KANEMITSU; Tomohiko

Patent Applications and Registrations

Patent applications and USPTO patent grants for KANEMITSU; Tomohiko.The latest application filed is for "monitoring system and non-transitory storage medium".

Company Profile

0.5.13

KANEMITSU; Tomohiko - Osaka JP
Kanemitsu; Tomohiko - Toyonaka JP
Kanemitsu; Tomohiko - Toyonaka-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Monitoring System And Non-transitory Storage Medium App 20220234594 - SHIMIZU; Yasuyuki ; et al.	2022-07-28
Distance measuring device and solid-state image sensor used therein Grant 10,281,565 - Takahashi , et al.	2019-05-07
Imaging Device And Solid-state Imaging Element Used In Same App 20180259647 - TAKANO; Haruka ; et al.	2018-09-13
Distance Measuring Device And Solid-state Image Sensor Used Therein App 20170074976 - TAKAHASHI; SYOMA ; et al.	2017-03-16
Semiconductor Testing Apparatus And Testing Method App 20110298487 - KATSUMA; Nobuhiro ; et al.	2011-12-08
Semiconductor testing circuit and semiconductor testing method Grant 7,733,112 - Kishimoto , et al. June 8, 2	2010-06-08
Conductive Contact Pin And Semiconductor Testing Equipment App 20090243640 - Katsuma; Nobuhiro ; et al.	2009-10-01
Semiconductor Testing Circuit And Semiconductor Testing Method App 20090021279 - Kishimoto; Satoshi ; et al.	2009-01-22
Semiconductor testing equipment and semiconductor testing method App 20080094096 - Kishimoto; Satoshi ; et al.	2008-04-24
Handler and method of testing semiconductor device by means of the handler App 20080007285 - Nakase; Masayuki ; et al.	2008-01-10
Assembly for LSI test and method for the test Grant 7,251,761 - Itoh , et al. July 31, 2	2007-07-31
Ancillary equipment for testing semiconductor integrated circuit Grant 7,148,676 - Kamano , et al. December 12, 2	2006-12-12
Test equipment for semiconductor App 20060200714 - Kamano; Satoru ; et al.	2006-09-07
High-speed interface circuit test module, module under high-speed interface circuit test, and high-speed interface circuit test method App 20050258856 - Kishimoto, Satoshi ; et al.	2005-11-24
Ancillary equipment for testing semiconductor integrated circuit App 20040257066 - Kamano, Satoru ; et al.	2004-12-23
Assembly for LSI test and method for the test App 20040160237 - Itoh, Wataru ; et al.	2004-08-19
Lsi inspection method and apparatus, and ls1 tester App 20040133834 - Kanemitsu, Tomohiko ; et al.	2004-07-08
Decrypting device Grant 6,393,564 - Kanemitsu , et al. May 21, 2	2002-05-21

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