Kamieniecki; Emil

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kamieniecki; Emil.The latest application filed is for "inductive radiation detector".

Company Profile

4.28.16

Kamieniecki; Emil - Bedford MA US
Kamieniecki; Emil - Lexington MA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Electrostatic hole trapping radiation detectors Grant 10,429,522 - Kamieniecki O	2019-10-01
Inductive radiation detector Grant 10,338,237 - Kamieniecki	2019-07-02
Inductive Radiation Detector App 20180348385 - KAMIENIECKI; Emil	2018-12-06
Inductive radiation detector Grant 10,018,738 - Kamieniecki July 10, 2	2018-07-10
Inductive Radiation Detector App 20170269239 - Kamieniecki; Emil	2017-09-21
Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductor Grant 9,110,127 - Kamieniecki August 18, 2	2015-08-18
Electrical characterization of semiconductor materials Grant 8,896,338 - Kamieniecki November 25, 2	2014-11-25
Electrical Characterization Of Semiconductor Materials App 20130257472 - Kamieniecki; Emil	2013-10-03
Apparatus And Method For Electrical Characterization By Selecting And Adjusting The Light For A Target Depth Of A Semiconductor App 20120276665 - Kamieniecki; Emil	2012-11-01
Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductor Grant 8,232,817 - Kamieniecki July 31, 2	2012-07-31
System and method for characterizing the electrical properties of a semiconductor sample App 20110301892 - Kamieniecki; Emil	2011-12-08
Electrical characterization of semiconductor materials Grant 7,898,280 - Kamieniecki March 1, 2	2011-03-01
Apparatus and Method for Electrical Characterization by Selecting and Adjusting the Light for a Target Depth of a Semiconductor App 20100156445 - Kamieniecki; Emil	2010-06-24
Electrical Characterization of Semiconductor Materials App 20100060307 - Kamieniecki; Emil	2010-03-11
Apparatus and method for electrical characterization by selecting and adjusting the light for a target depth of a semiconductor Grant 7,663,385 - Kamieniecki February 16, 2	2010-02-16
Apparatus and Method for Electrical Characterization of Semiconductors App 20070273400 - Kamieniecki; Emil	2007-11-29
Real-time in-line testing of semiconductor wafers Grant 6,967,490 - Kamieniecki , et al. November 22, 2	2005-11-22
Real-time in-line testing of semiconductor wafers Grant 6,924,657 - Kamieniecki , et al. August 2, 2	2005-08-02
Real-time in-line testing of semiconductor wafers Grant 6,909,302 - Kamieniecki , et al. June 21, 2	2005-06-21
Apparatus and method for rapid photo-thermal surfaces treatment Grant 6,803,588 - Kamieniecki October 12, 2	2004-10-12
Real-time in-line testing of semiconductor wafers App 20040046585 - Kamieniecki, Emil ; et al.	2004-03-11
Method and apparatus for simulating a surface photo-voltage in a substrate Grant 6,388,455 - Kamieniecki , et al. May 14, 2	2002-05-14
Apparatus and method for handling and testing of wafers App 20020036774 - Kamieniecki, Emil ; et al.	2002-03-28
Apparatus and method for rapid photo-thermal surface treatment App 20020017311 - Kamieniecki, Emil	2002-02-14
Real-time in-line testing of semiconductor wafers App 20020006740 - Kamieniecki, Emil ; et al.	2002-01-17
Apparatus and method for rapid photo-thermal surface treatment Grant 6,325,078 - Kamieniecki December 4, 2	2001-12-04
Method for real-time in-line testing of semiconductor wafers Grant 6,315,574 - Kamieniecki , et al. November 13, 2	2001-11-13
Apparatus And Method For Rapid Photo-thermal Surface Treatment App 20010001391 - KAMIENIECKI, EMIL	2001-05-24
Real-time in-line testing of semiconductor wafers Grant 5,661,408 - Kamieniecki , et al. August 26, 1	1997-08-26
Apparatus for making surface photovoltage measurements of a semiconductor Grant 5,091,691 - Kamieniecki , et al. * February 25, 1	1992-02-25
Apparatus and method for making surface photovoltage measurements of a semiconductor Grant 5,087,876 - Reiss , et al. February 11, 1	1992-02-11
Apparatus for making surface photovoltage measurements of a semiconductor Grant 4,891,584 - Kamieniecki , et al. January 2, 1	1990-01-02
Nondestructive readout of a latent electrostatic image formed on an insulating material Grant 4,873,436 - Kamieniecki , et al. * October 10, 1	1989-10-10
Noninvasive method and apparatus for characterization of semiconductors Grant 4,827,212 - Kamieniecki May 2, 1	1989-05-02
Nondestructive readout of a latent electrostatic image formed on an insulating material Grant 4,663,526 - Kamieniecki May 5, 1	1987-05-05
Method of measuring photo-induced voltage at the surface of semiconductor materials Grant 4,544,887 - Kamieniecki October 1, 1	1985-10-01

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