| Patent | Date |
|---|
Method for compensating to distance between probe tip and device under test after temperature changes
Grant 11,287,475 - Kanev , et al. March 29, 2 | 2022-03-29 |
Wafer probe station
Grant 11,262,401 - Kanev , et al. March 1, 2 | 2022-03-01 |
Method For Compensating To Distance Between Probe Tip And Device Under Test After Temperature Changes
App 20210382108 - KANEV; Stojan ; et al. | 2021-12-09 |
Wafer Probe Station
App 20210333322 - KANEV; Stojan ; et al. | 2021-10-28 |
Control method of touch display apparatus
Grant 11,144,198 - Chen , et al. October 12, 2 | 2021-10-12 |
Display method of display apparatus
Grant 11,036,390 - Chen , et al. June 15, 2 | 2021-06-15 |
Wafer probe station
Grant 10,895,587 - Hsu , et al. January 19, 2 | 2021-01-19 |
Wafer Probe Station
App 20200209279 - HSU; Yu-Hsun ; et al. | 2020-07-02 |
Control Method Of Touch Display Apparatus
App 20190361603 - Chen; Chien-Hung ; et al. | 2019-11-28 |
Display Method Of Display Apparatus
App 20190361074 - Chen; Chien-Hung ; et al. | 2019-11-28 |
Method for compensating probe misplacement and probe apparatus
Grant 10,312,123 - Chen , et al. | 2019-06-04 |
Wafer cassette
Grant 10,096,505 - Chih , et al. October 9, 2 | 2018-10-09 |
Operating method for inspecting equipment
Grant 10,048,844 - Kanev , et al. August 14, 2 | 2018-08-14 |
Wafer Cassette
App 20170221733 - CHIH; LIN-LIN ; et al. | 2017-08-03 |
Method For Compensating Probe Misplacement And Probe Apparatus
App 20170219650 - Chen; Chen-Ching ; et al. | 2017-08-03 |
Method for verifying a test substrate in a prober under defined thermal conditions
Grant 9,632,108 - Teich , et al. April 25, 2 | 2017-04-25 |
Probe Device
App 20170018068 - Kanev; Stojan ; et al. | 2017-01-19 |
Operating Method For Inspecting Equipment
App 20160210028 - Kanev; Stojan ; et al. | 2016-07-21 |
Method for testing a test substrate under defined thermal conditions and thermally conditionable prober
Grant 9,395,411 - Kiesewetter , et al. July 19, 2 | 2016-07-19 |
Systems and methods for providing wafer access in a wafer processing system
Grant 9,373,533 - Fehrmann , et al. June 21, 2 | 2016-06-21 |
Modular prober and method for operating same
Grant 9,194,885 - Kanev , et al. November 24, 2 | 2015-11-24 |
Method and device for contacting a row of contact areas with probe tips
Grant 9,110,131 - Dietrich , et al. August 18, 2 | 2015-08-18 |
Method for measurement of a power device
Grant 8,922,229 - Hirschfeld , et al. December 30, 2 | 2014-12-30 |
Method For Verifying A Test Substrate In A Prober Under Defined Thermal Conditions
App 20140239991 - Teich; Michael ; et al. | 2014-08-28 |
Systems And Methods For Providing Wafer Access In A Wafer Processing System
App 20140186145 - Fehrmann; Frank ; et al. | 2014-07-03 |
Modular Prober And Method For Operating Same
App 20140145743 - Kanev; Stojan ; et al. | 2014-05-29 |
Method for verifying a test substrate in a prober under defined thermal conditions
Grant 8,692,567 - Teich , et al. April 8, 2 | 2014-04-08 |
Chuck for supporting and retaining a test substrate and a calibration substrate
Grant 8,680,879 - Rumiantsev , et al. March 25, 2 | 2014-03-25 |
Method For Testing A Test Substrate Under Defined Thermal Conditions And Thermally Conditionable Prober
App 20140028337 - Kiesewetter; Joerg ; et al. | 2014-01-30 |
Method for testing a test substrate under defined thermal conditions and thermally conditionable prober
Grant 8,497,693 - Kiesewetter , et al. July 30, 2 | 2013-07-30 |
Probe holder
Grant 8,402,848 - Kiesewetter , et al. March 26, 2 | 2013-03-26 |
Method for testing electronic components of a repetitive pattern under defined thermal conditions
Grant 8,368,413 - Kanev , et al. February 5, 2 | 2013-02-05 |
Method And Device For Contacting A Row Of Contact Areas With Probe Tips
App 20130027070 - Dietrich; Claus ; et al. | 2013-01-31 |
Probe station for on-wafer-measurement under EMI-shielding
Grant 8,344,744 - Schmidt , et al. January 1, 2 | 2013-01-01 |
Probe station for testing semiconductor substrates and comprising EMI shielding
Grant 8,278,951 - Kanev , et al. October 2, 2 | 2012-10-02 |
Chuck with triaxial construction
Grant 8,240,650 - Teich , et al. August 14, 2 | 2012-08-14 |
Method For Measurement Of A Power Device
App 20120146676 - Hirschfeld; Botho ; et al. | 2012-06-14 |
Chuck For Supporting And Retaining A Test Substrate And A Calibration Substrate
App 20110291680 - Rumiantsev; Andrej ; et al. | 2011-12-01 |
Method For Verifying A Test Substrate In A Prober Under Defined Thermal Conditions
App 20110241711 - Teich; Michael ; et al. | 2011-10-06 |
Probe Station For On-wafer-measurement Under Emi-shielding
App 20110227602 - SCHMIDT; Axel ; et al. | 2011-09-22 |
Method For Testing Electronic Components Of A Repetitive Pattern Under Defined Thermal Conditions
App 20110221461 - Kanev; Stojan ; et al. | 2011-09-15 |
