Kaneda; Yoshiharu

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kaneda; Yoshiharu.The latest application filed is for "semiconductor device and method of manufacturing the same".

Company Profile

1.18.16

Kaneda; Yoshiharu - Kawasaki JP
Kaneda; Yoshiharu - Tokyo JP
Kaneda; Yoshiharu - Kawasaki-shi JP
Kaneda; Yoshiharu - Sakai JP
Kaneda; Yoshiharu - Ohtsu JP
Kaneda; Yoshiharu - Shiga JP
KANEDA; Yoshiharu - Ohtsu-Shi JP
Kaneda; Yoshiharu - Sakai-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Manufacturing method of semiconductor device and semiconductor device Grant 9,385,071 - Kaneda , et al. July 5, 2	2016-07-05
Semiconductor device and method of manufacturing the same Grant 9,349,675 - Kaneda May 24, 2	2016-05-24
Device for detecting insulation degradation Grant 9,335,380 - Watanabe , et al. May 10, 2	2016-05-10
Semiconductor Device And Method Of Manufacturing The Same App 20160086875 - KANEDA; YOSHIHARU	2016-03-24
Semiconductor device and method of manufacturing the same Grant 9,240,368 - Kaneda January 19, 2	2016-01-19
Semiconductor Device And Method Of Manufacturing The Same App 20150357264 - KANEDA; Yoshiharu	2015-12-10
Semiconductor device and method of manufacturing the same Grant 9,147,647 - Kaneda September 29, 2	2015-09-29
Manufacturing Method Of Semiconductor Device And Semiconductor Device App 20150262923 - Kaneda; Yoshiharu ; et al.	2015-09-17
Manufacturing method of semiconductor device and semiconductor device Grant 9,076,777 - Kaneda , et al. July 7, 2	2015-07-07
Insulation deterioration diagnosis apparatus Grant 9,030,210 - Watanabe , et al. May 12, 2	2015-05-12
Manufacturing Method Of Semiconductor Device And Semiconductor Device App 20150008569 - Kaneda; Yoshiharu ; et al.	2015-01-08
Manufacturing method of semiconductor device and semiconductor device Grant 8,872,316 - Kaneda , et al. October 28, 2	2014-10-28
Semiconductor Device And Method Of Manufacturing The Same App 20140124912 - Kaneda; Yoshiharu	2014-05-08
Manufacturing Method Of Semiconductor Device And Semiconductor Device App 20140070389 - Kaneda; Yoshiharu ; et al.	2014-03-13
Insulation Deterioration Diagnosis Apparatus App 20120319699 - Watanabe; Yoshimasa ; et al.	2012-12-20
Device For Detecting Insulation Degradation App 20110320146 - Watanabe; Yoshimasa ; et al.	2011-12-29
Semiconductor device comprising an excess resin portion, manufacturing method thereof, and apparatus for manufacturing semiconductor device comprising a excess resin portion Grant 8,048,718 - Kiyohara , et al. November 1, 2	2011-11-01
Method of manufacturing semiconductor device having plural dicing steps Grant 7,985,624 - Kaneda July 26, 2	2011-07-26
Body to be plated, method of determining plated film thickness, and method of manufacturing semiconductor device Grant 7,875,468 - Kaneda January 25, 2	2011-01-25
Lead frame, semiconductor device, and method of manufacturing semiconductor device Grant 7,858,447 - Kaneda December 28, 2	2010-12-28
Body to be plated, method of determining plated film thickness, and method of manufacturing semiconductor device App 20090309200 - Kaneda; Yoshiharu	2009-12-17
Semiconductor device and method of manufacturing same Grant 7,582,974 - Kaneda , et al. September 1, 2	2009-09-01
Lead Frame, Semiconductor Device, And Method Of Manufacturing Semiconductor Device App 20090057857 - KANEDA; Yoshiharu	2009-03-05
Method Of Manufacturing Semiconductor Device App 20090057851 - KANEDA; Yoshiharu	2009-03-05
Semiconductor Device And Method Of Manufacturing Same App 20080246166 - Kaneda; Yoshiharu ; et al.	2008-10-09
Semiconductor device comprising an excess resin portion, manufacturing method thereof, and apparatus for manufacturing semiconductor device comprising a excess resin portion App 20080029857 - Kiyohara; Toshinori ; et al.	2008-02-07
Partial discharge monitoring apparatus and partial discharge remote monitoring system for rotating electric machines Grant 7,165,014 - Kaneda , et al. January 16, 2	2007-01-16
Partial discharge monitoring apparatus and partial discharge remote monitoring system for rotating electric machines App 20050012507 - Kaneda, Yoshiharu ; et al.	2005-01-20
Lead frame for fabricating surface mount type semiconductor devices with high reliability Grant 6,677,666 - Kaneda , et al. January 13, 2	2004-01-13
Lead frame for fabricating surface mount type semiconductor devices with high reliability App 20030080396 - Kaneda, Yoshiharu ; et al.	2003-05-01
Lead frame for fabricating surface mount type semiconductor devices with high reliability Grant 6,507,093 - Kaneda , et al. January 14, 2	2003-01-14
Lead frame for fabricating surface mount type semiconductor devices with high reliability App 20010033008 - Kaneda, Yoshiharu ; et al.	2001-10-25

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