KAKUMA; Hiroaki

Patent Applications and Registrations

Patent applications and USPTO patent grants for KAKUMA; Hiroaki.The latest application filed is for "substrate treatment device".

Company Profile

9.12.17

KAKUMA; Hiroaki - Kyoto JP
KAKUMA; Hiroaki - Kyoto-shi Kyoto

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Substrate Treatment Device App 20220216117 - NAOHARA; Hideji ; et al.	2022-07-07
Substrate treatment method and substrate treatment device Grant 11,322,415 - Naohara , et al. May 3, 2	2022-05-03
Substrate Processing Apparatus And Substrate Processing Method App 20220005736 - NAOHARA; Hideji ; et al.	2022-01-06
Substrate Processing Apparatus And Substrate Processing Method App 20210398260 - NAOHARA; Hideji ; et al.	2021-12-23
Fume determination method, substrate processing method, and substrate processing equipment Grant 11,011,398 - Endo , et al. May 18, 2	2021-05-18
Determination method and substrate processing equipment Grant 10,985,038 - Naohara , et al. April 20, 2	2021-04-20
Substrate processing apparatus and substrate processing method for discharge of processing liquid from nozzle Grant 10,665,481 - Sano , et al.	2020-05-26
Substrate treatment device and substrate treatment method Grant 10,651,064 - Naohara , et al.	2020-05-12
Substrate Treatment Method And Substrate Treatment Device App 20200111715 - NAOHARA; Hideji ; et al.	2020-04-09
Displacement detecting apparatus, displacement detecting method and substrate processing apparatus Grant 10,580,163 - Kakuma , et al.	2020-03-03
Displacement detecting apparatus, displacement detecting method and substrate processing apparatus Grant 10,402,997 - Kitamura , et al. Sep	2019-09-03
Detecting Method And Detecting Device App 20190259172 - KAKUMA; Hiroaki ; et al.	2019-08-22
Determination Method And Substrate Processing Equipment App 20190172732 - NAOHARA; Hideji ; et al.	2019-06-06
Fume Determination Method, Substrate Processing Method, And Substrate Processing Equipment App 20190172737 - ENDO; Toru ; et al.	2019-06-06
Substrate Treatment Device And Substrate Treatment Method App 20190096720 - NAOHARA; Hideji ; et al.	2019-03-28
Substrate Processing Apparatus And Substrate Processing Method For Discharge Of Processing Liquid From Nozzle App 20180323085 - SANO; Hiroshi ; et al.	2018-11-08
Position detection apparatus, substrate processing apparatus, position detection method and substrate processing method Grant 9,975,247 - Okita , et al. May 22, 2	2018-05-22
Flow-down Determination Method, Flow-down Determination Apparatus And Discharge Apparatus App 20180069992 - KAKUMA; Hiroaki	2018-03-08
Displacement Detecting Apparatus, Displacement Detecting Method And Substrate Processing Apparatus App 20180053319 - KAKUMA; Hiroaki ; et al.	2018-02-22
Flow-down determination method, flow-down determination apparatus and discharge apparatus Grant 9,838,575 - Kakuma December 5, 2	2017-12-05
Displacement Detecting Apparatus, Displacement Detecting Method And Substrate Processing Apparatus App 20170116721 - KITAMURA; Kazuhiro ; et al.	2017-04-27
Flow-down Determination Method, Flow-down Determination Apparatus And Discharge Apparatus App 20170028426 - KAKUMA; Hiroaki	2017-02-02
Position Detection Apparatus, Substrate Processing Apparatus, Position Detection Method And Substrate Processing Method App 20160091892 - OKITA; Yuji ; et al.	2016-03-31
Substrate Processing Apparatus And Substrate Processing Method For Discharge Of Processing Liquid From Nozzle App 20150262848 - SANO; Hiroshi ; et al.	2015-09-17
Displacement Detection Apparatus, Substrate Processing Apparatus, Displacement Detection Method And Substrate Processing Method App 20150235368 - KAKUMA; Hiroaki	2015-08-20
Apparatus and method for detecting defects of pattern on object App 20050271261 - Onishi, Hiroyuki ; et al.	2005-12-08
Measurement position determination on a semiconductor wafer Grant 6,363,168 - Kakuma March 26, 2	2002-03-26
Method of and apparatus for inspecting conductive pattern on printed board Grant 5,144,681 - Kitakado , et al. September 1, 1	1992-09-01
Method of and apparatus for inspecting conductive pattern on printed board Grant 5,027,417 - Kitakado , et al. June 25, 1	1991-06-25

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