| Patent | Date |
|---|
Dram Device And Odt Resistor Value Adjustment Method And Computer Program For The Same
App 20220284946 - Kang; Sang-Seok ; et al. | 2022-09-08 |
Memory device, memory module including the memory device, method of fabricating the memory module, and method of repairing the memory module
Grant 9,672,891 - Kang , et al. June 6, 2 | 2017-06-06 |
Memory Device, Memory Module Including The Memory Device, Method Of Fabricating The Memory Module, And Method Of Repairing The Memory Module
App 20160155487 - KANG; DAN-KYU ; et al. | 2016-06-02 |
Memory device, memory module including the memory device, method of fabricating the memory module, and method of repairing the memory module
Grant 9,286,956 - Kang , et al. March 15, 2 | 2016-03-15 |
Memory Module And Memory System
App 20150262620 - SONG; Won-Hyung ; et al. | 2015-09-17 |
Memory module and a memory test system for testing the same
Grant 9,026,870 - Lee , et al. May 5, 2 | 2015-05-05 |
Memory Device, Memory Module Including The Memory Device, Method Of Fabricating The Memory Module, And Method Of Repairing The Memory Module
App 20150062999 - KANG; DAN-KYU ; et al. | 2015-03-05 |
Memory Module And A Memory Test System For Testing The Same
App 20140032984 - Lee; Jung-kuk ; et al. | 2014-01-30 |
Semiconductor device, method of adjusting load capacitance for the same, and semiconductor system including the same
Grant 08619484 - | 2013-12-31 |
Semiconductor device, method of adjusting load capacitance for the same, and semiconductor system including the same
Grant 8,619,484 - Lim , et al. December 31, 2 | 2013-12-31 |
Fuse circuit and semiconductor device having the same
Grant 8,477,553 - Kang , et al. July 2, 2 | 2013-07-02 |
Semiconductor memory devices including burn-in test circuits
Grant 8,441,877 - Choi , et al. May 14, 2 | 2013-05-14 |
Semiconductor memory device and method of reducing consumption of standby current therein
Grant 8,411,520 - Lee , et al. April 2, 2 | 2013-04-02 |
Mobile system on chip (SoC) and mobile terminal using the mobile SoC, and method for refreshing a memory in the mobile SoC
Grant 8,228,736 - Joo , et al. July 24, 2 | 2012-07-24 |
Semiconductor memory device
Grant 8,208,317 - Kang , et al. June 26, 2 | 2012-06-26 |
Semiconductor memory device for self refresh and memory system having the same
Grant 8,144,539 - Lim , et al. March 27, 2 | 2012-03-27 |
Semiconductor Device, Method Of Adjusting Load Capacitance For The Same, And Semiconductor System Including The Same
App 20120063251 - LIM; Jong Hyoung ; et al. | 2012-03-15 |
Semiconductor memory device having dummy sense amplifiers and methods of utilizing the same
Grant 8,102,689 - Hong , et al. January 24, 2 | 2012-01-24 |
Semiconductor memory device and method of performing a memory operation
Grant 8,015,459 - Lim , et al. September 6, 2 | 2011-09-06 |
Fuse Circuit And Semiconductor Device Having The Same
App 20110188334 - KANG; Sang-Seok ; et al. | 2011-08-04 |
Semiconductor Memory Devices Including Burn-in Test Circuits
App 20100246300 - Choi; Jong-Hyun ; et al. | 2010-09-30 |
Semiconductor memory device and method of reducing consumption of standby current therein
App 20100172193 - Lee; Myung-Jae ; et al. | 2010-07-08 |
Semiconductor Memory Device For Self Refresh And Memory System Having The Same
App 20100165773 - LIM; Jong-Hyoung ; et al. | 2010-07-01 |
Mobile system on chip (SoC) and mobile terminal using the mobile SoC, and method for refreshing a memory in the mobile SoC
App 20100142291 - Joo; Jae Hoon ; et al. | 2010-06-10 |
Semiconductor Memory Device Having Dummy Sense Amplifiers And Methods Of Utilizing The Same
App 20100118633 - HONG; Min-Ki ; et al. | 2010-05-13 |
Semiconductor memory device and method thereof
App 20100106900 - Lim; Jong-Hyoung ; et al. | 2010-04-29 |
Semiconductor memory device including on die termination circuit and on die termination method thereof
Grant 7,675,316 - Lim , et al. March 9, 2 | 2010-03-09 |
Semiconductor memory device
App 20100034031 - Kang; Sang-Seok ; et al. | 2010-02-11 |
Semiconductor memory device and method of performing a memory operation
Grant 7,657,800 - Lim , et al. February 2, 2 | 2010-02-02 |
Semiconductor memory device having dummy sense amplifiers and methods of utilizing the same
Grant 7,649,760 - Hong , et al. January 19, 2 | 2010-01-19 |
Parallel bit test circuit and method for semiconductor memory device
Grant 7,624,317 - Byun , et al. November 24, 2 | 2009-11-24 |
