KAITO; Takashi

Patent Applications and Registrations

Patent applications and USPTO patent grants for KAITO; Takashi.The latest application filed is for "surgical tool for positioning a surgical device, surgical device and kit".

Company Profile

0.18.18

KAITO; Takashi - CASTEL SAN PIETRO CH
KAITO; Takashi - TOYONAKA OSAKA
Kaito; Takashi - Chiba JP
Kaito; Takashi - Chiba-shi JP
Kaito; Takashi - Mihama-ku JP
Kaito; Takashi - Tokyo JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Surgical Tool For Positioning A Surgical Device, Surgical Device And Kit App 20220008109 - KAITO; Takashi ; et al.	2022-01-13
Artificial Bone And Manufacturing Method Of Artificial Bone App 20210290827 - HAMAGUCHI; Satoshi ; et al.	2021-09-23
Method of manufacturing sample for atom probe analysis by FIB and focused ion beam apparatus implementing the same Grant 8,728,286 - Kaito May 20, 2	2014-05-20
Composite focused ion beam device, process observation method using the same, and processing method Grant 8,274,063 - Kaito , et al. September 25, 2	2012-09-25
Composite focused ion beam device, and processing observation method and processing method using the same Grant 8,269,194 - Kaito , et al. September 18, 2	2012-09-18
Composite Focused Ion Beam Device, Process Observation Method Using The Same,and Processing Method App 20100288924 - Kaito; Takashi ; et al.	2010-11-18
Composite Focused Ion Beam Device, And Processing Observation Method And Processing Method Using The Same App 20100176296 - Kaito; Takashi ; et al.	2010-07-15
Atom probe apparatus and method for working sample preliminary for the same Grant 7,550,723 - Kaito June 23, 2	2009-06-23
Working method utilizing irradiation of charged particle beam onto sample through passage in gas blowing nozzle Grant 7,511,289 - Kaito March 31, 2	2009-03-31
Method for fabricating nanometer-scale structure Grant 7,476,418 - Yasutake , et al. January 13, 2	2009-01-13
Method of Manufacturing Sample for Atom Probe Analysis by FIB and Focused Ion Beam Apparatus Implementing the Same App 20080289954 - Kaito; Takashi	2008-11-27
Method and apparatus for manufacturing ultra fine three-dimensional structure Grant 7,326,445 - Kaito February 5, 2	2008-02-05
Gas blowing nozzle of charged particle beam apparatus and charged particle beam apparatus as well as working method App 20070205376 - Kaito; Takashi	2007-09-06
Atom probe apparatus and method for working sample preliminarily for the same App 20070176099 - Kaito; Takashi	2007-08-02
Gas blowing nozzle of charged particle beam apparatus and charged particle beam apparatus as well as working method Grant 7,235,783 - Kaito June 26, 2	2007-06-26
Processing probe, processing apparatus, and method of manufacturing the processing probe App 20060192114 - Adachi; Tatsuya ; et al.	2006-08-31
Gas blowingnozzle of charged particle beam apparatus and charged particle beam apparatus as well as working method App 20050167614 - Kaito, Takashi	2005-08-04
Method for fabricating nanometer-scale structure App 20050089463 - Yasutake, Masatoshi ; et al.	2005-04-28
Method for forming ultra-high strength elastic diamond like carbon structure App 20050066882 - Fujita, Jun-ichi ; et al.	2005-03-31
Probe for scanning probe microscope Grant 6,864,481 - Kaito , et al. March 8, 2	2005-03-08
Electrochemical cell App 20040209163 - Watanabe, Shunji ; et al.	2004-10-21
Scanning atom probe Grant 6,797,952 - Kaito , et al. September 28, 2	2004-09-28
Method and system for surface or cross-sectional processing and observation App 20040154744 - Kaito, Takashi ; et al.	2004-08-12
Beam shaped film pattern formation method Grant 6,740,368 - Kaito May 25, 2	2004-05-25
Method and apparatus for manufacturing ultra fine three-dimensional structure App 20030161970 - Kaito, Takashi	2003-08-28
Probe for scanning probe microscope App 20030122072 - Kaito, Takashi ; et al.	2003-07-03
Scanning atom probe App 20030066962 - Kaito, Takashi ; et al.	2003-04-10
Beam shaped film pattern formation method App 20020127352 - Kaito, Takashi	2002-09-12
Method for forming a vertical edge submicron through-hole and a thin film sample with this kind of through-hole App 20020081507 - Kaito, Takashi	2002-06-27
Focused charged beam apparatus, and its processing and observation method Grant 5,525,806 - Iwasaki , et al. June 11, 1	1996-06-11
Preparation and observation method of micro-section Grant 5,028,780 - Kaito , et al. July 2, 1	1991-07-02
Apparatus for preparation and observation of a topographic section Grant 5,023,453 - Adachi , et al. June 11, 1	1991-06-11
Mask-repairing device Grant 4,930,439 - Sato , et al. June 5, 1	1990-06-05
Process for forming metallic patterned film Grant 4,876,112 - Kaito , et al. October 24, 1	1989-10-24
Process for forming pattern film Grant 4,874,632 - Nakagawa , et al. October 17, 1	1989-10-17

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