Kaneoka; Noriyuki

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kaneoka; Noriyuki.The latest application filed is for "semiconductor substrate for evaluation and method using same to evaluate defect detection sensitivity of inspection device".

Company Profile

9.18.17

Kaneoka; Noriyuki - Tokyo JP
Kaneoka; Noriyuki - Hitachinaka JP
Kaneoka; Noriyuki - Hachioji JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor substrate for evaluation and method using same to evaluate defect detection sensitivity of inspection device Grant 11,193,895 - Ohira , et al. December 7, 2	2021-12-07
Charged particle beam device Grant 11,107,655 - Ogata , et al. August 31, 2	2021-08-31
Defect inspection method and defect inspection device Grant 11,002,687 - Hasegawa , et al. May 11, 2	2021-05-11
Charged particle beam apparatus, and method of adjusting charged particle beam apparatus Grant 10,923,315 - Hasegawa , et al. February 16, 2	2021-02-16
Semiconductor Substrate for Evaluation and Method Using Same to Evaluate Defect Detection Sensitivity of Inspection Device App 20200340930 - OHIRA; Kentaro ; et al.	2020-10-29
Defect Inspection Method and Defect Inspection Device App 20200292466 - HASEGAWA; Masaki ; et al.	2020-09-17
Charged Particle Beam Device App 20200279714 - OGATA; Tomohiko ; et al.	2020-09-03
Electron Beam Device App 20200152415 - OGATA; Tomohiko ; et al.	2020-05-14
Charged particle beam device and method for adjusting charged particle beam device Grant 10,522,320 - Ogata , et al. Dec	2019-12-31
Charged Particle Beam Apparatus, and Method of Adjusting Charged Particle Beam Apparatus App 20190378685 - HASEGAWA; Masaki ; et al.	2019-12-12
Charged Particle Beam Device and Method for Adjusting Charged Particle Beam Device App 20190108969 - OGATA; Tomohiko ; et al.	2019-04-11
Defect Inspection Device App 20190079025 - HASEGAWA; Masaki ; et al.	2019-03-14
Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample Grant 8,779,400 - Shichi , et al. July 15, 2	2014-07-15
Ion Beam Processing Apparatus App 20130320209 - SHICHI; Hiroyasu ; et al.	2013-12-05
Ion Source, Ion Beam Processing/observation Apparatus, Charged Particle Beam Apparatus, And Method For Observing Cross Section Of Sample App 20130284593 - SHICHI; Hiroyasu ; et al.	2013-10-31
Ion source, ion beam processing/observation apparatus, charged particle beam apparatus, and method for observing cross section of sample Grant 8,481,980 - Shichi , et al. July 9, 2	2013-07-09
Dual beam apparatus with tilting sample stage Grant 8,431,891 - Shichi , et al. April 30, 2	2013-04-30
Charge particle beam system, sample processing method, and semiconductor inspection system Grant 7,777,183 - Kaneoka , et al. August 17, 2	2010-08-17
Ion Beam Processing Apparatus App 20100176297 - Shichi; Hiroyasu ; et al.	2010-07-15
Ion beam processing apparatus Grant 7,700,931 - Shichi , et al. April 20, 2	2010-04-20
Apparatus for ion beam fabrication Grant 7,696,496 - Tomimatsu , et al. April 13, 2	2010-04-13
Manufacturing equipment using ION beam or electron beam Grant 7,592,606 - Ishiguro , et al. September 22, 2	2009-09-22
Ion Source, Ion Beam Processing/observation Apparatus, Charged Particle Beam Apparatus, And Method For Observing Cross Section Of Sample App 20090230299 - Shichi; Hiroyasu ; et al.	2009-09-17
Apparatus for ion beam fabrication App 20080283778 - Tomimatsu; Satoshi ; et al.	2008-11-20
Ion Beam Processing Apparatus App 20080073582 - Shichi; Hiroyasu ; et al.	2008-03-27
Charged Particle Beam System, Sample Processing Method, and Semiconductor Inspection System App 20080029699 - KANEOKA; Noriyuki ; et al.	2008-02-07
Manufacturing Equipment Using ION Beam or Electron Beam App 20080018460 - Ishiguro; Koji ; et al.	2008-01-24
Charged particle beam system, semiconductor inspection system, and method of machining sample App 20070158560 - Kaneoka; Noriyuki ; et al.	2007-07-12
Ion beam apparatus and analysis method App 20060284115 - Kaneoka; Noriyuki ; et al.	2006-12-21
Presearch type document search method and apparatus Grant 6,094,647 - Kato , et al. July 25, 2	2000-07-25
Scanning electron microscope Grant 5,659,174 - Kaneoka , et al. August 19, 1	1997-08-19
Hierarchical presearch type text search method and apparatus and magnetic disk unit used in the apparatus Grant 5,519,857 - Kato , et al. May 21, 1	1996-05-21
Hierarchical presearch type text search method and apparatus and magnetic disk unit used in the apparatus Grant 5,168,533 - Kato , et al. December 1, 1	1992-12-01

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