Kadar; Ofer
Patent Applications and Registrations
Patent applications and USPTO patent grants for Kadar; Ofer.The latest application filed is for "electrical inspection of electronic devices using electron-beam induced plasma probes".
- Kadar; Ofer - Sunnyvale CA
- Kadar; Ofer - Jerusalem IL
| Patent | Date |
|---|---|
| Electrical inspection of electronic devices using electron-beam induced plasma probes Grant 9,523,714 - Kadyshevitch , et al. December 20, 2 | 2016-12-20 |
| Electrical Inspection of Electronic Devices Using Electron-Beam Induced Plasma Probes App 20140132299 - Kadyshevitch; Alexander ; et al. | 2014-05-15 |
| Modules And Processes For Metal Particles Removal App 20120031425 - Kadar; Ofer ; et al. | 2012-02-09 |
| Dark field inspection system Grant 7,339,661 - Korngut , et al. March 4, 2 | 2008-03-04 |
| Dark field inspection system App 20050219518 - Korngut, Doron ; et al. | 2005-10-06 |
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