Chuck for supporting and retaining a test substrate and a calibration substrate
Grant 7,999,563 - Rumiantsev , et al. August 16, 2 | 2011-08-16 |
Probe holder for a probe for testing semiconductor components
Grant 7,859,278 - Runge , et al. December 28, 2 | 2010-12-28 |
Probe Holder
App 20100294053 - Kiesewetter; Joerg ; et al. | 2010-11-25 |
Method For Testing A Test Substrate Under Defined Thermal Conditions And Thermally Conditionable Prober
App 20100289511 - Kiesewetter; Joerg ; et al. | 2010-11-18 |
Method for calibration of a vectorial network analyzer having more than two ports
Grant 7,768,271 - Rumiantsev , et al. August 3, 2 | 2010-08-03 |
Method for calibration of a vectorial network analyzer
Grant 7,769,555 - Rumiantsev , et al. August 3, 2 | 2010-08-03 |
Prober for testing magnetically sensitive components
Grant 7,741,860 - Giessmann , et al. June 22, 2 | 2010-06-22 |
Method and arrangement for positioning a probe card
Grant 7,733,108 - Kanev , et al. June 8, 2 | 2010-06-08 |
Process For Measuring The Impedance Of Electronic Circuits
App 20100106439 - RUMIANTSEV; Andrej ; et al. | 2010-04-29 |
Method and apparatus for testing electronic components within horizontal and vertical boundary lines of a wafer
Grant 7,659,743 - Kanev , et al. February 9, 2 | 2010-02-09 |
Method For Improved Utilization Of Semiconductor Material
App 20100029022 - FEHRMANN; Frank ; et al. | 2010-02-04 |
Probe support with shield for the examination of test substrates under use of probe supports
Grant 7,652,491 - Kanev , et al. January 26, 2 | 2010-01-26 |
Method For Determination Of Electrical Properties Of Electronic Componets And Method For Calibration Of A Measuring Unit
App 20090314051 - KHUTKO; Victar ; et al. | 2009-12-24 |
Chuck For Supporting And Retaining A Test Substrate And A Calibration Substrate
App 20090315581 - RUMIANTSEV; Andrej ; et al. | 2009-12-24 |
Probe station and method for measurements of semiconductor devices under defined atmosphere
Grant 7,579,854 - Kiesewetter , et al. August 25, 2 | 2009-08-25 |
Probe holder for a probe for testing semiconductor components
Grant 7,579,849 - Kiesewetter , et al. August 25, 2 | 2009-08-25 |
Method for measurement of a device under test
Grant 7,573,283 - Schmidt , et al. August 11, 2 | 2009-08-11 |
Probe receptacle for mounting a probe for testing semiconductor components, probe holder arm and test apparatus
Grant 7,560,942 - Fleischer , et al. July 14, 2 | 2009-07-14 |
Method And Arrangement For Positioning A Probe Card
App 20090085595 - KANEV; Stojan ; et al. | 2009-04-02 |
Prober For Testing Components
App 20090058442 - GIESSMANN; Sebastian ; et al. | 2009-03-05 |
Micromanipulator For Moving A Probe
App 20090049944 - Kiesewetter; Jorg ; et al. | 2009-02-26 |
Method And Arrangement For Positioning A Probe Card
App 20090021275 - Kanev; Stojan ; et al. | 2009-01-22 |
Method For Measurement Of A Device Under Test
App 20080315903 - SCHMIDT; Axel ; et al. | 2008-12-25 |
Process for Measuring the Impedance of Electronic Circuits
App 20080281537 - Rumiantsev; Andrej ; et al. | 2008-11-13 |
Chuck With Triaxial Construction
App 20080224426 - TEICH; Michael ; et al. | 2008-09-18 |
Method For Testing Electronic Components And Test Apparatus For Carrying Out The Method
App 20080180119 - KANEV; Stojan ; et al. | 2008-07-31 |
Probe Station And Method For Measurements Of Semiconductor Devices Under Defined Atmosphere
App 20080143365 - Kiesewetter; Jorg ; et al. | 2008-06-19 |
Probe Holder For A Probe For Testing Semiconductor Components
App 20080122468 - KIESEWETTER; Jorg ; et al. | 2008-05-29 |
Probe Holder For A Probe For Testing Semiconductor Components
App 20080122465 - RUNGE; Dietmar ; et al. | 2008-05-29 |
Method For Calibration Of A Vectorial Network Analyzer Having More Than Two Ports
App 20080122451 - Rumiantsev; Andrej ; et al. | 2008-05-29 |
Method For Calibration Of A Vectorial Network Analyzer
App 20080125999 - Rumiantsev; Andrej ; et al. | 2008-05-29 |
Probe Station To Testing Semiconductor Substrates And Comprising Emi Shielding
App 20080116918 - Kanev; Stojan ; et al. | 2008-05-22 |
Probe Receptacle For Mounting A Probe For Testing Semiconductor Components, Probe Holder Arm And Test Apparatus
App 20080116911 - FLEISCHER; Hans-Jurgen ; et al. | 2008-05-22 |
Probe Support And Process For The Examination Of Test Substrates Under Use Of Probe Supports
App 20080116917 - Kanev; Stojan ; et al. | 2008-05-22 |
Test probe for high-frequency measurement
Grant 7,332,923 - Schott , et al. February 19, 2 | 2008-02-19 |
Test probe for high-frequency measurement
App 20070145987 - Schott; Steffen ; et al. | 2007-06-28 |
Method and prober for contacting a contact area with a contact tip
Grant 7,057,408 - Schneidewind , et al. June 6, 2 | 2006-06-06 |
Method and prober for contacting a contact area with a contact tip
App 20050007135 - Schneidewind, Stefan ; et al. | 2005-01-13 |
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