Kamon; Kazuya

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kamon; Kazuya.The latest application filed is for "semiconductor integrated circuit and pattern layouting method for the same".

Company Profile

0.25.13

Kamon; Kazuya - Kanagawa N/A JP
Kamon; Kazuya - Tokyo JP
Kamon; Kazuya - Itami JP
Kamon; Kazuya - Hyogo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor device comprising an antiferroelectric gate insulating film Grant 9,331,212 - Kamon May 3, 2	2016-05-03
Semiconductor integrated circuit and pattern layouting method for the same Grant 8,839,176 - Kamon September 16, 2	2014-09-16
Semiconductor Integrated Circuit And Pattern Layouting Method For The Same App 20140035108 - KAMON; Kazuya	2014-02-06
Semiconductor integrated circuit and pattern layouting method for the same Grant 8,543,956 - Kamon September 24, 2	2013-09-24
Semiconductor Device App 20120286342 - KAMON; Kazuya	2012-11-15
Semiconductor Integrated Circuit And Pattern Layouting Method For The Same App 20110248387 - Kamon; Kazuya	2011-10-13
Simulator for a chemical mechanical polishing Grant 7,363,207 - Kamon April 22, 2	2008-04-22
Layout data saving method, layout data converting device and graphic verifying device Grant 7,213,217 - Kamon May 1, 2	2007-05-01
Projection aligner, aberration estimating mask pattern, aberration quantity estimating method, aberration eliminating filter and semiconductor manufacturing method Grant 7,170,682 - Kamon January 30, 2	2007-01-30
Mask data processor Grant 7,020,866 - Kamon March 28, 2	2006-03-28
Projection aligner, aberration estimating mask pattern, aberration quantity estimating method, aberration eliminating filter and semiconductor manufacturing method App 20060023309 - Kamon; Kazuya	2006-02-02
Layout data saving method, layout data converting device and graphic verifying device App 20050268270 - Kamon, Kazuya	2005-12-01
Projection aligner, aberration estimating mask pattern, aberration quantity estimating method, aberration eliminating filter and semiconductor manufacturing method Grant 6,970,291 - Kamon November 29, 2	2005-11-29
Layout data saving method, layout data converting device and graphic verifying device Grant 6,951,004 - Kamon September 27, 2	2005-09-27
Mask Data Correction Apparatus, Fourier Transformation Apparatus, Up Sampling Apparatus, Down Sampling Apparatus, Method Of Manufacturing Transfer Mask, And Method Of Manufacturing Device Having Pattern Structure Grant 6,831,997 - Kamon December 14, 2	2004-12-14
Simulator for a chemical mechanical polishing App 20040167755 - Kamon, Kazuya	2004-08-26
Photomask, fabrication method of photomask, and fabrication method of semiconductor integrated circuit Grant 6,737,198 - Kamon May 18, 2	2004-05-18
Mask data processor App 20040060033 - Kamon, Kazuya	2004-03-25
Layout data saving method, layout data converting device and graphic verifying device App 20040031006 - Kamon, Kazuya	2004-02-12
Projection aligner, aberration estimating mask pattern,aberration quantity estimating method, aberration eliminating filter and semiconductor manufacturing method App 20030123038 - Kamon, Kazuya	2003-07-03
Mask data correction apparatus, fourier transformation apparatus, up sampling apparatus, down sampling apparatus, method of manufacturing transfer mask, and method of manufacturing device having pattern structure App 20020018599 - Kamon, Kazuya	2002-02-14
Method Of Forming A Pattern Using Proximity-effect-correction App 20010053964 - KAMON, KAZUYA	2001-12-20
Photomask, Fabrication Method Of Photomask, And Fabrication Method Of Semiconductor Integrated Circuit App 20010049062 - KAMON, KAZUYA	2001-12-06
Projection aligner, aberration estimating mask pattern, aberration quantity estimating method, aberration eliminating filter and semiconductor manufacturing method App 20010010886 - Kamon, Kazuya	2001-08-02
Apparatus and method for correcting light proximity effects by predicting mask performance Grant 5,815,685 - Kamon September 29, 1	1998-09-29
Mask inspecting method and mask detector Grant 5,481,624 - Kamon January 2, 1	1996-01-02
Projection exposure apparatus and polarizer Grant 5,436,761 - Kamon July 25, 1	1995-07-25
Projection exposure apparatus Grant 5,365,371 - Kamon November 15, 1	1994-11-15
Projection exposure apparatus Grant 5,311,249 - Kamon , et al. May 10, 1	1994-05-10
Projection exposure apparatus Grant 5,300,972 - Kamon April 5, 1	1994-04-05
Pattern forming method Grant 5,294,505 - Kamon March 15, 1	1994-03-15
Projection exposure apparatus Grant 5,287,142 - Kamon February 15, 1	1994-02-15
Method of and an apparatus for detecting alignment marks Grant 5,285,258 - Kamon February 8, 1	1994-02-08
Projection exposure apparatus Grant 5,264,898 - Kamon , et al. November 23, 1	1993-11-23
Fly-eye lens device and lighting system including same Grant 5,251,067 - Kamon October 5, 1	1993-10-05
Projection aligner Grant 5,144,362 - Kamon , et al. September 1, 1	1992-09-01

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