Jun; Chungsam

Patent Applications and Registrations

Patent applications and USPTO patent grants for Jun; Chungsam.The latest application filed is for "through-focus image-based metrology device, operation method thereof, and computing device for executing the operation".

Company Profile

1.9.13

Jun; Chungsam - Suwon-si KR
Jun, Chungsam - Suwon-City KR

*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.

Patent Activity

Patent	Date
Through-focus Image-based Metrology Device, Operation Method Thereof, And Computing Device For Executing The Operation App 20210396510 - Kim; Kwangsoo ; et al.	2021-12-23
Inspection Apparatus For Inspecting Semiconductor Devices Using Charged Particles App 20210333225 - Lee; Suyoung ; et al.	2021-10-28
Method of inspecting semiconductor wafer, an inspection system for performing the same, and a method of fabricating semiconductor device using the same Grant 10,269,111 - Song , et al.	2019-04-23
Apparatus and method for measuring thickness Grant 10,088,297 - Ryu , et al. October 2, 2	2018-10-02
Fan-out Panel Level Package And Method Of Fabricating The Same App 20180096903 - Sohn; Younghoon ; et al.	2018-04-05
Method Of Inspecting Semiconductor Wafer, An Inspection System For Performing The Same, And A Method Of Fabricating Semiconductor Device Using The Same App 20180053292 - Song; Joonseo ; et al.	2018-02-22
Fan-out panel level package and method of fabricating the same Grant 9,892,980 - Sohn , et al. February 13, 2	2018-02-13
Apparatus And Method For Measuring Thickness App 20170363418 - RYU; Sung Yoon ; et al.	2017-12-21
Fan-out Panel Level Package And Method Of Fabricating The Same App 20170309523 - SOHN; Younghoon ; et al.	2017-10-26
Ellipsometer and method of inspecting pattern asymmetry using the same Grant 9,719,946 - Leem , et al. August 1, 2	2017-08-01
Methods Of Inspecting Substrates And Semiconductor Fabrication Methods Incorporating The Same App 20170200658 - Yang; Yusin ; et al.	2017-07-13
Ellipsometer And Method Of Inspecting Pattern Asymmetry Using The Same App 20170176348 - LEEM; Choonshik ; et al.	2017-06-22
Ellipsometer and method of inspecting pattern asymmetry using the same Grant 9,612,212 - Leem , et al. April 4, 2	2017-04-04
Method of manufacturing a semiconductor device using semiconductor measurement system Grant 9,583,402 - Ryu , et al. February 28, 2	2017-02-28
Method of inspecting semiconductor device and method of fabricating semiconductor device using the same Grant 9,466,537 - Kim , et al. October 11, 2	2016-10-11
Semiconductor inspection system and methods of inspecting a semiconductor device using the same Grant 9,455,121 - Kim , et al. September 27, 2	2016-09-27
Method Of Inspecting Semiconductor Device And Method Of Fabricating Semiconductor Device Using The Same App 20160204041 - KIM; Minkook ; et al.	2016-07-14
Semiconductor Inspection System And Methods Of Inspecting A Semiconductor Device Using The Same App 20160086769 - KIM; Hyunwoo ; et al.	2016-03-24
Method Of Manufacturing A Semiconductor Device Using Semiconductor Measurement System App 20160027707 - RYU; Sung Yoon ; et al.	2016-01-28
Method of measuring thickness of layer App 20030210408 - Jun, Chungsam ; et al.	2003-11-13

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