Kajihara; Seiji

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kajihara; Seiji.The latest application filed is for "fault detection system, generation circuit, and program".

Company Profile

0.23.19

Kajihara; Seiji - Fukuoka JP
Kajihara; Seiji - Iizuka N/A JP
Kajihara; Seiji - Iizuka-shi JP
Kajihara; Seiji - Kitakyushu JP
Kajihara; Seiji - Kitakyushu-shi JP
Kajihara; Seiji - Fukuoka-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Test pattern generation device, fault detection system, test pattern generation method, program and recording medium Grant 9,702,927 - Sato , et al. July 11, 2	2017-07-11
Fault detection system, generation circuit, and program Grant 9,383,408 - Sato , et al. July 5, 2	2016-07-05
Semiconductor device, detection method and program Grant 9,316,684 - Sato , et al. April 19, 2	2016-04-19
Fault Detection System, Generation Circuit, And Program App 20150247898 - Sato; Yasuo ; et al.	2015-09-03
Fault detection system, acquisition apparatus, fault detection method, program, and non-transitory computer-readable medium Grant 9,075,110 - Sato , et al. July 7, 2	2015-07-07
Test Pattern Generation Device, Fault Detection System, Test Pattern Generation Method, Program And Recording Medium App 20150006102 - Sato; Yasuo ; et al.	2015-01-01
Don't-care-bit identification method and don't-care-bit identification program Grant 8,589,751 - Miyase , et al. November 19, 2	2013-11-19
Fault Detection System, Acquisition Apparatus, Fault Detection Method, Program, And Non-transitory Computer-readable Medium App 20130205180 - Sato; Yasuo ; et al.	2013-08-08
Target logic value determination method for unspecified bit in test vector for combinational circuit and non-transitory computer-readable medium Grant 8,453,023 - Miyase , et al. May 28, 2	2013-05-28
Generating device, generating method, and program Grant 8,429,472 - Miyase , et al. April 23, 2	2013-04-23
Semiconductor Device, Detection Method And Program App 20130013247 - Sato; Yasuo ; et al.	2013-01-10
Test method and test program of semiconductor logic circuit device Grant 8,117,513 - Wen , et al. February 14, 2	2012-02-14
Conversion device, conversion method, program, and recording medium Grant 8,037,387 - Kajihara , et al. October 11, 2	2011-10-11
Test pattern generation method for avoiding false testing in two-pattern testing for semiconductor integrated circuit Grant 8,001,437 - Wen , et al. August 16, 2	2011-08-16
Generating device, generating method, program and recording medium Grant 7,979,765 - Wen , et al. July 12, 2	2011-07-12
Conversion device, conversion method, program, and recording medium Grant 7,971,118 - Wen , et al. June 28, 2	2011-06-28
Generating Device, Generating Method, And Program App 20110140734 - Miyase; Kohei ; et al.	2011-06-16
Generating device, generating method, program and recording medium Grant 7,962,822 - Wen , et al. June 14, 2	2011-06-14
Diagnostic device, diagnostic method, program, and recording medium Grant 7,913,144 - Wen , et al. March 22, 2	2011-03-22
Don't-care-bit Identification Method And Don't-care-bit Identification Program App 20100218063 - Miyase; Kohei ; et al.	2010-08-26
Logic Value Determination Method And Logic Value Determination Program App 20100205491 - Miyase; Kohei ; et al.	2010-08-12
Test vector generating method and test vector generating program of semiconductor logic circuit device Grant 7,743,306 - Wen , et al. June 22, 2	2010-06-22
Test Pattern Generation Method For Avoiding False Testing In Two-pattern Testing For Semiconductor Integrated Circuit App 20100095179 - Wen; Xiaoqing ; et al.	2010-04-15
Diagnostic Device, Diagnostic Method, Program, And Recording Medium App 20100064191 - Wen; Xiaoqing ; et al.	2010-03-11
Generating Device, Generating Method, Program And Recording Medium App 20090319842 - Wen; Xiaoqing ; et al.	2009-12-24
Test vector generating method and test vector generating program of semiconductor logic circuit device App 20090259898 - Wen; Xiaoqing ; et al.	2009-10-15
Conversion Device, Conversion Method, Program, And Recording Medium App 20090113261 - Kajihara; Seiji ; et al.	2009-04-30
Test Method and Test Program of Semiconductor Logic Circuit Device App 20090083593 - Wen; Xiaoqing ; et al.	2009-03-26
Generating Device, Generating Method, Program And Recording Medium App 20090019327 - Wen; Xiaoqing ; et al.	2009-01-15
Method and apparatus of fault diagnosis for integrated logic circuits Grant 7,478,295 - Wen , et al. January 13, 2	2009-01-13
Conversion Device, Conversion Method, Program, And Recording Medium App 20080235543 - Wen; Xiaoqing ; et al.	2008-09-25
Method for evaluating delay test quality Grant 7,159,143 - Takeoka , et al. January 2, 2	2007-01-02
Method and apparatus of fault diagnosis for integrated logic circuits App 20060107157 - Wen; Xiaoquing ; et al.	2006-05-18
Method for evaluating delay test quality App 20050028051 - Takeoka, Sadami ; et al.	2005-02-03
Method for generating test pattern for semiconductor integrated circuit and method for testing semiconductor integrated circuit Grant 6,799,292 - Takeoka , et al. September 28, 2	2004-09-28
Method for generating test pattern for semiconductor integrated circuit and method for testing semiconductor integrated circuit App 20010029593 - Takeoka, Sadami ; et al.	2001-10-11

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