Karklin; Linard

Patent Applications and Registrations

Patent applications and USPTO patent grants for Karklin; Linard.The latest application filed is for "system and method of providing mask defect printability analysis".

Company Profile

0.9.9

Karklin; Linard - Sunnyvale CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
System and method of providing mask defect printability analysis Grant 7,835,565 - Cai , et al. November 16, 2	2010-11-16
System And Method Of Providing Mask Defect Printability Analysis App 20090245621 - Cai; Lynn ; et al.	2009-10-01
System and method of providing mask defect printability analysis Grant 7,565,001 - Cai , et al. July 21, 2	2009-07-21
System And Method Of Providing Mask Defect Printability Analysis App 20080260235 - Cai; Lynn ; et al.	2008-10-23
System and method of providing mask defect printability analysis Grant 7,403,649 - Cai , et al. July 22, 2	2008-07-22
System And Method Of Providing Mask Defect Printablity Analysis App 20070292017 - Cai; Lynn ; et al.	2007-12-20
System and method of providing mask defect printability analysis Grant 7,254,251 - Cai , et al. August 7, 2	2007-08-07
Visual analysis and verification system using advanced tools Grant 7,107,571 - Chang , et al. September 12, 2	2006-09-12
System and method of providing mask defect printability analysis App 20050190957 - Cai, Lynn ; et al.	2005-09-01
System and method of providing mask quality control Grant 6,925,202 - Karklin , et al. August 2, 2	2005-08-02
System and method of providing mask defect printability analysis Grant 6,873,720 - Cai , et al. March 29, 2	2005-03-29
Integrated scheme for semiconductor device verification Grant 6,681,376 - Balasinski , et al. January 20, 2	2004-01-20
User interface for a network-based mask defect printability analysis system App 20030126581 - Pang, Linyong ; et al.	2003-07-03
Method and apparatus for a network-based mask defect printability analysis system Grant 6,578,188 - Pang , et al. June 10, 2	2003-06-10
System and method of providing mask defect printability analysis App 20020164065 - Cai, Lynn ; et al.	2002-11-07
System and method of providing mask quality control App 20020164064 - Karklin, Linard ; et al.	2002-11-07
Visual analysis and verification system using advanced tools App 20020035461 - Chang, Fang-Cheng ; et al.	2002-03-21
Visual Inspection And Verification System App 20020019729 - CHANG, FANG-CHENG ; et al.	2002-02-14

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