Kakibayashi; Hiroshi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kakibayashi; Hiroshi.The latest application filed is for "transmission electron microscope system and method of inspecting a specimen using the same".

Company Profile

0.15.5

Kakibayashi; Hiroshi - Nagareyama JP
Kakibayashi, Hiroshi - Nagareyama-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Micro-spectroscopic measuring device and micro-chemical system Grant 7,145,146 - Ogawa , et al. December 5, 2	2006-12-05
Transmission electron microscope system and method of inspecting a specimen using the same Grant 7,034,299 - Nakagaki , et al. April 25, 2	2006-04-25
Bio electron microscope and observation method of specimen Grant 6,875,984 - Kakibayashi , et al. April 5, 2	2005-04-05
Transmission electron microscope system and method of inspecting a specimen using the same App 20050051725 - Nakagaki, Ryo ; et al.	2005-03-10
Micro-spectroscopic measuring device and micro-chemical system App 20050017178 - Ogawa, Taro ; et al.	2005-01-27
Method and apparatus for scanning transmission electron microscopy Grant 6,822,233 - Nakamura , et al. November 23, 2	2004-11-23
Microreactor, its production method, and sample screening device App 20040228774 - Ogawa, Taro ; et al.	2004-11-18
Bio electron microscope and observation method of specimen App 20040135083 - Kakibayashi, Hiroshi ; et al.	2004-07-15
Method and apparatus for scanning transmission electron microscopy App 20030127595 - Nakamura, Kuniyasu ; et al.	2003-07-10
Transmission electron microscope apparatus with equipment for inspecting defects in specimen and method of inspecting defects in specimen using transmission electron microscope Grant 6,548,811 - Nakamura , et al. April 15, 2	2003-04-15
Method and apparatus for scanning transmission electron microscopy Grant 6,531,697 - Nakamura , et al. March 11, 2	2003-03-11
Electron microscope Grant 6,051,834 - Kakibayashi , et al. April 18, 2	2000-04-18
Scintillator device and image pickup apparatus using the same Grant 5,932,880 - Koguchi , et al. August 3, 1	1999-08-03
Electron microscope Grant 5,866,905 - Kakibayashi , et al. February 2, 1	1999-02-02
Electron microscope Grant 5,650,621 - Tsuneta , et al. July 22, 1	1997-07-22
Electron microscope Grant 5,552,602 - Kakibayashi , et al. September 3, 1	1996-09-03
Electron microscope for specimen composition and strain analysis and observation method thereof Grant 5,453,617 - Tsuneta , et al. September 26, 1	1995-09-26
Semiconductor device using whiskers Grant 5,362,972 - Yazawa , et al. November 8, 1	1994-11-08
Semiconductor optical device with nanowhiskers Grant 5,332,910 - Haraguchi , et al. July 26, 1	1994-07-26
Instrument and method for 3-dimensional atomic arrangement observation Grant 5,278,408 - Kakibayashi , et al. January 11, 1	1994-01-11

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