Kadota; Kenichi

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kadota; Kenichi.The latest application filed is for "semiconductor storage device".

Company Profile

1.14.15

Kadota; Kenichi - Yokkaichi JP
Kadota; Kenichi - Yokohama JP
Kadota; Kenichi - Yokohama-Shi JP
Kadota; Kenichi - Kanagawa JP
Kadota; Kenichi - Osaka JP
Kadota, Kenichi - Osaka-shi JP

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Semiconductor storage device Grant 11,355,513 - Kadota June 7, 2	2022-06-07
Semiconductor memory device and method of manufacturing the same Grant 11,195,855 - Kadota , et al. December 7, 2	2021-12-07
Semiconductor Storage Device App 20210288061 - KADOTA; Kenichi	2021-09-16
Semiconductor Memory Device And Method Of Manufacturing The Same App 20210066339 - Kadota; Kenichi ; et al.	2021-03-04
Semiconductor Device And Method Of Manufacturing The Same App 20210057376 - NAKANISHI; Kazuhiro ; et al.	2021-02-25
Failure detecting method, failure detecting apparatus, and semiconductor device manufacturing method Grant 8,170,707 - Matsushita , et al. May 1, 2	2012-05-01
Linear pattern detection method and apparatus Grant 8,081,814 - Matsushita , et al. December 20, 2	2011-12-20
Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus Grant 7,973,281 - Hayashi , et al. July 5, 2	2011-07-05
Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus App 20090272901 - Hayashi; Hiroyuki ; et al.	2009-11-05
Linear Pattern Detection Method And Apparatus App 20090220142 - MATSUSHITA; Hiroshi ; et al.	2009-09-03
Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus Grant 7,573,066 - Hayashi , et al. August 11, 2	2009-08-11
Failure Detecting Method, Failure Detecting Apparatus, And Semiconductor Device Manufacturing Method App 20090117673 - MATSUSHITA; Hiroshi ; et al.	2009-05-07
Method for analyzing fail bit maps of waters and apparatus therefor Grant 7,405,088 - Matsushita , et al. July 29, 2	2008-07-29
Semiconductor substrate, substrate inspection method, semiconductor device manufacturing method, and inspection apparatus App 20080011947 - Hayashi; Hiroyuki ; et al.	2008-01-17
System and method for monitoring manufacturing apparatuses Grant 7,221,991 - Matsushita , et al. May 22, 2	2007-05-22
System and method for identifying a manufacturing tool causing a fault Grant 7,197,414 - Matsushita , et al. March 27, 2	2007-03-27
Method for analyzing fail bit maps of wafers Grant 7,138,283 - Matsushita , et al. November 21, 2	2006-11-21
System for, method of and computer program product for detecting failure of manufacturing apparatuses Grant 7,062,409 - Kadota June 13, 2	2006-06-13
Failure detection system, failure detection method, and computer program product Grant 7,043,384 - Matsushita , et al. May 9, 2	2006-05-09
Analysis method for semiconductor device, analysis system and a computer program product Grant 6,975,953 - Kadota December 13, 2	2005-12-13
System and method for identifying a manufacturing tool causing a fault App 20050251365 - Matsushita, Hiroshi ; et al.	2005-11-10
System and method for controlling manufacturing apparatuses App 20050194590 - Matsushita, Hiroshi ; et al.	2005-09-08
Aqueous water repellent for substrate treatment, making method, preparation of modified plywood or modified laminated veneer lumber, and preparation of wooden fiberboard Grant 6,916,507 - Matsumura , et al. July 12, 2	2005-07-12
Failure detection system, failure detection method, and computer program product App 20050102591 - Matsushita, Hiroshi ; et al.	2005-05-12
Method for analyzing fail bit maps of wafers App 20050021303 - Matsushita, Hiroshi ; et al.	2005-01-27
System for, method of and computer program product for detecting failure of manufacturing apparatuses App 20050021299 - Kadota, Kenichi	2005-01-27
Method for analyzing fail bit maps of wafers and apparatus therefor App 20040255198 - Matsushita, Hiroshi ; et al.	2004-12-16
Analysis method for semiconductor device, analysis system and a computer program product App 20040228186 - Kadota, Kenichi	2004-11-18
Aqueous water repellent for substrate treatment, making method, preparation of modified plywood or modified laminated veneer lumber, and preparation of wooden fiberboard App 20040113117 - Matsumura, Kazuyuki ; et al.	2004-06-17

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