| Patent | Date |
|---|
Expert Knowledge Transfer Using Egocentric Video
App 20220277524 - Shtok; Joseph ; et al. | 2022-09-01 |
Incremental Learning Without Forgetting For Classification And Detection Models
App 20220207410 - HARARY; Sivan ; et al. | 2022-06-30 |
Identifying Related Messages In A Natural Language Interaction
App 20220207350 - Xue; Chao ; et al. | 2022-06-30 |
Semi-supervised Learning Of Training Gradients Via Task Generation
App 20220188639 - Karlinsky; Leonid ; et al. | 2022-06-16 |
Task-adaptive Architecture For Few-shot Learning
App 20220172036 - SCHWARTZ; ELIYAHU ; et al. | 2022-06-02 |
Method of deep learning-based examination of a semiconductor specimen and system thereof
Grant 11,348,001 - Karlinsky , et al. May 31, 2 | 2022-05-31 |
System and method for augmenting few-shot object classification with semantic information from multiple sources
Grant 11,263,488 - Schwartz , et al. March 1, 2 | 2022-03-01 |
Tafssl: Task Adaptive Feature Sub-space Learning For Few-shot Learning
App 20220058505 - Karlinsky; Leonid ; et al. | 2022-02-24 |
Method of deep learning-based examination of a semiconductor specimen and system thereof
Grant 11,205,119 - Karlinsky , et al. December 21, 2 | 2021-12-21 |
Method and system for producing digital image features
Grant 11,176,417 - Aides , et al. November 16, 2 | 2021-11-16 |
System And Method For Augmenting Few-shot Object Classification With Semantic Information From Multiple Sources
App 20210319263 - SCHWARTZ; ELIYAHU ; et al. | 2021-10-14 |
Unsupervised, Semi-supervised, And Supervised Learning Using Deep Learning Based Probabilistic Generative Models
App 20210256391 - Karlinsky; Leonid ; et al. | 2021-08-19 |
Method of deep learning-based examination of a semiconductor specimen and system thereof
Grant 11,010,665 - Karlinsky , et al. May 18, 2 | 2021-05-18 |
Systems And Methods For Training A Model Using A Few-shot Classification Process
App 20210089880 - Karlinsky; Leonid ; et al. | 2021-03-25 |
System and method for a visual recognition and/or detection of a potentially unbounded set of categories with limited examples per category and restricted query scope
Grant 10,878,297 - Dubovsky , et al. December 29, 2 | 2020-12-29 |
Representative-based metric learning for classification and few-shot object detection
Grant 10,832,096 - Karlinsky , et al. November 10, 2 | 2020-11-10 |
Out-of-sample generating few-shot classification networks
Grant 10,796,203 - Karlinsky , et al. October 6, 2 | 2020-10-06 |
Representative-Based Metric Learning for Classification and Few-Shot Object Detection
App 20200218931 - Karlinsky; Leonid ; et al. | 2020-07-09 |
Out-of-sample Generating Few-shot Classification Networks
App 20200175332 - Karlinsky; Leonid ; et al. | 2020-06-04 |
System And Method For A Visual Recognition And/or Detection Of A Potentially Unbounded Set Of Categories With Limited Examples P
App 20200074247 - DUBOVSKY; ODED ; et al. | 2020-03-05 |
Systems and methods for determining a camera pose of an image
Grant 10,467,756 - Karlinsky , et al. No | 2019-11-05 |
Systems and methods for identifying a target object in an image
Grant 10,395,143 - Harary , et al. A | 2019-08-27 |
Systems and methods for identifying a target object in an image
App 20190108420 - Harary; Sivan ; et al. | 2019-04-11 |
Systems and methods for identifying a target object in an image
Grant 10,229,347 - Harary , et al. | 2019-03-12 |
System and method for detection and classification of findings in images
Grant 10,223,610 - Akselrod-Ballin , et al. | 2019-03-05 |
Systems And Methods For Identifying A Target Object In An Image
App 20180330198 - HARARY; SIVAN ; et al. | 2018-11-15 |
Systems And Methods For Determining A Camera Pose Of An Image
App 20180330504 - Karlinsky; Leonid ; et al. | 2018-11-15 |
System and method for patch based inspection
Grant 9,904,995 - Karlinsky , et al. February 27, 2 | 2018-02-27 |
Method Of Deep Learning-based Examination Of A Semiconductor Specimen And System Thereof
App 20170364798 - KARLINSKY; Leonid ; et al. | 2017-12-21 |
Method Of Deep Learining-based Examination Of A Semiconductor Specimen And System Thereof
App 20170357895 - KARLINSKY; Leonid ; et al. | 2017-12-14 |
Method Of Deep Learining-based Examination Of A Semiconductor Specimen And System Thereof
App 20170177997 - KARLINSKY; Leonid ; et al. | 2017-06-22 |
System And Method For Patch Based Inspection
App 20170169554 - KARLINSKY; Leonid ; et al. | 2017-06-15 |
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