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name:-0.0028488636016846
name:-0.0066449642181396
name:-0.00088405609130859
Kantz; Dieter Patent Filings

Kantz; Dieter

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kantz; Dieter.The latest application filed is for "test configuration for the functional testing of a semiconductor chip".

Company Profile
0.5.1
  • Kantz; Dieter - Hennigsdorf DE
  • Kantz; Dieter - Munchen DE
  • Kantz; Dieter - Munich DE
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Test configuration for the functional testing of a semiconductor chip
Grant 6,825,682 - Kantz , et al. November 30, 2
2004-11-30
Test configuration for the functional testing of a semiconductor chip
App 20010043078 - Kantz, Dieter ;   et al.
2001-11-22
Method of operating a semiconductor memory with a capability of testing, and an evaluation circuit for performing the method
Grant 4,752,929 - Kantz , et al. June 21, 1
1988-06-21
Integrated semiconductor circuit with a dynamic read-write memory
Grant 4,602,353 - Wawersig , et al. July 22, 1
1986-07-22
Semiconductor circuit with a circuit part controlled by a substrate bias
Grant 4,454,431 - Hoffmann , et al. June 12, 1
1984-06-12
Monolithically integrated semiconductor memory with dummy and charge equalization cells
Grant 4,393,478 - Kantz , et al. July 12, 1
1983-07-12

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