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Patent applications and USPTO patent grants for Kapp; Daniel.The latest application filed is for "laser marking focus feedback system".
Patent | Date |
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Laser marking focus feedback system having an intensity indication of reflected radiation passed through an objective lens, a beam splitter and a pinhole Grant 10,916,462 - Russin , et al. February 9, 2 | 2021-02-09 |
Laser Marking Focus Feedback System App 20190122912 - Russin; Timothy ;   et al. | 2019-04-25 |
Defect marking for semiconductor wafer inspection Grant 10,082,470 - Shortt , et al. September 25, 2 | 2018-09-25 |
Defect Marking For Semiconductor Wafer Inspection App 20180088056 - Shortt; David ;   et al. | 2018-03-29 |
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