KANETANI; Yoshihiro

Patent Applications and Registrations

Patent applications and USPTO patent grants for KANETANI; Yoshihiro.The latest application filed is for "optical measurement device and optical measurement method".

Company Profile

1.5.6

KANETANI; Yoshihiro - Fukuchiyama-shi KYOTO
Kanetani; Yoshihiro - Fukuchiyama JP
Kanetani; Yoshihiro - Kyoto JP
Kanetani; Yoshihiro - Kyoto-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Optical Measurement Device And Optical Measurement Method App 20220075062 - TAKASHIMA; Jun ; et al.	2022-03-10
Optical measurement apparatus having a synchronizing function of synchronizing time between a master device and a slave device, and connectable to an industrial network Grant 10,514,294 - Kanetani , et al. Dec	2019-12-24
Displacement measuring device, measuring system and displacement measuring method Grant 10,495,448 - Kondo , et al. De	2019-12-03
Displacement Measuring Device, Measuring System And Displacement Measuring Method App 20190094013 - KONDO; Tomonori ; et al.	2019-03-28
Optical Measurement Apparatus App 20180010962 - KANETANI; Yoshihiro ; et al.	2018-01-11
Measurement apparatus Grant 8,917,900 - Kanetani , et al. December 23, 2	2014-12-23
Measurement Apparatus App 20100232650 - KANETANI; Yoshihiro ; et al.	2010-09-16
Device for and method of inspecting surface condition having different curvatures Grant 7,782,451 - Matsumoto , et al. August 24, 2	2010-08-24
Device for and method of inspecting surface condition App 20070211240 - Matsumoto; Toshihiko ; et al.	2007-09-13
Defect inspection apparatus and defect inspection method App 20070211242 - Okabe; Hiroshi ; et al.	2007-09-13

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