Kane; Terence L.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kane; Terence L..The latest application filed is for "time temperature monitoring system".

Company Profile

2.28.25

Kane; Terence L. - Wappingers Falls NY
Kane; Terence L. - Wappinger Falls NY
Kane; Terence L. - Hopewell Junction NY US
Kane; Terence L. - Port Chester NY
Kane; Terence L - Wappingers Falls NY

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Time temperature monitoring system Grant 10,504,807 - Davis , et al. Dec	2019-12-10
Time temperature monitoring system Grant 10,217,682 - Davis , et al. Feb	2019-02-26
Time Temperature Monitoring System App 20180350702 - Davis; Taryn J. ; et al.	2018-12-06
Time Temperature Monitoring System App 20180226308 - Davis; Taryn J. ; et al.	2018-08-09
Time temperature monitoring system Grant 10,032,683 - Davis , et al. July 24, 2	2018-07-24
Time Temperature Monitoring System App 20160372391 - Davis; Taryn J. ; et al.	2016-12-22
Apparatus and method for atomic force probing/SEM nano-probing/scanning probe microscopy and collimated ion milling Grant 9,470,712 - Kane , et al. October 18, 2	2016-10-18
Device Structure With Negative Resistance Characteristics App 20160225919 - Chen; Fen ; et al.	2016-08-04
Atom probe tomography sample preparation for three-dimensional (3D) semiconductor devices Grant 9,279,849 - Kane , et al. March 8, 2	2016-03-08
Low Energy Collimated Ion Milling Of Semiconductor Structures App 20160035633 - KANE; TERENCE L.	2016-02-04
Atom Probe Tomography Sample Preparation For Three-dimensional (3d) Semiconductor Devices App 20150355266 - Kane; Terence L. ; et al.	2015-12-10
Atom probe tomography sample preparation for three-dimensional (3D) semiconductor devices Grant 9,201,112 - Kane , et al. December 1, 2	2015-12-01
High frequency capacitance-voltage nanoprobing characterization Grant 9,170,273 - Kane , et al. October 27, 2	2015-10-27
Atom Probe Tomography Sample Preparation For Three-dimensional (3d) Semiconductor Devices App 20150160286 - Kane; Terence L. ; et al.	2015-06-11
High Frequency Capacitance-voltage Nanoprobing Characterization App 20150160261 - Kane; Terence L. ; et al.	2015-06-11
Selective Passivation Of Vias App 20150076695 - Cheng; Tien-Jen ; et al.	2015-03-19
Low Energy Collimated Ion Milling Of Semiconductor Structures App 20140295584 - Kane; Terence L.	2014-10-02
Voltage sensitive resistor (VSR) read only memory Grant 8,536,555 - Kane , et al. September 17, 2	2013-09-17
Voltage Sensitive Resistor (vsr) Read Only Memory App 20130189824 - Kane; Terence L. ; et al.	2013-07-25
Method of fabricating a device using low temperature anneal processes, a device and design structure Grant 8,490,029 - Domenicucci , et al. July 16, 2	2013-07-16
Voltage sensitive resistor (VSR) read only memory Grant 8,466,443 - Kane , et al. June 18, 2	2013-06-18
Antifuse structure for in line circuit modification Grant 8,367,484 - Kane , et al. February 5, 2	2013-02-05
Antifuse structure for in line circuit modification Grant 8,367,483 - Kane , et al. February 5, 2	2013-02-05
Antifuse structure for in line circuit modification Grant 8,368,070 - Kane , et al. February 5, 2	2013-02-05
Antifuse structure for in line circuit modification Grant 8,368,069 - Kane , et al. February 5, 2	2013-02-05
Method of fabricating a device using low temperature anneal processes, a device and design structure Grant 8,236,709 - Domenicucci , et al. August 7, 2	2012-08-07
Method Of Fabricating A Device Using Low Temperature Anneal Processes, A Device And Design Structure App 20120180010 - DOMENICUCCI; Anthony G. ; et al.	2012-07-12
Antifuse Structure For In Line Circuit Modification App 20120129340 - Kane; Terence L. ; et al.	2012-05-24
Antifuse Structure For In Line Circuit Modification App 20120126366 - Kane; Terence L. ; et al.	2012-05-24
Antifuse Structure For In Line Circuit Modification App 20120126367 - Kane; Terence L. ; et al.	2012-05-24
Antifuse Structure For In Line Circuit Modification App 20120122280 - Kane; Terence L. ; et al.	2012-05-17
Antifuse structure for in line circuit modification Grant 8,125,048 - Kane , et al. February 28, 2	2012-02-28
Voltage Sensitive Resistor (vsr) Read Only Memory App 20120001140 - Kane; Terence L. ; et al.	2012-01-05
Backside unlayering of MOSFET devices for electrical and physical characterization Grant 7,993,504 - Kane , et al. August 9, 2	2011-08-09
Antifuse Structure For In Line Circuit Modification App 20110079874 - Kane; Terence L. ; et al.	2011-04-07
Method of Fabricating a Device Using Low Temperature Anneal Processes, a Device and Design Structure App 20110027956 - DOMENICUCCI; Anthony G. ; et al.	2011-02-03
Programmable precision resistor and method of programming the same Grant 7,881,093 - Domenicucci , et al. February 1, 2	2011-02-01
Programmable Precision Resistor And Method Of Programming The Same App 20100025819 - Domenicucci; Anthony G. ; et al.	2010-02-04
Backside Unlayering Of Mosfet Devices For Electrical And Physical Characterization App 20080128086 - Kane; Terence L. ; et al.	2008-06-05
Backside unlayering of MOSFET devices for electrical and physical characterization Grant 7,371,689 - Kane , et al. May 13, 2	2008-05-13
Apparatus and method for selected site backside unlayering of si, GaAs, Ga.sub.xAl.sub.yAs.sub.zof SOI technologies for scanning probe microscopy and atomic force probing characterization Grant 7,205,237 - Deering , et al. April 17, 2	2007-04-17
Apparatus And Method For Selected Site Backside Unlayering Of Silicon, Gaas, Gaxalyasz Of Soi Technologies For Scanning Probe Microscopy And Atomic Force Probing Characterization App 20070010097 - Deering; Andrew ; et al.	2007-01-11
Method of processing backside unlayering of MOSFET devices for electrical and physical characterization including a collimated ion plasma Grant 7,015,146 - Kane , et al. March 21, 2	2006-03-21
Backside unlayering of MOSFET devices for electrical and physical characterization App 20060030160 - Kane; Terence L. ; et al.	2006-02-09
Backside unlayering of MOSFET devices for electrical and physical characterization App 20050148157 - Kane, Terence L. ; et al.	2005-07-07
Structure for detecting charging effects in device processing Grant 6,703,641 - Kane , et al. March 9, 2	2004-03-09
Structure for detecting charging effects in device processing App 20030094609 - Kane, Terence L. ; et al.	2003-05-22

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