loadpatents
name:-0.029536008834839
name:-0.021413087844849
name:-0.0092878341674805
Karim; Ishtak Patent Filings

Karim; Ishtak

Patent Applications and Registrations

Patent applications and USPTO patent grants for Karim; Ishtak.The latest application filed is for "variable cycle and time rf activation method for film thickness matching in a multi-station deposition system".

Company Profile
10.23.33
  • Karim; Ishtak - Portland OR
  • Karim; Ishtak - San Jose CA
  • Karim; Ishtak - Tigard OR
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Planar substrate edge contact with open volume equalization pathways and side containment
Grant 11,443,975 - Breiling , et al. September 13, 2
2022-09-13
Variable Cycle And Time Rf Activation Method For Film Thickness Matching In A Multi-station Deposition System
App 20220154336 - Karim; Ishtak ;   et al.
2022-05-19
Dynamic Precursor Dosing For Atomic Layer Deposition
App 20220033967 - Kumar; Purushottam ;   et al.
2022-02-03
Line Bending Control For Memory Applications
App 20220028864 - BUTAIL; Gorun ;   et al.
2022-01-27
Dynamic precursor dosing for atomic layer deposition
Grant 11,180,850 - Kumar , et al. November 23, 2
2021-11-23
Method Of Improving Deposition Induced Cd Imbalance Using Spatially Selective Ashing Of Carbon Based Film
App 20210202250 - KARIM; Ishtak ;   et al.
2021-07-01
Method of improving deposition induced CD imbalance using spatially selective ashing of carbon based film
Grant 10,978,302 - Karim , et al. April 13, 2
2021-04-13
Electrostatic Chuck With Seal Surface
App 20210013080 - Breiling; Patrick G. ;   et al.
2021-01-14
Planar Substrate Edge Contact With Open Volume Equalization Pathways And Side Containment
App 20200227304 - Breiling; Patrick ;   et al.
2020-07-16
Minimization of carbon loss in ALD SiO2 deposition on hardmask films
Grant 10,692,717 - Agnew , et al.
2020-06-23
Selective atomic layer deposition with post-dose treatment
Grant 10,679,848 - Kumar , et al.
2020-06-09
Conical wafer centering and holding device for semiconductor processing
Grant 10,655,224 - Agarwal , et al.
2020-05-19
Planar substrate edge contact with open volume equalization pathways and side containment
Grant 10,622,243 - Breiling , et al.
2020-04-14
Minimization of Carbon Loss in ALD SiO2 Deposition on Hardmask Films
App 20200027718 - Agnew; Douglas Walter ;   et al.
2020-01-23
Minimization of carbon loss in ALD SiO2 deposition on hardmask films
Grant 10,340,136 - Agnew , et al.
2019-07-02
Method Of Improving Deposition Induced Cd Imbalance Using Spatially Selective Ashing Of Carbon Based Film
App 20190164757 - KARIM; Ishtak ;   et al.
2019-05-30
Showerhead curtain gas method and system for film profile modulation
Grant 10,202,691 - Karim , et al. Feb
2019-02-12
Dynamic Precursor Dosing For Atomic Layer Deposition
App 20190024233 - Kumar; Purushottam ;   et al.
2019-01-24
Systems and methods for detection of plasma instability by electrical measurement
Grant 10,128,160 - Sakiyama , et al. November 13, 2
2018-11-13
Selective Atomic Layer Deposition With Post-dose Treatment
App 20180323057 - Kumar; Purushottam ;   et al.
2018-11-08
Dynamic precursor dosing for atomic layer deposition
Grant 10,094,018 - Kumar , et al. October 9, 2
2018-10-09
High dry etch rate materials for semiconductor patterning applications
Grant 10,074,543 - Mahorowala , et al. September 11, 2
2018-09-11
Selective atomic layer deposition with post-dose treatment
Grant 10,062,563 - Kumar , et al. August 28, 2
2018-08-28
Selective atomic layer deposition for gapfill using sacrificial underlayer
Grant 10,037,884 - Ou , et al. July 31, 2
2018-07-31
Conical Wafer Centering And Holding Device For Semiconductor Processing
App 20180171473 - Agarwal; Pulkit ;   et al.
2018-06-21
Systems and methods for frequency modulation of radiofrequency power supply for controlling plasma instability
Grant 9,997,422 - Karim , et al. June 12, 2
2018-06-12
Systems and methods for using electrical asymmetry effect to control plasma process space in semiconductor fabrication
Grant 9,941,113 - Keil , et al. April 10, 2
2018-04-10
