Kao; Chi-An

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kao; Chi-An.The latest application filed is for "method for searching, analyzing, and optimizing process parameters and computer program product thereof".

Company Profile

0.7.7

Kao; Chi-An - Tainan N/A TW
KAO; Chi-An - TAINAN CITY TW
Kao; Chi-An - Hsin-Chu TW
Kao, Chi-An - Hsin-Chu City TW

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Manufacturing execution system with virtual-metrology capabilities and manufacturing system including the same Grant 8,983,644 - Cheng , et al. March 17, 2	2015-03-17
Method For Searching, Analyzing, And Optimizing Process Parameters And Computer Program Product Thereof App 20140222376 - KAO; Chi-An ; et al.	2014-08-07
Advanced process control system and method utilizing virtual metrology with reliance index Grant 8,688,256 - Cheng , et al. April 1, 2	2014-04-01
Constant and reducible hole bottom CD in variable post-CMP thickness and after-development-inspection CD Grant 8,207,532 - Kao , et al. June 26, 2	2012-06-26
Advanced Process Control System And Method Utilizing Virtual Metrology With Reliance Index App 20120029662 - CHENG; Fan-Tien ; et al.	2012-02-02
Manufacturing Execution System With Virtual-metrology Capabilities And Manufacturing System Including The Same App 20110251707 - CHENG; Fan-Tien ; et al.	2011-10-13
Adjustable electrodes and coils for plasma density distribution control Grant 7,829,815 - Chen , et al. November 9, 2	2010-11-09
Dual-phase virtual metrology method Grant 7,603,328 - Cheng , et al. October 13, 2	2009-10-13
Dual-phase virtual metrology method App 20080306625 - Cheng; Fan-Tien ; et al.	2008-12-11
Adjustable Electrodes And Coils For Plasma Density Distribution Control App 20080083710 - Chen; Ying-Lin ; et al.	2008-04-10
Mechanism for synchronizing manafacturing information systems and document content management systems data App 20050228765 - Huang, Chen-Chu ; et al.	2005-10-13
Constant and reducible hole bottom CD in variable post-CMP thickness and after-development-inspection CD App 20050059251 - Kao, Chi-An ; et al.	2005-03-17

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