Trademark applications and grants for Jordan Valley Semiconductors L T D. Jordan Valley Semiconductors L T D has 6 trademark applications. The latest application filed is for "SCRIBEVIEW"
Patent Application | Date |
---|---|
MEASUREMENT OF SMALL FEATURES USING XRF 20160123909 - 14/922220 Wormington; Matthew ;   et al. | 2016-05-05 |
USING MULTIPLE SOURCES/DETECTORS FOR HIGH-THROUGHPUT X-RAY TOPOGRAPHY MEASUREMENT 20150369761 - 14/735168 Ryan; Paul Anthony ;   et al. | 2015-12-24 |
X-RAY SCATTEROMETRY APPARATUS 20150369759 - 14/735162 Mazor; Isaac ;   et al. | 2015-12-24 |
METHOD FOR ACCURATELY DETERMINING THE THICKNESS AND/OR ELEMENTAL COMPOSITION OF SMALL FEATURES ON THIN-SUBSTRATES USING MICRO-XRF 20150330921 - 14/708323 Mazor; Isaac ;   et al. | 2015-11-19 |
X-RAY SOURCE ASSEMBLY 20150243469 - 14/565474 Mazor; Isaac ;   et al. | 2015-08-27 |
Mark Image Registration | Serial | Trademark Application Date |
---|---|
"SCRIBEVIEW" 3339508 78837749 |
SCRIBEVIEW 2006-03-15 |
"BEDEMETRIX" 3161266 76538395 |
BEDEMETRIX 2003-08-18 |
"BEDE" 2755299 76373800 |
BEDE 2002-02-22 |
"QC200" 2658282 76240662 |
QC200 2001-04-13 |
"FAB200" 2630776 76240663 |
FAB200 2001-04-13 |
"REFLEX" 2396701 75339796 |
REFLEX 1997-08-12 |
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