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name:-0.0042009353637695
name:-0.0063531398773193
Kappes; Steffen Patent Filings

Kappes; Steffen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kappes; Steffen.The latest application filed is for "environmental scanning and image reconstruction thereof".

Company Profile
6.3.5
  • Kappes; Steffen - Oedheim-Degmarn DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Environmental Scanning And Image Reconstruction Thereof
App 20220049948 - Schmitz; Evelyn ;   et al.
2022-02-17
Referencing Pose Manipulation System For Marker Based Tracking Of Position Measurement System
App 20220048199 - Heidemann; Rolf ;   et al.
2022-02-17
Mounting arrangement for 3D sensor
Grant 10,935,365 - Heidemann , et al. March 2, 2
2021-03-02
Modular Inspection System For Measuring An Object
App 20210048291 - Tahir; Muhammad Umair ;   et al.
2021-02-18
Quality inspection system and method of operation
Grant 10,663,292 - Raab , et al.
2020-05-26
Quality Inspection System And Method Of Operation
App 20200096328 - Raab; Simon ;   et al.
2020-03-26
Mounting Arrangement For 3d Sensor
App 20190323822 - Heidemann; Rolf ;   et al.
2019-10-24
Quality inspection system and method of operation
Grant 10,408,606 - Raab , et al. Sept
2019-09-10

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