Kageyama; Kaneo
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kageyama; Kaneo.The latest application filed is for "charged particle beam scanning method and charged particle beam apparatus".
- Kageyama; Kaneo - Hitachinaka JP
- Kageyama, Kaneo - Hitachinaka-shi JP
| Patent | Date |
|---|---|
| Charged particle beam scanning method and charged particle beam apparatus Grant 7,598,497 - Yamamoto , et al. October 6, 2 | 2009-10-06 |
| Charged particle beam scanning method and charged particle beam apparatus App 20080054187 - Yamamoto; Kouichi ; et al. | 2008-03-06 |
| Charged particle beam irradiation apparatus and irradiation method using the apparatus Grant 6,693,288 - Kageyama February 17, 2 | 2004-02-17 |
| Charged particle beam irradiation apparatus and irradiation method using the apparatus App 20020024022 - Kageyama, Kaneo | 2002-02-28 |
| Scanning electron microscope Grant 5,659,174 - Kaneoka , et al. August 19, 1 | 1997-08-19 |
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