Kantake; Shusuke

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kantake; Shusuke.The latest application filed is for "test apparatus and test method".

Company Profile

0.6.6

Kantake; Shusuke - Gunma JP
Kantake; Shusuke - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Receiving apparatus, test apparatus, receiving method, and test method Grant 8,604,773 - Kantake , et al. December 10, 2	2013-12-10
Test Apparatus And Test Method App 20110248733 - KANTAKE; Shusuke	2011-10-13
Receiving Apparatus, Test Apparatus, Receiving Method, And Test Method App 20110115468 - KANTAKE; Shusuke ; et al.	2011-05-19
Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device Grant 7,574,316 - Suda , et al. August 11, 2	2009-08-11
Testing apparatus and testing method Grant 7,549,099 - Kantake June 16, 2	2009-06-16
Delay circuit, and testing apparatus Grant 7,511,547 - Suda , et al. March 31, 2	2009-03-31
Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device Grant 7,460,969 - Suda , et al. December 2, 2	2008-12-02
Pulse Width Adjustment Circuit, Pulse Width Adjustment Method, And Test Apparatus For Semiconductor Device App 20080201099 - Suda; Masakatsu ; et al.	2008-08-21
Pulse width adjustment circuit, pulse width adjustment method, and test apparatus for semiconductor device App 20080018371 - Suda; Masakatsu ; et al.	2008-01-24
Testing apparatus and testing method App 20070006031 - Kantake; Shusuke	2007-01-04
Delay circuit, and testing apparatus App 20060267656 - Suda; Masakatsu ; et al.	2006-11-30

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