Kallscheuer; Jochen

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kallscheuer; Jochen.The latest application filed is for "semiconductor device for electrical contacting semiconductor devices".

Company Profile

0.6.9

Kallscheuer; Jochen - Munich DE
Kallscheuer; Jochen - Munchen DE
Kallscheuer; Jochen - Heuden DE
Kallscheuer; Jochen - Muenchen DE

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Method for testing semiconductor chips by means of bit masks Grant 7,461,308 - Kallscheuer , et al. December 2, 2	2008-12-02
Method for testing semiconductor chips using register sets Grant 7,454,676 - Hartmann , et al. November 18, 2	2008-11-18
Semiconductor Device For Electrical Contacting Semiconductor Devices App 20080231303 - Kallscheuer; Jochen ; et al.	2008-09-25
Integrated semiconductor memory Grant 7,283,419 - Funfrock , et al. October 16, 2	2007-10-16
Method and arrangement for repairing memory chips using microlithography methods App 20070066367 - Kallscheuer; Jochen ; et al.	2007-03-22
Integrated semiconductor memory App 20060277379 - Funfrock; Fabien ; et al.	2006-12-07
Method for testing semiconductor chips using register sets App 20060156110 - Hartmann; Udo ; et al.	2006-07-13
Method for testing semiconductor chips using check bits App 20060156108 - Stracke; Patric ; et al.	2006-07-13
Method for testing semiconductor chips by means of bit masks App 20060156107 - Kallscheuer; Jochen ; et al.	2006-07-13
Semi-conductor component testing system with a reduced number of test channels Grant 6,977,516 - Ferreira , et al. December 20, 2	2005-12-20
Semi-conductor component testing system with a reduced number of test channels App 20050099201 - Ferreira, Jesus ; et al.	2005-05-12
Method for testing semiconductor chips Grant 6,858,447 - Hartmann , et al. February 22, 2	2005-02-22
Method for on-chip testing of memory cells of an integrated memory circuit Grant 6,728,147 - Beer , et al. April 27, 2	2004-04-27
Method for testing semiconductor chips App 20030059962 - Hartmann, Udo ; et al.	2003-03-27
Method for on-chip testing of memory cells of an integrated memory circuit App 20030021169 - Beer, Peter ; et al.	2003-01-30

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