Kaack; Torsten R.

Patent Applications and Registrations

Patent applications and USPTO patent grants for Kaack; Torsten R..The latest application filed is for "bandgap measurements of patterned film stacks using spectroscopic metrology".

Company Profile

1.8.4

Kaack; Torsten R. - Los Altos CA

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Bandgap measurements of patterned film stacks using spectroscopic metrology Grant 11,378,451 - Wang , et al. July 5, 2	2022-07-05
Bandgap Measurements of Patterned Film Stacks Using Spectroscopic Metrology App 20190041266 - Wang; Tianhan ; et al.	2019-02-07
Calculation method for local film stress measurements using local film thickness values Grant 9,625,823 - Kaack , et al. April 18, 2	2017-04-18
Atmospheric molecular contamination control with local purging Grant 9,110,020 - Kwak , et al. August 18, 2	2015-08-18
Multi-analyzer angle spectroscopic ellipsometry Grant 9,046,474 - Kwak , et al. June 2, 2	2015-06-02
Atmospheric Molecular Contamination Control with Local Purging App 20150029494 - Kwak; Hidong ; et al.	2015-01-29
Multi-analyzer Angle Spectroscopic Ellipsometry App 20130010296 - Kwak; Hidong ; et al.	2013-01-10
Measurement Of Composition For Thin Films App 20130006539 - Di; Ming ; et al.	2013-01-03
Control by sample reflectivity Grant 7,903,250 - Faccini , et al. March 8, 2	2011-03-08
Ellipsometry measurement and analysis Grant 7,453,562 - Kaack , et al. November 18, 2	2008-11-18

uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.

While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.

All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.