Systems and Methods for Detection of Plasma Instability by Electrical Measurement
App 20180076100 - Sakiyama; Yukinori ;   et al.
2018-03-15
High Dry Etch Rate Materials For Semiconductor Patterning Applications
App 20180061650 - Mahorowala; Arpan ;   et al.
2018-03-01
Selective Atomic Layer Deposition For Gapfill Using Sacrificial Underlayer
App 20180061628 - Ou; Fung Suong ;   et al.
2018-03-01
Variable temperature hardware and methods for reduction of wafer backside deposition
Grant 9,870,917 - Kang , et al. January 16, 2
2018-01-16
Selective Atomic Layer Deposition With Post-dose Treatment
App 20180005814 - Kumar; Purushottam ;   et al.
2018-01-04
Dynamic Precursor Dosing For Atomic Layer Deposition
App 20170362705 - Kumar; Purushottam ;   et al.
2017-12-21
Showerhead Curtain Gas Method And System For Film Profile Modulation
App 20170362713 - Karim; Ishtak ;   et al.
2017-12-21
Systems and methods for detection of plasma instability by electrical measurement
Grant 9,824,941 - Sakiyama , et al. November 21, 2
2017-11-21
Systems and Methods for Using Electrical Asymmetry Effect to Control Plasma Process Space in Semiconductor Fabrication
App 20170330744 - Keil; Douglas ;   et al.
2017-11-16
Variable Cycle And Time Rf Activation Method For Film Thickness Matching In A Multi-station Deposition System
App 20170314129 - Karim; Ishtak ;   et al.
2017-11-02
Showerhead curtain gas method and system for film profile modulation
Grant 9,738,977 - Karim , et al. August 22, 2
2017-08-22
Variable Temperature Hardware And Methods For Reduction Of Wafer Backside Deposition
App 20170178898 - Kang; Hu ;   et al.
2017-06-22
Systems and Methods for Frequency Modulation of Radiofrequency Power Supply for Controlling Plasma Instability
App 20170141002 - Karim; Ishtak ;   et al.
2017-05-18
Systems and Methods for Detection of Plasma Instability by Electrical Measurement
App 20170141000 - Sakiyama; Yukinori ;   et al.
2017-05-18
Systems and methods for using electrical asymmetry effect to control plasma process space in semiconductor fabrication
Grant 9,644,271 - Keil , et al. May 9, 2
2017-05-09
Dynamic Precursor Dosing For Atomic Layer Deposition
App 20170096735 - Kumar; Purushottam ;   et al.
2017-04-06
Method and apparatus to deposit pure titanium thin film at low temperature using titanium tetraiodide precursor
Grant 9,478,438 - Thombare , et al. October 25, 2
2016-10-25
Method to tune TiO.sub.x stoichiometry using atomic layer deposited Ti film to minimize contact resistance for TiO.sub.x/Ti based MIS contact scheme for CMOS
Grant 9,478,411 - Thombare , et al. October 25, 2
2016-10-25
Method To Tune Tiox Stoichiometry Using Atomic Layer Deposited Ti Film To Minimize Contact Resistance For Tiox/ti Based Mis Contact Scheme For Cmos
App 20160056037 - Thombare; Shruti Vivek ;   et al.
2016-02-25
Method And Apparatus To Deposit Pure Titanium Thin Film At Low Temperature Using Titanium Tetraiodide Precursor
App 20160056053 - Thombare; Shruti Vivek ;   et al.
2016-02-25
Apparatus And Method For Uniform Irradiation Using Secondary Irradiant Energy From A Single Light Source
App 20150163860 - Burkhart; Vincent E. ;   et al.
2015-06-11
Plasma Process Etch-to-deposition Ratio Modulation Via Ground Surface Design
App 20140127912 - Wu; Liqi ;   et al.
2014-05-08
Creation Of Off-axis Null Magnetic Field Locus For Improved Uniformity In Plasma Deposition And Etching
App 20130206725 - Leeser; Karl ;   et al.
2013-08-15
Magnetic lensing to improve deposition uniformity in a physical vapor deposition (PVD) process
Grant 8,343,318 - Leeser , et al. January 1, 2
2013-01-01
Creation Of Magnetic Field (vector Potential) Well For Improved Plasma Deposition And Resputtering Uniformity
App 20120228125 - Wu; Liqi ;   et al.
2012-09-13
Creation Of Magnetic Field (vector Potential) Well For Improved Plasma Deposition And Resputtering Uniformity
App 20120070589 - Wu; Liqi ;   et al.
2012-03-22
Magnetic Lensing To Improve Deposition Uniformity In A Physical Vapor Deposition (pvd) Process
App 20110233050 - Leeser; Karl ;   et al.
2011-09-29

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