Karin; Jacob

Patent Applications and Registrations

Patent applications and USPTO patent grants for Karin; Jacob.The latest application filed is for "electron microscope array for inspection and lithography".

Company Profile

0.5.9

Karin; Jacob - Ramat Gan IL

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Scanning mechanism for high-speed high-resolution scanning Grant 7,037,012 - Karin , et al. May 2, 2	2006-05-02
Electron microscope array for inspection and lithography App 20060033035 - Itzkovitch; Mordechai ; et al.	2006-02-16
Confocal microscopy arrangement without beam splitter App 20050111082 - Karin, Jacob	2005-05-26
Auto-focus method for a scanning microscope Grant 6,824,056 - Karin November 30, 2	2004-11-30
Scanning mechanism for high-speed high-resolution scanning App 20040165923 - Karin, Jacob ; et al.	2004-08-26
Image sensor for confocal microscopy App 20040140417 - Karin, Jacob	2004-07-22
Cartesian scanning system Grant 6,735,005 - Karin , et al. May 11, 2	2004-05-11
Multiple scanning system and method App 20040075879 - Karin, Jacob	2004-04-22
Confocal microscope with diffractively formed virtual pinhole array App 20040051976 - Karin, Jacob ; et al.	2004-03-18
Circular scanning patterns Grant 6,603,589 - Karin , et al. August 5, 2	2003-08-05
Circular scanning patterns App 20030099022 - Karin, Jacob ; et al.	2003-05-29
Cartesian scanning system App 20030090772 - Karin, Jacob ; et al.	2003-05-15
Tilted scan for Die-to-Die and Cell-to-Cell detection App 20030081826 - Karin, Jacob ; et al.	2003-05-01
Method and apparatus for indicating repetition intervals of a specified component of a composite electrical signal, particularly useful for displaying fetal r-waves Grant 4,945,917 - Akselrod , et al. August 7, 1	1990-08-07

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