KANG; Po-Zeng
Patent Applications and Registrations
Patent applications and USPTO patent grants for KANG; Po-Zeng.The latest application filed is for "semiconductor device with source resistor and manufacturing method thereof".
- KANG; Po-Zeng - Tainan City TW
- KANG; Po-Zeng - Hsinchu TW
- KANG; Po-Zeng - Hsin-Hua TW
- Kang; Po-Zeng - Tainan TW
| Patent | Date |
|---|---|
| Semiconductor Device With Source Resistor And Manufacturing Method Thereof App 20220122913 - KANG; Po-Zeng ; et al. | 2022-04-21 |
| Device For Temperature Monitoring Of A Semiconductor Device App 20220082451 - KANG; Po-Zeng ; et al. | 2022-03-17 |
| Integrated Circuit Device, Method, Layout, And System App 20220037312 - KANG; Po-Zeng ; et al. | 2022-02-03 |
| Semiconductor device with source resistor and manufacturing method thereof Grant 11,217,526 - Kang , et al. January 4, 2 | 2022-01-04 |
| Device and method for temperature monitoring of a semiconductor device Grant 11,215,513 - Kang , et al. January 4, 2 | 2022-01-04 |
| Device And Method For Temperature Monitoring Of A Semiconductor Device App 20210116308 - KANG; Po-Zeng ; et al. | 2021-04-22 |
| Uni-gate cell design Grant 10,872,189 - Chou , et al. December 22, 2 | 2020-12-22 |
| Semiconductor Device With Source Resistor And Manufacturing Method Thereof App 20200279809 - KANG; Po-Zeng ; et al. | 2020-09-03 |
| IC degradation management circuit, system and method Grant 10,514,417 - Kang , et al. Dec | 2019-12-24 |
| Output resistance testing integrated circuit Grant 10,401,407 - Chou , et al. Sep | 2019-09-03 |
| Ic Degradation Management Circuit, System And Method App 20190195943 - KANG; Po-Zeng ; et al. | 2019-06-27 |
| Uni-gate Cell Design App 20190179993 - CHOU; Wen-Shen ; et al. | 2019-06-13 |
| Time to current converter Grant 10,274,536 - Peng , et al. | 2019-04-30 |
| Output Resistance Testing Integrated Circuit App 20190094277 - CHOU; Wen-Shen ; et al. | 2019-03-28 |
| IC degradation management circuit, system and method Grant 10,222,412 - Kang , et al. | 2019-03-05 |
| Output resistance testing method Grant 10,161,976 - Chou , et al. Dec | 2018-12-25 |
| Output Resistance Testing Method App 20180321291 - CHOU; Wen-Shen ; et al. | 2018-11-08 |
| Output resistance testing structure Grant 10,018,660 - Chou , et al. July 10, 2 | 2018-07-10 |
| Time To Current Converter App 20180031627 - Peng; Yung-Chow ; et al. | 2018-02-01 |
| Ic Degradation Management Circuit, System And Method App 20170350938 - KANG; Po-Zeng ; et al. | 2017-12-07 |
| Nearly buffer zone free layout methodology Grant 9,659,919 - Peng , et al. May 23, 2 | 2017-05-23 |
| FinFET with embedded MOS varactor and method of making same Grant 9,343,552 - Chen , et al. May 17, 2 | 2016-05-17 |
| Semiconductor mismatch reduction Grant 9,287,252 - Chen , et al. March 15, 2 | 2016-03-15 |
| Output Resistance Testing Structure And Method Of Using The Same App 20150362539 - CHOU; Wen-Shen ; et al. | 2015-12-17 |
| FinFET with Embedded MOS Varactor and Method of Making Same App 20150270368 - Chen; Wan-Te ; et al. | 2015-09-24 |
| FinFET with embedded MOS varactor and method of making same Grant 9,064,725 - Chen , et al. June 23, 2 | 2015-06-23 |
| LOW gds MEASUREMENT METHODOLOGY FOR MOS App 20150168468 - Peng; Yung-Chow ; et al. | 2015-06-18 |
| Nearly Buffer Zone Free Layout Methodology App 20150108610 - Peng; Yung-Chow ; et al. | 2015-04-23 |
| Nearly buffer zone free layout methodology Grant 8,916,955 - Peng , et al. December 23, 2 | 2014-12-23 |
| Semiconductor device feature density gradient verification Grant 8,856,707 - Peng , et al. October 7, 2 | 2014-10-07 |
| FinFET with Embedded MOS Varactor and Method of Making Same App 20140167172 - Chen; Wan-Te ; et al. | 2014-06-19 |
| Nearly Buffer Zone Free Layout Methodology App 20140103494 - Peng; Yung-Chow ; et al. | 2014-04-17 |
| Semiconductor Device Feature Density Gradient Verification App 20130346935 - PENG; Young-Chow ; et al. | 2013-12-26 |
| Semiconductor device feature density gradient verification Grant 8,549,453 - Peng , et al. October 1, 2 | 2013-10-01 |
| Semiconductor Device Feature Density Gradient Verification App 20130198710 - Peng; Young-Chow ; et al. | 2013-08-01 |
| Semiconductor Mismatch Reduction App 20120235208 - Chen; Chung-Hui ; et al. | 2012-09-20 |
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