Kaga; Hiroyasu
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kaga; Hiroyasu.The latest application filed is for "gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same".
- Kaga; Hiroyasu - Mito N/A JP
| Patent | Date |
|---|---|
| Gas field ion source and method for using same, ion beam device, and emitter tip and method for manufacturing same Grant 8,847,173 - Kawanami , et al. September 30, 2 | 2014-09-30 |
| Liquid metal ion gun Grant 8,581,484 - Kaga , et al. November 12, 2 | 2013-11-12 |
| Gas Field Ion Source And Method For Using Same, Ion Beam Device, And Emitter Tip And Method For Manufacturing Same App 20130119252 - Kawanami; Yoshimi ; et al. | 2013-05-16 |
| Charged particle beam apparatus using an electrostatic lens gun Grant 8,399,863 - Kaga , et al. March 19, 2 | 2013-03-19 |
| Liquid Metal Ion Gun App 20120126684 - Kaga; Hiroyasu ; et al. | 2012-05-24 |
| Focused ion beam apparatus Grant 7,956,336 - Kaga June 7, 2 | 2011-06-07 |
| Liquid metal ion gun Grant 7,804,073 - Kaga , et al. September 28, 2 | 2010-09-28 |
| Charged particle beam processing apparatus Grant 7,705,329 - Kaga April 27, 2 | 2010-04-27 |
| Focused ION beam apparatus Grant 7,667,209 - Kaga February 23, 2 | 2010-02-23 |
| Focused Ion Beam Apparatus App 20090256081 - KAGA; Hiroyasu | 2009-10-15 |
| Charged beam gun Grant 7,601,971 - Tanaka , et al. October 13, 2 | 2009-10-13 |
| Wafer alignment method for dual beam system Grant 7,573,049 - Kaga , et al. August 11, 2 | 2009-08-11 |
| Charged Particle Beam Processing Apparatus App 20080290291 - KAGA; Hiroyasu | 2008-11-27 |
| Focused ion beam apparatus and liquid metal ion source Grant 7,435,972 - Madokoro , et al. October 14, 2 | 2008-10-14 |
| Liquid metal ion gun App 20080210883 - Kaga; Hiroyasu ; et al. | 2008-09-04 |
| Liquid metal ion gun Grant 7,420,181 - Kaga , et al. September 2, 2 | 2008-09-02 |
| Wafer alignment method for dual beam system App 20080174779 - Kaga; Hiroyasu ; et al. | 2008-07-24 |
| Charged Beam Gun App 20080135756 - Tanaka; Takeshi ; et al. | 2008-06-12 |
| Focused ION beam apparatus App 20080067445 - Kaga; Hiroyasu | 2008-03-20 |
| Wafer alignment method for dual beam system Grant 7,323,697 - Kaga , et al. January 29, 2 | 2008-01-29 |
| Liquid metal ion gun App 20070257200 - Kaga; Hiroyasu ; et al. | 2007-11-08 |
| Focused ion beam apparatus and aperture App 20070152174 - Madokoro; Yuichi ; et al. | 2007-07-05 |
| Liquid metal ion gun Grant 7,211,805 - Kaga , et al. May 1, 2 | 2007-05-01 |
| Focused ion beam apparatus and aperture Grant 7,189,982 - Madokoro , et al. March 13, 2 | 2007-03-13 |
| Liquid metal ion gun App 20060097186 - Kaga; Hiroyasu ; et al. | 2006-05-11 |
| Wafer alignment method for dual beam system App 20060091321 - Kaga; Hiroyasu ; et al. | 2006-05-04 |
| Focused ion beam apparatus and aperture App 20060054840 - Madokoro; Yuichi ; et al. | 2006-03-16 |
| Liquid metal ion gun Grant 7,005,651 - Kaga , et al. February 28, 2 | 2006-02-28 |
| Liquid metal ion gun App 20050127304 - Kaga, Hiroyasu ; et al. | 2005-06-16 |
| High-voltage electric apparatus Grant 6,815,608 - Sato , et al. November 9, 2 | 2004-11-09 |
| High-voltage electric apparatus App 20040094327 - Sato, Takanori ; et al. | 2004-05-20 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 