpol, Avner ; et al.	2003-10-23
Method of and apparatus for article inspection including speckle reduction Grant 6,587,194 - Karpol , et al. July 1, 2	2003-07-01
Method of and apparatus for article inspection including speckle reduction Grant 6,556,294 - Karpol , et al. April 29, 2	2003-04-29
Method and system for reticle inspection by photolithography simulation Grant 6,466,315 - Karpol , et al. October 15, 2	2002-10-15
Method of and apparatus for article inspection including speckle reduction App 20020080348 - Karpol, Avner ; et al.	2002-06-27
Method of and apparatus for article inspection including speckle reduction App 20020067478 - Karpol, Avner ; et al.	2002-06-06
Method and apparatus for article inspection including speckel reduction App 20020057427 - Karpol, Avner ; et al.	2002-05-16
Method and apparatus for article inspection including speckle reduction Grant 6,369,888 - Karpol , et al. April 9, 2	2002-04-09
Method and apparatus for reticle inspection using aerial imaging App 20010019625 - Kenan, Boaz ; et al.	2001-09-06
Method for reticle inspection using aerial imaging Grant 6,268,093 - Kenan , et al. July 31, 2	2001-07-31
Three dimensional imaging apparatus and a method for use thereof Grant 6,267,477 - Karpol , et al. July 31, 2	2001-07-31
Optical system for focusing a light beam on to an image plane Grant 5,140,608 - Karpol , et al. August 18, 1	1992-08-18

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