Semiconductor device having a plurality of temperature sensors and semiconductor device control method using the plurality of temperature sensors
Grant 7,569,904 - Oh , et al. August 4, 2 | 2009-08-04 |
Test apparatus for semiconductor memory device
Grant 7,558,993 - Park , et al. July 7, 2 | 2009-07-07 |
Data input/output method of semiconductor memory device and semiconductor memory device for the same
Grant 7,483,320 - Byun , et al. January 27, 2 | 2009-01-27 |
Bit line sense amplifier and method thereof
Grant 7,466,616 - Byun , et al. December 16, 2 | 2008-12-16 |
Dynamic random access memory and communications terminal including the same
Grant 7,460,428 - Joo , et al. December 2, 2 | 2008-12-02 |
Circuit and method of generating internal supply voltage in semiconductor memory device
Grant 7,391,254 - Lim , et al. June 24, 2 | 2008-06-24 |
Semiconductor memory device and method thereof
App 20080052567 - Lim; Jong-Hyoung ; et al. | 2008-02-28 |
Parallel bit test circuit and method for semiconductor memory device
App 20070288812 - Byun; Sang-Man ; et al. | 2007-12-13 |
Apparatus and methods for generating a column select line signal in semiconductor memory device
Grant 7,295,488 - Hwang , et al. November 13, 2 | 2007-11-13 |
Circuit and method of generating internal supply voltage in semiconductor memory device
App 20070070695 - Lim; Jong-Hyoung ; et al. | 2007-03-29 |
Semiconductor device having fuse circuits
App 20070058316 - Lim; Jong-Hyoung ; et al. | 2007-03-15 |
Semiconductor Memory Device Having Dummy Sense Amplifiers And Methods Of Utilizing The Same
App 20070041260 - HONG; Min-Ki ; et al. | 2007-02-22 |
Semiconductor memory device including on die termination circuit and on die termination method thereof
App 20070030025 - Lim; Jong-Hyoung ; et al. | 2007-02-08 |
Bit line sense amplifier and method thereof
App 20070030748 - Byun; Sang-Man ; et al. | 2007-02-08 |
Method and apparatus for controlling a high voltage generator in a wafer burn-in test
Grant 7,173,872 - Park , et al. February 6, 2 | 2007-02-06 |
Dynamic random access memory and communications terminal including the same
App 20070008802 - Joo; Jae-hoon ; et al. | 2007-01-11 |
Fuse circuit with controlled fuse burn out and method thereof
Grant 7,161,407 - Kim , et al. January 9, 2 | 2007-01-09 |
Circuit with fuse and semiconductor device having the same circuit
Grant 7,116,127 - Jung , et al. October 3, 2 | 2006-10-03 |
Semiconductor memory device, write control circuit and write control method for the same
Grant 7,075,854 - Lee , et al. July 11, 2 | 2006-07-11 |
Semiconductor device
App 20060132183 - Lim; Dong-Jin ; et al. | 2006-06-22 |
Apparatus and methods for generating a column select line signal in semiconductor memory device
App 20060126421 - Hwang; Sung-Min ; et al. | 2006-06-15 |
Fuse arrangement and integrated circuit device using the same
Grant 7,057,217 - Kang , et al. June 6, 2 | 2006-06-06 |
Method and apparatus for controlling a high voltage generator in a wafer burn-in test
App 20060114731 - Park; Choong-Sun ; et al. | 2006-06-01 |
Test apparatus for semiconductor memory device
App 20060107134 - Park; Cheol-Hong ; et al. | 2006-05-18 |
Data input/output method of semiconductor memory device and semiconductor memory device for the same
App 20060092723 - Byun; Sang-Man ; et al. | 2006-05-04 |
Method and apparatus for controlling a high voltage generator in a wafer burn-in test
Grant 7,016,248 - Park , et al. March 21, 2 | 2006-03-21 |
Semiconductor device having a plurality of temperature sensors and semiconductor device control method using the plurality of temperature sensors
App 20060012930 - Oh; Boa-Yeong ; et al. | 2006-01-19 |
Semiconductor device with malfunction control circuit and controlling method thereof
Grant 6,972,612 - Kang , et al. December 6, 2 | 2005-12-06 |
Bit line pre-charge circuit of semiconductor memory device
Grant 6,909,654 - Joo , et al. June 21, 2 | 2005-06-21 |
Voltage measurement device tolerant of undershooting or overshooting input voltage of pad
Grant 6,906,545 - Jung , et al. June 14, 2 | 2005-06-14 |
Fuse circuit with controlled fuse burn out and method thereof
App 20050122159 - Kim, Jong-Hoon ; et al. | 2005-06-09 |
Semiconductor memory device, write control circuit and write control method for the same
App 20050117437 - Lee, Sei-Hui ; et al. | 2005-06-02 |
Integrated circuit memory devices and operating methods that are configured to output data bits at a lower rate in a test mode of operation
Grant 6,898,139 - Lee , et al. May 24, 2 | 2005-05-24 |
Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same
Grant 6,861,682 - Bang , et al. March 1, 2 | 2005-03-01 |
Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell
Grant 6,850,450 - Bang , et al. February 1, 2 | 2005-02-01 |
Integrated circuit memory devices and operating methods that are configured to output data bits at a lower rate in a test mode of operation
App 20040246801 - Lee, Jae-woong ; et al. | 2004-12-09 |
Voltage and time control circuits and methods of operating the same
App 20040246045 - Lim, Kyu-Nam ; et al. | 2004-12-09 |
Voltage and time control circuits
Grant 6,788,132 - Lim , et al. September 7, 2 | 2004-09-07 |
Circuit for generating control signal using make-link type fuse
Grant 6,751,148 - Kang June 15, 2 | 2004-06-15 |
Fuse arrangement and integrated circuit device using the same
App 20040108572 - Kang, Sang-Seok ; et al. | 2004-06-10 |
Circuit with fuse and semiconductor device having the same circuit
App 20040046601 - Jung, Young-Hee ; et al. | 2004-03-11 |
Method and apparatus for controlling a high voltage generator in a wafer burn-in test
App 20040037150 - Park, Choong-Sun ; et al. | 2004-02-26 |
Bit line pre-charge circuit of semiconductor memory device
App 20040027897 - Joo, Jae-Hoon ; et al. | 2004-02-12 |
Test signal generating circuit of a semiconductor device with pins receiving signals of multiple voltage levels and method for invoking test modes
Grant 6,658,612 - Park , et al. December 2, 2 | 2003-12-02 |
Semiconductor device having chip selection circuit and method of generating chip selection signal
Grant 6,643,191 - Lee , et al. November 4, 2 | 2003-11-04 |
Laser link structure capable of preventing an upper crack and broadening an energy window of a laser beam, and fuse box using the same
App 20030095451 - Bang, Jeong-Ho ; et al. | 2003-05-22 |
Semiconductor device with malfunction control circuit and controlling method thereof
App 20030065994 - Kang, Sang-Seok ; et al. | 2003-04-03 |
Fuse box including make-link and redundant address decoder having the same, and method for repairing defective memory cell
App 20030026147 - Bang, Kwang-Kyu ; et al. | 2003-02-06 |
Circuit for generating control signal using make-link type fuse
App 20020196694 - Kang, Sang-Seok | 2002-12-26 |
Fuse circuit and program status detecting method thereof
Grant 6,498,526 - Lim , et al. December 24, 2 | 2002-12-24 |
Voltage and time control circuits and methods of operating the same
App 20020171472 - Lim, Kyu-Nam ; et al. | 2002-11-21 |
Semiconductor device having chip selection circuit and method of generating chip selection signal
App 20020141247 - Lee, Yun-sang ; et al. | 2002-10-03 |
Arrangement Of Bitline Boosting Capacitor In Semiconductor Memory Device
App 20020085428 - Kang, Sang-Seok ; et al. | 2002-07-04 |
Semiconductor Memory Device And Method Of Identifying Programmed Defective Address Thereof
App 20020060934 - Choi, Jong-Hyun ; et al. | 2002-05-23 |
Dynamic random access memory (DRAM) having a structure for emplying a word line low voltage
App 20020044488 - Kang, Sang-Seok ; et al. | 2002-04-18 |
Semiconductor memory device and bit line isolation gate arrangement method thereof
App 20020039320 - Choi, Jong Hyun ; et al. | 2002-04-04 |
Mode selection circuit for semiconductor memory device
App 20020014635 - Lee, Yun-Sang ; et al. | 2002-02-07 |
Fuse circuit and program status detecting method thereof
App 20020008544 - Lim, Kyu-Nam ; et al. | 2002-01-24 |
Decoding circuit for controlling activation of wordlines in a semiconductor memory device
App 20020006073 - Choi, Jong-Hyun ; et al. | 2002-01-17 |
Input/output line structure of a semiconductor memory device
App 20010007540 - Joo, Jae-Hoon ; et al. | 2001-07-12 |
Integrated circuits including function identification circuits having operating modes that identify corresponding functions of the integrated circuits
Grant 6,225,818 - Park , et al. May 1, 2 | 2001-05-01 |
Semiconductor memory device having sequentially disabling activated word lines
Grant 6,215,723 - Kang , et al. April 10, 2 | 2001-04-10 |
Integrated circuit memory devices with improved twisted bit-line structures
Grant 6,140,704 - Kang , et al. October 31, 2 | 2000-10-31 |
Internal power supply circuit for use in a semiconductor device
Grant 6,111,457 - Lim , et al. August 29, 2 | 2000-08-29 |
Integrated circuit memory devices having dummy memory cells therein for inhibiting memory failures
Grant 5,867,434 - Oh , et al. February 2, 1 | 1999-02-02 |
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