Kamiyama; Eiji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kamiyama; Eiji.The latest application filed is for "image data processing method and image creating method".

Company Profile

0.12.12

Kamiyama; Eiji - Tokyo JP
Kamiyama; Eiji - Noda JP
Kamiyama; Eiji - Chiba-ken JP
Kamiyama; Eiji - Noda-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Image data processing method and image creating method Grant 8,761,488 - Kamiyama , et al. June 24, 2	2014-06-24
Method for judging whether semiconductor wafer is non-defective wafer by using laser scattering method Grant 8,379,196 - Kamiyama , et al. February 19, 2	2013-02-19
System and method of two-stepped laser scattering defect inspection Grant 8,339,593 - Kamiyama , et al. December 25, 2	2012-12-25
Wafer surface measuring apparatus Grant 8,284,395 - Kamiyama , et al. October 9, 2	2012-10-09
Image Data Processing Method And Image Creating Method App 20110194753 - Kamiyama; Eiji ; et al.	2011-08-11
Method of manufacturing a SOI structure having a SiGe layer interposed between the silicon and the insulator Grant 7,947,572 - Park , et al. May 24, 2	2011-05-24
Method For Judging Whether Semiconductor Wafer Is Non-defective Wafer By Using Laser Scattering Method App 20100309461 - Kamiyama; Eiji ; et al.	2010-12-09
Method for manufacturing SOI wafer Grant 7,838,387 - Kamiyama , et al. November 23, 2	2010-11-23
Method Of Manufacturing A Soi Structure Having A Sige Layer Interposed Between The Silicon And The Insulator App 20100221877 - Park; Jeagun ; et al.	2010-09-02
Wafer Surface Measuring Apparatus App 20100201976 - KAMIYAMA; Eiji ; et al.	2010-08-12
SOI structure having a SiGe layer interposed between the silicon and the insulator Grant 7,741,193 - Park , et al. June 22, 2	2010-06-22
Laser Scattering Defect Inspection System And Laser Scattering Defect Inspection Method App 20100085561 - KAMIYAMA; Eiji ; et al.	2010-04-08
SOI substrate, silicon substrate therefor and it's manufacturing method Grant 7,655,315 - Kamiyama , et al. February 2, 2	2010-02-02
Semiconductor Wafer Surface Inspection Apparatus App 20090147250 - TANAKA; Terunori ; et al.	2009-06-11
Bonded semiconductor substrate manufacturing method thereof Grant 7,491,342 - Kamiyama , et al. February 17, 2	2009-02-17
Silicon Wafer For Manufacturing Soi Wafer, Soi Wafer, And Method For Manufacturing Soi Wafer App 20080213989 - Kamiyama; Eiji ; et al.	2008-09-04
SOI substrate, silicon substrate therefor and it's manufacturing method App 20070228522 - Kamiyama; Eiji	2007-10-04
SOI structure having a SiGe layer interposed between the silicon and the insulator Grant 7,180,138 - Park , et al. February 20, 2	2007-02-20
Laminated semiconductor substrate process for producing the same App 20060118935 - Kamiyama; Eiji ; et al.	2006-06-08
SOI structure having a sige layer interposed between the silicon and the insulator App 20060063356 - Park; Jeagun ; et al.	2006-03-23
SOI structure having a sige layer interposed between the silicon and the insulator App 20050242396 - Park, Jeagun ; et al.	2005-11-03
SOI structure having a SiGe Layer interposed between the silicon and the insulator App 20030230778 - Park, Jeagun ; et al.	2003-12-18

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.