loadpatents
name:-0.0029170513153076
name:-0.0037128925323486
name:-0.00046896934509277
Joshi; Somit Patent Filings

Joshi; Somit

Patent Applications and Registrations

Patent applications and USPTO patent grants for Joshi; Somit.The latest application filed is for "defect sampling for electron beam review based on defect attributes from optical inspection and optical review".

Company Profile
0.3.2
  • Joshi; Somit - Sunnyvale CA
  • Joshi; Somit - Dallas TX
*profile and listings may contain filings by different individuals or companies with the same name. Review application materials to confirm ownership/assignment.
Patent Activity
PatentDate
Defect sampling for electron beam review based on defect attributes from optical inspection and optical review
Grant 9,535,010 - Gosain , et al. January 3, 2
2017-01-03
Defect Sampling for Electron Beam Review Based on Defect Attributes from Optical Inspection and Optical Review
App 20150330912 - Gosain; Rohan ;   et al.
2015-11-19
Single mask MIM capacitor and resistor with in trench copper drift barrier
Grant 7,189,615 - Rao , et al. March 13, 2
2007-03-13
Single mask MIM capacitor and resistor with in trench copper drift barrier
App 20060160299 - Rao; Satyavolu Srinivas Papa ;   et al.
2006-07-20
Shallow trench isolation planarization using self aligned isotropic etch
Grant 6,686,283 - Walsh , et al. February 3, 2
2004-02-03

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