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Patent applications and USPTO patent grants for Kantz; Dieter.The latest application filed is for "test configuration for the functional testing of a semiconductor chip".
Patent | Date |
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Test configuration for the functional testing of a semiconductor chip Grant 6,825,682 - Kantz , et al. November 30, 2 | 2004-11-30 |
Test configuration for the functional testing of a semiconductor chip App 20010043078 - Kantz, Dieter ;   et al. | 2001-11-22 |
Method of operating a semiconductor memory with a capability of testing, and an evaluation circuit for performing the method Grant 4,752,929 - Kantz , et al. June 21, 1 | 1988-06-21 |
Integrated semiconductor circuit with a dynamic read-write memory Grant 4,602,353 - Wawersig , et al. July 22, 1 | 1986-07-22 |
Semiconductor circuit with a circuit part controlled by a substrate bias Grant 4,454,431 - Hoffmann , et al. June 12, 1 | 1984-06-12 |
Monolithically integrated semiconductor memory with dummy and charge equalization cells Grant 4,393,478 - Kantz , et al. July 12, 1 | 1983-07-12 |
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