Karasawa; Wataru

Patent Applications and Registrations

Patent applications and USPTO patent grants for Karasawa; Wataru.The latest application filed is for "relay station and substrate processing system using relay station".

Company Profile

0.12.7

Karasawa; Wataru - Tokyo JP
Karasawa; Wataru - Yokohama JP
Karasawa; Wataru - Cupertino CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Apparatus productivity improving system and its method Grant 7,454,317 - Karasawa November 18, 2	2008-11-18
Relay Station And Substrate Processing System Using Relay Station App 20080124192 - Karasawa; Wataru	2008-05-29
Apparatus productivity improving system and its method App 20070179751 - Karasawa; Wataru	2007-08-02
Processing method and device App 20070004051 - Okumoto; Yasuhiro ; et al.	2007-01-04
Apparatus productivity improving system and its method Grant 7,133,807 - Karasawa November 7, 2	2006-11-07
Sharging method and charging system App 20060010087 - Karasawa; Wataru	2006-01-12
Semiconductor device inspection system Grant 6,969,620 - Karasawa November 29, 2	2005-11-29
Semiconductor manufacturing system and control method thereof Grant 6,839,603 - Karasawa January 4, 2	2005-01-04
System for enhanging apparatus productivity and method thereof App 20040073405 - Karasawa, Wataru	2004-04-15
Semiconductor device inspection system App 20030155280 - Karasawa, Wataru	2003-08-21
Semiconductor manufacturing system and control method thereof App 20030153995 - Karasawa, Wataru	2003-08-14
Probing test method of contacting a plurality of probes of a probe card with pads on a chip on a semiconductor wafer Grant 5,436,571 - Karasawa July 25, 1	1995-07-25
Probe apparatus with a swinging holder for an object of examination Grant 5,404,111 - Mori , et al. April 4, 1	1995-04-04
Electrical characteristics measurement method and measurement apparatus therefor Grant 5,374,888 - Karasawa December 20, 1	1994-12-20
Probe apparatus for probing an object held above the probe card Grant 5,321,453 - Mori , et al. June 14, 1	1994-06-14
Probe apparatus Grant 5,086,270 - Karasawa , et al. February 4, 1	1992-02-04
Wafer probe plate holder Grant D320,361 - Karasawa October 1, 1	1991-10-01
Method and apparatus of performing probing test for electrically and sequentially testing semiconductor device patterns Grant 4,985,676 - Karasawa January 15, 1	1991-01-15
Apparatus and method of testing a semiconductor wafer Grant 4,965,515 - Karasawa October 23, 1	1990-10-23

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