Jordan Valley Applied Radiation Ltd.
Patent Applications and Registrations
Patent applications and USPTO patent grants for Jordan Valley Applied Radiation Ltd..The latest application filed is for "measurement of critical dimensions using x-ray diffraction in reflection mode".
- Jordan Valley Applied Radiation Ltd. - Migdal Ha'emek IL
- Jordan Valley Applied Radiation, Ltd. - Ha'mek IL
- Jordan Valley Applied Radiation Ltd. - Migdal IL
- Jordan Valley Applied Radiation Ltd. - Midal Ha 'Emek IL
- Jordan Valley Applied Radiation Ltd -
- Jordan VAlley Applied Radiation Ltd. - Migdal Haemek IL
- Jordan Valley Applied Radiation Ltd. - IR IR
| Patent | Date |
|---|---|
| Overlay metrology using X-rays Grant 7,481,579 - Yokhin , et al. January 27, 2 | 2009-01-27 |
| Calibration of X-ray reflectometry system Grant 7,474,732 - Berman , et al. January 6, 2 | 2009-01-06 |
| Detection of dishing and tilting using X-ray fluorescence Grant 7,245,695 - Mazor , et al. July 17, 2 | 2007-07-17 |
| Efficient measurement of diffuse X-ray reflections Grant 7,231,016 - Berman , et al. June 12, 2 | 2007-06-12 |
| X-ray reflectometry of thin film layers with enhanced accuracy Grant 7,130,376 - Berman , et al. October 31, 2 | 2006-10-31 |
| Combined X-ray reflectometer and diffractometer Grant 7,120,228 - Yokhin , et al. October 10, 2 | 2006-10-10 |
| Enhancing resolution of X-ray measurements by sample motion Grant 7,113,566 - Peled , et al. September 26, 2 | 2006-09-26 |
| Measurement of critical dimensions using X-ray diffraction in reflection mode Grant 7,110,491 - Mazor , et al. September 19, 2 | 2006-09-19 |
| Material analysis using multiple X-ray reflectometry models Grant 7,103,142 - Agnihotri , et al. September 5, 2 | 2006-09-05 |
| X-ray apparatus with dual monochromators Grant 7,076,024 - Yokhin July 11, 2 | 2006-07-11 |
| Enhancement of X-ray reflectometry by measurement of diffuse reflections Grant 7,068,753 - Berman , et al. June 27, 2 | 2006-06-27 |
| Measurement of critical dimensions using X-ray diffraction in reflection mode App 20060133570 - Mazor; Isaac ; et al. | 2006-06-22 |
| X-ray reflectometry of thin film layers with enhanced accuracy Grant 7,062,013 - Berman , et al. June 13, 2 | 2006-06-13 |
| X-ray scattering with a polychromatic source Grant 7,035,375 - Yokhin April 25, 2 | 2006-04-25 |
| Optical alignment of X-ray microanalyzers Grant 7,023,954 - Rafaeli , et al. April 4, 2 | 2006-04-04 |
| Multifunction X-ray analysis system App 20060062351 - Yokhin; Boris ; et al. | 2006-03-23 |
| Beam centering and angle calibration for X-ray reflectometry Grant 6,947,520 - Yokhin , et al. September 20, 2 | 2005-09-20 |
| Dual-wavelength x-ray monochromator Grant 6,907,108 - Yokhin , et al. June 14, 2 | 2005-06-14 |
| X-ray reflectometry with small-angle scattering measurement Grant 6,895,075 - Yokhin , et al. May 17, 2 | 2005-05-17 |
| Optical alignment of X-ray microanalyzers App 20050069090 - Rafaeli, Tzachi ; et al. | 2005-03-31 |
| X-ray reflectometry with small-angle scattering measurement App 20040156474 - Yokhin, Boris ; et al. | 2004-08-12 |
| Dual-wavelength X-ray reflectometry Grant 6,680,996 - Yokhin , et al. January 20, 2 | 2004-01-20 |
| X-ray reflectometer Grant 6,639,968 - Yokhin , et al. October 28, 2 | 2003-10-28 |
| Dual-wavelength X-ray reflectometry App 20030156682 - Yokhin, Boris ; et al. | 2003-08-21 |
| Measurement of critical dimensions using X-rays Grant 6,556,652 - Mazor , et al. April 29, 2 | 2003-04-29 |
| Pulsed X-ray reflectometer Grant 6,535,575 - Yokhin March 18, 2 | 2003-03-18 |
| Differential measurement of X-ray microfluorescence Grant 6,453,002 - Mazor , et al. September 17, 2 | 2002-09-17 |
| X-ray microanalyzer for thin films Grant 6,381,303 - Vu , et al. April 30, 2 | 2002-04-30 |
| X-ray microfluorescence analyzer Grant 6,108,398 - Mazor , et al. August 22, 2 | 2000-08-22 |
| Plasma spectrometer with shutter assembly Grant 5,946,089 - Duer August 31, 1 | 1999-08-31 |
uspto.report is an independent third-party trademark research tool that is not affiliated, endorsed, or sponsored by the United States Patent and Trademark Office (USPTO) or any other governmental organization. The information provided by uspto.report is based on publicly available data at the time of writing and is intended for informational purposes only.
While we strive to provide accurate and up-to-date information, we do not guarantee the accuracy, completeness, reliability, or suitability of the information displayed on this site. The use of this site is at your own risk. Any reliance you place on such information is therefore strictly at your own risk.
All official trademark data, including owner information, should be verified by visiting the official USPTO website at www.uspto.gov. This site is not intended to replace professional legal advice and should not be used as a substitute for consulting with a legal professional who is knowledgeable about trademark law.
| 